Compact, powerful, and flexible benchtop XRD system for routine and advanced applications
The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.
Key Features
- Real-time acquisition: entire diffraction pattern captured in seconds
- Wide angular range: up to 110° 2θ without moving components
- No external water cooling: no chiller required
- Standard power outlet: plug-and-play with no special electrical setup
- Low-power microfocus X-ray source: high intensity and efficient optics
- Versatile measurement: reflection and transmission modes
- Easy installation: suitable for labs, mobile labs, and field vans
Sample Handling & Accessories
- Fixed non-spinning sample stage
- Spinning stages for powders, bulks, filters, and pressed pellets
- Capillary sample stage for transmission mode
- Controlled atmosphere sample stage
- 6-position automatic sample changer
- Dedicated stage for thin film analysis (GIXRD, XRR)
- Temperature-controlled stages (–10 °C to 500 °C)
Typical Applications
- Phase identification and quantification
- Degree of crystallinity, crystallite size, and lattice parameters
- Crystal structure solutions and Rietveld refinement
- Thin film characterization (GIXRD, XRR)
- In-situ and dynamic studies (e.g., phase transitions)
- Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching
Software & Compliance
- SolstiX™ XRD Software with 21 CFR Part 11 compliance
- Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments
Why Choose ARL EQUINOX 100?
- Simultaneous, real-time data acquisition
- Compact, rugged, and mobile-ready design
- High performance at low operating cost
- Flexible platform for a broad range of samples and applications
