Taťána Gazárková is currently a&nbsp;postdoctoral fellow in the Laboratory of Antibiotic Resistance and Microbial Metabolomics. During her doctoral studies, she focused on chromatography and mass spectrometry. Recently, she was awarded second place in the “Sanofi Prize for Pharmacy 2026” competition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/MBU_AV_CR_Lukas_Biba_Rozhovor_Cim_zaujala_analyticka_chemie_postdoktorandku_Tatanu_Gazarkovou_7450c646fa.jpg" alt="MBÚ/Lukas Biba:&nbsp;Sanofi Prize for Pharmacy 2026" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_MBU_AV_CR_Lukas_Biba_Rozhovor_Cim_zaujala_analyticka_chemie_postdoktorandku_Tatanu_Gazarkovou_7450c646fa.jpg 234w," sizes="100vw" width="1024" height="683">Taťána Gazárková is currently a&nbsp;postdoctoral fellow in the Laboratory of Antibiotic Resistance and Microbial Metabolomics. During her doctoral studies, she focused on chromatography and mass spectrometry. Recently, she was awarded second place in the “Sanofi Prize for Pharmacy 2026” competition, which is awarded by the French Embassy in the Czech Republic for her dissertation – Steroid Analysis Using Modern Chromatographic and Mass Spectrometry Techniques: From Fundamental Studies to Targeted Bioanalytical Applications (supervisor: Lucie Nováková, Charles University).&nbsp;<h5>What makes this field particularly exciting or unique in your view?</h5>What I&nbsp;enjoy about analytical chemistry is that, to a&nbsp;certain extent, it is a&nbsp;kind of detective work. You are often looking for ways to “make the invisible visible”. In other words, extract the information you are interested in from a&nbsp;complex sample and then interpret it correctly. What also appeals to me about bioanalytical chemistry is its interdisciplinary nature. It brings together analytical chemistry, biochemistry, biology and medicine, which means that you need to be able not only to translate a&nbsp;biological or clinical question into a&nbsp;measurable analytical experiment, but also to place the resulting data back into a&nbsp;broader biological context. This combination of different perspectives is probably what I&nbsp;enjoy most about the field. At the same time, there is still plenty of room for fundamental research, ranging from studying analytical techniques themselves and improving them to developing new methodological approaches.<h5>How did you end up at the <a target="_blank" rel="noopener noreferrer" href="https://mbu.cas.cz/en/research/laboratory-of-antibiotic-resistance-and-microbial-metabolomics">Laboratory of Antibiotic Resistance and Microbial Metabolomics</a>, and what project are you currently working on?</h5>I came to the Institute of Microbiology through a&nbsp;joint project between Dr Zdeněk Kameník and Assoc. Prof. Jan Bobek from the First Faculty of Medicine, Charles University. For me, it was also an opportunity to move from targeted analysis and the study of chromatographic techniques towards untargeted metabolomics and new biological questions.In the project, we are trying to identify new biologically active compounds that would be effective, particularly against pathogenic fungi. As a&nbsp;potential source of such compounds, we study streptomycetes, bacteria known for their ability to produce a&nbsp;wide range of biologically active compounds, including many antibiotics that are currently in clinical use. We focus on less-explored host-associated streptomycetes, in which we had already observed antifungal activity in previous experiments. We are especially interested in strains active against Candida albicans whose activity cannot be explained by the presence of a&nbsp;known bioactive compound. These strains may represent an interesting source of novel compounds. We then integrate the results of untargeted metabolomic analyses with genomic analyses, which allows us to obtain a&nbsp;more comprehensive view of the biosynthetic potential of selected strains.<h5>You also took part in this year’s Vědafest, a&nbsp;science outreach event for the public. What was it like?</h5>I already had some experience with science outreach through events such as Researchers’ Night and the Science Fair at my previous institution, but this year’s Vědafest was still new to me in some ways. This time, I&nbsp;was presenting a&nbsp;field that I&nbsp;myself had entered only relatively recently. It was therefore more challenging to find the right analogies and explain the essence of the topic in a&nbsp;way that was simple, yet precise and scientifically accurate. At the same time, that was exactly what made it inspiring. It forces you to look at your own work from a&nbsp;different perspective. What I&nbsp;enjoyed most was the spontaneity and curiosity of the children, who often came up with questions that would never even occur to an adult.<h5>What are the biggest challenges you face on your scientific journey, and what helps you overcome them?</h5>One of the greatest, but at the same time most interesting, challenges is, in my view, the uncertainty that is inseparably linked to research. For a&nbsp;long time, you often do not know whether you have taken the right direction in addressing a&nbsp;particular question or whether you will ultimately manage to find that figurative final piece of the puzzle. At the same time, this uncertainty is precisely what makes science exciting for me.Another major challenge, particularly in interdisciplinary projects, is communication. It is important from the very formulation of a&nbsp;hypothesis and the planning of experiments through to the interpretation of results, including negative ones, and placing them in a&nbsp;broader context. To some extent, every field has its own language, and finding a&nbsp;common understanding is not always straightforward. Personally, I&nbsp;find it very helpful to be able to discuss problems with colleagues on an ongoing basis, whether individually or during regular laboratory seminars. One of the major strengths of our current group is its interdisciplinary nature, which allows me to look at the same problem from several different perspectives. It is also important for me not to lose my curiosity, because that is ultimately what leads us to ask further questions.<h5>What are your plans after completing your PhD?</h5>After finishing my PhD, I&nbsp;decided that I&nbsp;do not need to have everything that comes next precisely mapped out straight away. I&nbsp;would like to keep different options open for a&nbsp;while and continue building on my experience in analytical chemistry, while at the same time connecting it with other areas that have a&nbsp;biological or medical relevance. I&nbsp;believe that we can keep learning throughout our lives, so I&nbsp;am quite curious to see where the next stage of my journey will take me.Thank you for the interview!

Interview: What Drew Postdoc Taťána Gazárková to Analytical Chemistry

In the week from August 31, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 5 500 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Technology Networks: Modern Methods for Faster Microbial Analysis</h5><ul><li>Tu, 1.9.2026 11:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6454">Registration</a></li></ul>Struggling to choose the right technique for microbial testing? Learn how MALDI-TOF, FTIR, and automated DNA/RNA electrophoresis accelerate identification.<h5>2. Agilent Technologies: ICP-MS for Hybrid Photoelectrode Characterization</h5><ul><li>Tu, 1.9.2026 21:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6411">Registration</a></li></ul>Quantify catalyst loading on hybrid photoelectrodes and discover how the Agilent 7850 ICP-MS supports solar fuel research.<h5>3. SciY/Mestrelab Research: From Legacy Workflows to Paperless Labs: Track Every Sample, Process, and Decision</h5><ul><li>Th, 3.9.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6425">Registration</a></li></ul>Transform your lab from paper to digital. Learn how WebLab and LIMS workflows automate sample tracking and support laboratory compliance.<h5>4. Agilent Technologies: Learn to Select and Apply the Proper Internal Standard in ICP-OES</h5><ul><li>Th, 3.9.2026 20:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6412">Registration</a></li></ul>Master the use of internal standards in ICP-OES and learn how to select suitable standards to correct matrix effects and signal drift.

Webinars LabRulezICPMS Week 36/2026

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 31st August 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you brochures by Agilent Technologies and Waters Corporation and application notes by Shimadzu and Thermo Fisher Scientific!<h3>1. Agilent Technologies: Agilent OpenLab ICP-MS Software</h3>Simplify every step of ICP-MS analysisFor Agilent <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=7800">7800</a>, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=7850">7850</a>, and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=7900">7900</a> ICP-MS systems, and Agilent <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=8900">8900</a> and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">9500 ICP-QQQ</a> systems.<ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/br_openlab_icp_ms_software_5994_9288en_agilent_05f01dcdef.pdf">Full PDF for download</a>&nbsp;</li></ul>The brochure introduces <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=OpenLab+ICP-MS+Software">Agilent OpenLab ICP-MS Software</a>, designed to simplify routine operation and data handling for Agilent 7800, 7850, and 7900 ICP-MS systems and the 8900 and 9500 ICP-QQQ systems. The software supports the complete analytical workflow—from checking instrument readiness and creating batches to acquisition, data review, reporting, and compliance. A central dashboard provides an overview of system status, maintenance requirements, instrument health, and utilization, while Smart EMF and post-run performance checks help users identify when maintenance may be required. Guided Diagnostics, Meter Monitor, and time-stamped system records also support troubleshooting by tracking parameters such as vacuum levels, gas flows, and temperatures.Method and batch setup are designed to reduce manual configuration. Batches can be created from preset methods, templates, existing batches, Method Wizard, or Method Advisor, and legacy Agilent ICP-MS MassHunter batches can be opened directly in OpenLab ICP-MS. For the 9500 ICP-QQQ, Method Advisor provides an element-focused approach in which users select target elements and calibration information while the software applies recommended acquisition masses and cell-gas conditions. Preset methods are available for applications including EPA 200.8/EPA 6020, USP &lt;232&gt;, ICH Q3D, and Chinese Pharmacopoeia requirements, while an IntelliQuant Screening preset supports semiquantitative screening of unknown samples. Routine instrument tasks can also be automated through autotuning, startup checks, batch queues, end-of-run verification, rinse functions, and automatic shutdown.For data evaluation, OpenLab ICP-MS provides a real-time workspace where users can review analyte concentrations, internal-standard recoveries, stability plots, spectra or chromatograms, calibration information, QC charts, and IntelliQuant results in a single view. IntelliQuant acquires a complete mass spectrum and displays semiquantitative elemental concentrations using a color-coded periodic table, while IntelliQuant Star Rating assigns a zero-to-five-star data-quality score based on factors such as potential interferences, calibration quality, background, detection limits, and precision. Reporting options include whole-batch reports, elemental impurity reports for USP &lt;232&gt;/&lt;233&gt; and ICH Q3D, customizable reports, structured CSV export, and direct data transfer to LIMS.The software can be expanded for specialized applications, including LC-ICP-MS and GC-ICP-MS, advanced QC workflows, single-particle ICP-MS and FFF-ICP-MS, ADS 2 automation, semiconductor analysis, and peripheral-device control. Supported analytical approaches include external calibration, standard additions, semiquantitative calibration, isotope ratios, and isotope dilution. For regulated laboratories, OpenLab ICP-MS can be combined with scalable OpenLab compliance solutions providing electronic signatures, user access control, configurable roles, system activity logs, and audit trails, supporting workflows subject to 21 CFR Part 11, EU Annex 11, and equivalent regulations. Overall, the platform is positioned as a unified environment for routine and advanced ICP-MS workflows, combining instrument control, method setup, diagnostics, data-quality assessment, reporting, and compliance support.<h3>2. Shimadzu: Identification of Virgin PET and Recycled PET by X-ray Fluorescence Spectrometry</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_01204_en_f3f20ff020.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>EDX enables the identification of recycled PET.&nbsp;</li><li>Measurements are quick and simple, require no cumbersome pretreatment, and can be automated using a multi-sample turret.&nbsp;</li><li>The instrument offers excellent cost-performance and supports the detection of a wide range of elements.</li></ul>Establishing a sustainable circular economy is a major societal challenge, and recycling plastic materials such as PET (polyethylene terephthalate) plays a particularly important role in reducing environmental impact. Large numbers of PET bottles and molded products are used every day in the food and beverage sectors. To recycle these materials safely and reliably, technologies are required that can accurately identify their origin. In practice, however, appearance and conventional physical properties alone are insufficient to distinguish virgin material from recycled material, creating a need for a more reliable identification method.&nbsp;For rapid identification in industrial settings, a method requiring little or no pretreatment is highly desirable. In some cases, nondestructive analysis is also needed to enable subsequent application of other analytical techniques. This article presents a practical approach in which metal catalysts present in PET are detected by EDX (Energy-Dispersive X-ray Spectroscopy) and used to distinguish material-recycled PET from virgin PET.<h4>Principle and Overview&nbsp;</h4>Metal catalysts such as antimony (Sb) and germanium (Ge) are used in the synthesis of PET resin. These catalyst metals have been reported to be useful indicators of material origin. 1),2) For example, Sb and Ge are frequently detected together in material-recycled PET, whereas only one catalyst metal is detected in chemically recycled PET and virgin PET. This likely reflects the fact that material-recycled PET is derived from a mixture of feedstocks using different catalysts.&nbsp;ICP-AES (ICP optical emission spectrometry) and ICP-MS (ICP mass spectrometry), which are commonly applied to catalyst metal analysis, provide high sensitivity and accuracy. However, they require pretreatment to convert the sample into a solution, thereby lengthening the analytical workflow. By contrast, EDX can measure solid samples directly, making it well-suited to applications requiring rapid results, such as incoming material inspection and in-line analysis in molding plants. Because EDX is non-destructive, it is also suitable for multimodal analytical workflows.&nbsp;On the other hand, some commercially available handheld EDX instruments do not support elements such as Sb and Ge. At the same time, higher-end systems may not offer the specifications or price range needed for industrial deployment. The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=EDX-7200">EDX-7200</a> supports a broad range of elements with excellent cost performance. This article describes the analysis of Sb and Ge in PET using this instrument.<h4>Conclusion&nbsp;</h4>EDX enables rapid and straightforward elemental analysis without cumbersome sample pretreatment. Previous studies have shown that the presence of Sb and Ge can be used to identify recycled PET. Building on this concept, this article presents a practical analytical approach based on EDX. Using the EDX-7200, which combines broad elemental coverage with excellent cost performance, the proposed method provides a practical tool for rapid on-site identification, quality control, and traceability management. When combined with physical property data and other information, this approach is expected to contribute to the safety assessment and quality assurance of recycled materials, thereby supporting a more advanced circular economy.<h3>3. Thermo Fisher Scientific: Optimizing lithium-ion battery recycling operations using handheld XRF analysis</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/lithium_ion_battery_recycling_handheld_xrf_analysis_an1120_en_4c00477b78.pdf">Full PDF for download</a></li></ul>The shift to a low-carbon economy and the adoption of electric vehicles will drive an exponential increase in the demand for lithium-ion batteries. As a corollary to this, the International Energy Agency expects the demand for some key commodities to increase significantly over the next two decades: the demand for Copper (Cu) is anticipated to increase by more than 40%; for nickel (Ni) and cobalt (Co), by 60-70% each; and for lithium (Li), by nearly 90%.¹ This will translate into increased mining activities and potentially generate larger amounts of deleterious waste.&nbsp;To reduce the environmental impact and limit reliance on scarce commodities associated with economical and geopolitical implications, several countries have implemented regulations regarding producers’ responsibilities.² These regulations contain both incentives and accountability guidelines for lithium-ion battery and electric vehicles manufacturers. Their goal is to facilitate the emergence of a circular economy in which recycling will increasingly contribute to the supply of the strategic raw materials.&nbsp;Lithium-ion batteries are made of multiple components, the most valuable being the cathode that contains between 40 and 70% ³, ⁴ of the total value of the battery, depending on its exact chemistry. As of 2023, lithium nickel cobalt manganese oxides (NCM) account for 66% of lithium-ion battery cathode active materials for electric vehicles, followed by lithium iron phosphates (LFP) which account for 24%, and lithium nickel cobalt aluminum oxide (NCA) accounts for the remaining 10%.³<h4>Handheld X-ray Fluorescence Analysis&nbsp;</h4>Handheld X-ray fluorescence analysis (HHXRF) is an elemental analysis technique that has proven to be cost-effective in recycling areas such as scrap metal and automotive catalytic converters. HHXRF can measure elements from magnesium (Mg) to uranium (U) in various types of materials such as metals and alloys; non-metallic inorganic materials such as ceramics; or ores or plastics. The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/1993">Thermo Scientific™ Niton™ XL2</a> and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/1992">Thermo Scientific™ Niton™ XL5 Plus Handheld XRF Analyzers </a>deliver accurate elemental analysis in real time, with little or no sample preparation, across multiple steps of the lithium-ion battery recycling workflow. Although handheld XRF does not detect lithium, it can measure most elements from the periodic table including nickel or cobalt which often command much higher value than the lithium in a lithium-ion battery.⁴<h4>Conclusion&nbsp;</h4>There is no ideal process to recycle lithium-ion batteries that simultaneously incorporates low environmental impact, high metal recovery yield, and economic viability. Because of the variety of technologies and materials used, recycling lithium-ion batteries is a complex journey with multiple possible paths. HHXRF helps recyclers by generating lab-quality data in real time, allowing them to optimize their processes and make fast decisions that generate significant benefits:&nbsp;<ul><li>Unwanted materials containing heavy metals such as lead or cadmium can be prevented from entering subsequent steps in the recycling workflow.&nbsp;</li><li>Materials can be accurately sorted and adequate processes for recovery selected depending on the material type (e.g., LFP vs. MCM).&nbsp;</li><li>The economic value of incoming and outgoing material can be more accurately estimated.</li></ul><h3>4. Waters Corporation: Waters Aura Systems</h3><ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/720009268_7b9ad02cb4.pdf">Full PDF for download</a></li></ul>The presentation introduces the Waters Aura Systems, a family of high-throughput, fluidics-free instruments for the characterization and identification of visible and subvisible particles. All Aura platforms provide particle counting, identification, morphology assessment, and flexible sample volumes ranging from microliters to milliliters. The portfolio includes configurations tailored to different applications: AuraBMI for biologics particle analysis, Aura for particle analysis with identification, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2437">AuraPTx</a> for protein formulation development, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2438">AuraGT</a> for gene therapy, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2439">AuraCL</a> for cell therapy, and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2190">Aura+</a> as the most comprehensive platform. The systems are designed for automation-ready operation, straightforward method transfer, and continuity from research through QC.A key feature of the Aura platform is the combination of Backgrounded Membrane Imaging (BMI), Fluorescence Membrane Microscopy (FMM), and Side Illumination Membrane Imaging (SIMI). BMI captures particles on a membrane and subtracts the membrane background to improve particle contrast, while FMM uses fluorescent dyes or conjugated antibodies to distinguish specific particle types. This enables differentiation of protein aggregates, cells, viral capsids, degraded excipients, plastics, fibers, and other contaminants that may look similar based on morphology alone. SIMI adds further information for identifying unlabeled inorganic particles such as glass, fibers, and Dynabeads. Together, these techniques provide more specific particle identification than morphology-based classification alone.The systems are particularly suited to biologics, gene therapy, and cell therapy development. For gene therapy, Aura can evaluate AAV stability, distinguish capsid-related particles, and monitor DNA leakage using SYBR Gold fluorescence, with measurements possible from as little as 5 µL of sample. For cell therapy, the system can differentiate single cells, cell aggregates, protein aggregates, and extrinsic particles. The platform also supports flexible sample volumes and 24- or 96-well membrane formats, allowing the same general approach to be used from sample-limited early development through larger-volume and QC workflows. The brochure reports excellent quantitative linearity across serial dilutions and emphasizes the ability to preserve sample for additional orthogonal analyses.From a technical perspective, Aura Systems provide 100% sampling efficiency, a particle detection and quantitation range above 1 µm, and can handle concentrations above 3,000,000 particles/mL for 1.6 µm particles. Brightfield membrane imaging takes approximately one minute per sample, while fluorescence measurements require about 15–30 seconds per sample. The instruments are compatible with robotic automation and offer different fluorescence-channel configurations depending on the selected Aura model. Overall, the platform is positioned as a comprehensive solution for obtaining quantitative particle counts together with information on particle identity and composition across the development and quality-control lifecycle.

News from LabRulezICPMS Library - Week 36, 2026

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The Czech Academy of Sciences (CAS) was established by Act No. 283/1992 Coll. as the Czech successor of the former Czechoslovak Academy of Sciences. It is set up as a complex of 54 public research institutions.

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Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Thermo Scientific ARL X’TRA Companion X-ray Diffractometer

Thermo Scientific™ ARL™ X’TRA Companion is a benchtop θ/θ Bragg–Brentano X-ray diffractometer for routine QC. 600 W (Cu/Co), pixel detector (55 × 55 µm), one-click Rietveld, ±0.02° accuracy.

The Thermo Scientific™ ARL™ X’TRA Companion is a θ/θ Bragg–Brentano benchtop X-ray diffractometer designed for routine process and quality control applications. The system combines high analytical performance with robust mechanical construction and intuitive software operation.The instrument is based on a vertical θ/θ Bragg–Brentano geometry (160 mm radius) and is suitable for qualitative and quantitative XRD analysis of polycrystalline materials. It operates at 600 W using copper or cobalt radiation, with an optional integrated water chiller available.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Schema of the geometry of the θ/θ goniometer." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg 245w," sizes="100vw" width="1338" height="626">Fast and resolute data acquisition is enabled by a state-of-the-art solid-state pixel detector (55 × 55 µm pitch). One-click Rietveld refinement based on a fundamental parameter approach ensures robust and reproducible phase quantification. Automated result transmission to LIMS is supported.The system is fully shielded in accordance with international X-ray safety regulations and designed for stable operation even in environments exposed to vibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg 221w," sizes="100vw" width="1153" height="814"><h3>Key Features</h3><ul><li>θ/θ Bragg–Brentano geometry (160 mm radius)</li><li>600 W operation (Cu or Co radiation)</li><li>Solid-state pixel detector (55 × 55 µm pitch)</li><li>One-click Rietveld quantification (fundamental parameter approach)</li><li>Automated result transmission to LIMS</li><li>Mechanical slits, Soller slits and variable beam knife for precise beam collimation</li><li>Ultra-compact θ/θ goniometer with stepper motors and optical encoders</li><li>Modular design with exchangeable pre-aligned sample stages</li><li>Optional 6-position sample changer (φ 51.5 mm; optional φ 40 mm)</li><li>Angular accuracy better than ±0.02° over full 2θ range</li><li>Angular resolution &lt; 0.04° FWHM (standard configuration)</li><li>Shielded cabinet with lead glass windows, flushing lamps and safety interlocks</li><li>Robust construction resistant to shock and vibration</li><li>Data combination capability with XRF results</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular accuracy better than ± 0.02° over the whole 2θ range guarantees optimal instrument alignment to support accurate and reliable analysis. Test with a Si powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg 238w," sizes="100vw" width="872" height="573"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular resolution &lt; 0.04° FWHM can be measured easily in standard configuration. Test with a LaB₆ powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg 215w," sizes="100vw" width="870" height="630"><h4>Analysis of Cement Clinker according to ASTM C1365</h4>A clinker sample was measured (21 x 10 min) and a Rietveld fit was carried out consecutively using a fundamental parameter approach. Comparing standard deviations calculated from the repetitive refinements with limits given by ASTM C1365 clearly shows that results are in good agreement with the norm, as determined by considering C3A total and C3S total.The ARL X’TRA Companion XRD yields data in compliance with ASTM C1365 norm for analyzing clinker samples. The one-click Rietveld refinement based on a fundamental parameter approach is an extremely robust method with high reproducibility which yields accurate results even for C3S M1 and M3. This makes clear the ARL X’TRA Companion is the perfect solution for any process control tasks in the cement industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Results of the 21 consecutive refinements of clinker (values in weight percent)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg 245w," sizes="100vw" width="1159" height="465"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (10 min acquisition)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg 170w," sizes="100vw" width="872" height="801"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (29-35° 2θ)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg 169w," sizes="100vw" width="868" height="800"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Measurement of clinker (55-61° 2θ). Fit for C3S M1 (purple) and C3S M3 (green) explains intensity and shape of the reflections well." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg 211w," sizes="100vw" width="871" height="643">

Heavy Metals Screening (As, Cd, Pb, Hg)

Screening of arsenic, cadmium, lead, and mercury in samples using Shimadzu EDX fluorescence spectrometry.

The Heavy Metals Screening is a standalone laboratory test designed to detect the presence of selected heavy metals in a sample.The standard screening covers arsenic (As), cadmium (Cd), lead (Pb), and mercury (Hg). Other metals may be tested upon request.<h4>About the Analyzed Metals</h4>Arsenic, cadmium, lead, and mercury are toxic elements that may occur as contaminants in raw materials, finished products, supplements, pharmaceuticals, and other sample types.Their presence can be relevant for quality control and safety assessment, especially when contamination may arise from raw materials, manufacturing, handling, or storage.<h4>Key Features</h4><ul><li>Standalone screening for selected heavy metals</li><li>Target metals: arsenic (As), cadmium (Cd), lead (Pb), and mercury (Hg)</li><li>Analysis using Shimadzu EDX fluorescence spectrometry</li><li>Suitable for tablets, capsules, liquid solutions, raw materials, and vials</li><li>Other metals can be tested upon request</li><li>Minimum sample amount of 1 tablet/capsule, 1 ml solution, 200 mg raw material, or 1 vial</li><li>Average turnaround time of 7 business days</li></ul><h4>Analysis Parameters</h4><ul><li>Target metals: As, Cd, Pb, Hg</li><li>Testing method: Shimadzu EDX fluorescence spectrometer</li><li>Amount of sample required: 1 tablet/capsule, 1 ml solution, 200 mg raw material, or 1 vial</li><li>Average turnaround time: 7 business days</li></ul><blockquote>Important Notice<ul><li>The standard screening covers arsenic, cadmium, lead, and mercury only.</li><li>If screening for other metals is required, this should be requested separately before analysis.</li></ul></blockquote><h4>Optional Additional Analyses</h4>The following optional laboratory services are available:<ul><li>Additional Laboratory Report</li></ul>

Products focused on X-ray - page 1

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