Enhancing Quality Control in Food and Feed Production

Enhancing Quality Control in Food and Feed Production

Join us for an insightful online seminar where BRUKER and RETSCH will explore comprehensive QC solutions for food and feed production.
Enhancing Quality Control in Food and Feed Production
Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples

Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples

This session dives into how X-ray diffraction (XRD) helps uncover the composition of cement, concrete, and mining materials by analyzing their crystalline structure.
Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples
Antibiotics and mycotoxins testing

Antibiotics and mycotoxins testing

This live webinar delves into the detection of antibiotics, including Anthelmintics, Aminoglycosides, Cephalosporins, and Beta-lactams, as well as mycotoxins in dairy products using LC/MS/MS.
Antibiotics and mycotoxins testing
The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system

The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system

The ease of organic solvent introduction in an Agilent ICPMS system and the optimization of the ICPMS system for petroleum analysis.
The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system
Rapid DART-MS Screen for Benzodiazepines in Urine Enabled by DART (Direct Analysis in Real Time) Technology

Rapid DART-MS Screen for Benzodiazepines in Urine Enabled by DART (Direct Analysis in Real Time) Technology

Discover the power of DART-MS in providing selective results, reducing false positives and negatives, and enabling rapid addition of new target analytes.
Rapid DART-MS Screen for Benzodiazepines in Urine Enabled by DART (Direct Analysis in Real Time) Technology
Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.
Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM
Advance in Process Optimization and Control with NMR as Process Analytical Technology (PAT)

Advance in Process Optimization and Control with NMR as Process Analytical Technology (PAT)

Join us for an insightful webinar where industry experts will delve into the transformative impact of NMR and PAT on processing control.
Advance in Process Optimization and Control with NMR as Process Analytical Technology (PAT)
How to improve sensitivity in elemental and isotope ratio analysis with HR-ICP-MS

How to improve sensitivity in elemental and isotope ratio analysis with HR-ICP-MS

Join us virtually for an insightful webinar where our specialists will present the benefits of the enhanced sensitivity with the Jet interface.
How to improve sensitivity in elemental and isotope ratio analysis with HR-ICP-MS
Back to Basics Advanced - Pharma Impurities: Detection (UV/MS)

Back to Basics Advanced - Pharma Impurities: Detection (UV/MS)

Choose the Correct LC Gradient System for Your Challenging Separations. Select the Suitable (Combination of) Detectors required for Sensitivity, Specificity and Linearity.
Back to Basics Advanced - Pharma Impurities: Detection (UV/MS)
Fundamentals of accurate mass

Fundamentals of accurate mass

Join SCIEX specialists to learn about theory behind accurate mass and how accurate mass works.
Fundamentals of accurate mass