Designed for productivity
The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.
Thermo Scientific K-Alpha XPS System
- High-performance, fully featured XPS system
- Unique sample viewing with capability to facilitate rapid feature identification
- Chemical state imaging
- Large sample handling
- Variable micro-focus X-ray source to match analysis area to feature
- Ion source for depth profiling
- Low energy flood source for insulator analysis
- Built-in standards for self-calibration
K-Alpha XPS System features
High-performance X-ray source
The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.
Thermo Scientific K-Alpha XPS System
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Thermo Scientific K-Alpha XPS System
XPS sample viewing
Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.
Thermo Scientific K-Alpha XPS System
XPS insulator analysis
The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.
Thermo Scientific K-Alpha XPS System
XPS depth profiling
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Thermo Scientific K-Alpha XPS System
Optional XPS sample holders
Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.
Thermo Scientific K-Alpha XPS System
Avantage Software
Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.
Thermo Scientific K-Alpha XPS System
The full spectrum of surface analysis
Thermo Scientific - The full spectrum of surface analysis
