Quantifiable consistency. By tracking retention time consistency and peak symmetry across years of production, column performance becomes directly comparable.In chromatography, inconsistent separations are inconvenient and costly.Every unexpected shift in retention time or change in peak shape can trigger a cascade of troubleshooting, reruns, and uncertainty that slows laboratory productivity.On the other hand, when columns perform consistently, laboratories recover valuable time, reduce uncertainty, and maintain confidence in their data. True batch-to-batch consistency means fewer failed validations, fewer investigations, easier audits, and smoother collaboration across global sites.In regulated industries, data integrity underpins every decision, from early development to final release testing, so consistent column performance is a necessity.<h3>Key takeaways</h3><ul><li>Batch-to-batch (U)HPLC column consistency directly influences long-term method performance by stabilizing retention times, preserving peak shape, and supporting reliable validation of pharmaceutical methods.</li><li>Multi-year performance data across thousands of columns shows us how controlled column manufacturing reduces chromatographic variability, supporting reproducible results across column formats, batches, and laboratories.</li><li>Stable (U)HPLC columns minimize revalidation, troubleshooting, and method transfer challenges in regulated workflows, improving analytical efficiency across the product lifecycle.</li></ul><h3>Defining and measuring batch-to-batch (U)HPLC column consistency</h3>A (U)HPLC column is packed with <a target="_blank" rel="noopener noreferrer" href="https://www.thermofisher.com/content/lifetech/global/en/home/industrial/chromatography/chromatography-learning-center/chromatography-consumables/consumable-types.html">solid-phase particles</a> that <a target="_blank" rel="noopener noreferrer" href="https://www.thermofisher.com/content/lifetech/global/en/home/industrial/chromatography/chromatography-learning-center/liquid-chromatography-information/hplc-system-components/how-hplc-columns-work.html">separate compounds by chemical structure</a>.If medium composition differs even slightly between manufacturing batches, retention times and peak shapes can change. These differences might seem minor, but in pharmaceutical analysis they can trigger failed validations, unnecessary troubleshooting, and inconsistent data across labs.A recent evaluation of<a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/TG_20762_LC_Hypersil_GOLD_TG_20762_EN_ebcf64d4d6/TG-20762-LC-Hypersil-GOLD-TG20762-EN.pdf"> Thermo Scientific Hypersil GOLD columns</a> examined whether<a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/lcms/products?category=48&amp;manufacturerItems=3&amp;search=gold"> these columns </a>perform consistently across years of production. The answer: our results found sustained performance over time.Across roughly 17,500 columns tested over three years, researchers focused on two major indicators of a manufacturer’s column performance:<ul><li>Relative retention time (RRT), which is essentially how consistently compounds elute off the column.</li><li>Peak asymmetry, a reflection of column packing quality and how well peaks “behave.”</li></ul>In a recent technical note: <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/tn_004127_ccs_hypersil_gold_reversed_phrase_reproducibility_tn004127_na_en_d6375a67fb.pdf">Evaluation of batch-to-batch consistency of reversed-phase HPLC columns for long-term method validation</a>, we evaluated three column configurations: a 250 mm × 4.6 mm, 5 μm column; a 150 mm × 4.6 mm, 5 μm column; and 50 mm × 2.1 mm, 5 μm column, using a test mixture of five compounds selected to represent different hydrophobicities.Despite differences in column geometry and media batches, the method produced highly consistent chromatographic performance.The method also achieved RRT relative standard deviation variation of no more than 2.11% for the compounds and kept peak asymmetry within a narrow range of 0.92 to 1.09. This level of control reduces uncertainty from long-term method validation, reinforcing confidence in predictable, reproducible column performance.<h3>Why column stability over time matters</h3>As an experienced analyst, you already know how frustrating <a target="_blank" rel="noopener noreferrer" href="https://www.thermofisher.com/content/lifetech/global/en/home/industrial/chromatography/chromatography-learning-center/liquid-chromatography-information/hplc-method-development-steps.html">method validation</a> can be. You think you’ve nailed the method, only to find the results from run to run. Often, the issue isn’t you. It’s the tools.When your column behaves the same every time, you will see several downstream benefits, such as:1. Improved confidence in data interpretationYou don’t have to keep wondering whether differences in your data are coming from your chemistry or your column.2. Methods stay valid longerPharmaceutical companies must monitor drug purity throughout the product lifecycle, from development to manufacturing to quality control. A column that performs consistently over time makes comparisons straightforward and reliable.3. Method transfer is more reliableLarge companies operate across multiple global sites. When everyone uses columns that behave consistently, transferring methods becomes seamless rather than a months-long headache.A closer look at column performance dataThe published technical note visualizes column performance using clean, simple charts (Figure 1).<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_What_Multi_Year_Batch_Data_Reveals_About_U_HPLC_Column_Consistency_18faa4e44c.jpg" alt="Thermo Fisher Scientific: What Multi-Year Batch Data Reveals About (U)HPLC Column Consistency: Figure 1.&nbsp; (Top image) Batch-wise average RRT, normalized by o-Xylene for Hypersil GOLDTM 250 mm x 4.6 mm 5 µm (83 batches). (Bottom image) Average peak asymmetry evaluation of o-xylene Hypersil GOLDTM 250 mm x 4.6 mm 5 µm (83 batches)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_What_Multi_Year_Batch_Data_Reveals_About_U_HPLC_Column_Consistency_18faa4e44c.jpg 245w," sizes="100vw" width="1000" height="600">These graphs show us:<ul><li>Tight clusters of RRT points across 83 batches, depending on column format.</li><li>Nearly identical behavior between columns of different dimensions, which is a sign of effective manufacturing process controls.</li><li>Peak asymmetry values hovering around 1.0, indicating well-packed columns producing sharp, reliable peaks.</li></ul>This data might not seem glamorous at first glance, but for anyone who’s spent hours troubleshooting peak tailing, drifting retention times, or inconsistent quality control (QC) results, these charts are beautiful.<h3>Why column consistency matters for long-term method performance</h3>In automated LC workflows, a small change in column behavior can affect multiple downstream outputs: integration, peak purity assessment, and calculated assay/impurity results. Over time, this can translate into system suitability failures, drift outside validated ranges, and additional validation or comparability work.Column stability and batch-to-batch reproducibility are therefore critical for sustaining validated methods over time. The multi-batch data presented here demonstrate how controlled manufacturing processes can maintain consistent retention behavior and peak shape over time.To learn how to test your column and determine what data to look for, read our technical note, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/tn_004127_ccs_hypersil_gold_reversed_phrase_reproducibility_tn004127_na_en_d6375a67fb.pdf">Evaluation of batch-to-batch consistency of reversed phase HPLC columns for long-term method validation</a>.<h3>FAQs</h3><div><div><h5>1. How does batch-to-batch consistency in LC columns affect chromatographic results?</h5>Batch-to-batch consistency has a direct impact on the stability of chromatographic results. When columns are manufactured consistently, retention times remain stable and compounds elute at predictable intervals — run after run and batch after batch. This stability reduces unexpected shifts in selectivity or peak shape, helping analysts distinguish true method-related changes from column-related variability.</div><div><h5>2. How do you measure batch-to-batch consistency in LC columns?</h5>Batch-to-batch consistency is evaluated by applying the same standardized test method to columns produced across multiple manufacturing lots and by comparing key chromatographic performance metrics. Commonly monitored parameters include RRT, which reflects retention stability and peak asymmetry, which indicates packing quality and peak integrity. By tracking these metrics over many batches and extended production periods, manufacturers can quantify variability and ensure controlled, reproducible column performance.</div><div><h5>3. How does batch-to-batch LC column consistency support long-term method validation and transfer between laboratories?</h5>Consistent LC column performance plays an important role in sustaining validated methods over time, particularly in regulated pharmaceutical environments. When column behavior remains stable across production batches, methods are more likely to stay within established acceptance criteria, reducing the need for revalidation or investigation. This stability is especially valuable throughout the product lifecycle, from development through quality control and release testing. Batch-to-batch consistency also facilitates smoother method transfer between laboratories and global sites. When different labs use columns that perform the same way, chromatographic results are more predictable, making transfers faster, more efficient, and less prone to variability-related delays.</div></div><blockquote>Visit us on&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/72003132/admin/dashboard/">LinkedIn:</a>&nbsp;#UHPLC #ColumnsAndConsumables #pharmaceutical</blockquote>

What Multi-Year Batch Data Reveals About (U)HPLC Column Consistency

Chromatogram-based library searching can provide a fast first identification, but it does not always give analysts the flexibility needed to evaluate alternative candidates, adjust precursor settings, or choose different spectral comparison strategies. In his presentation, James Little of Mass Spec Interpretation Services shows how <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/Chromatogram_Sent_to_Lib_Search_d324bc4118.pdf">transferring chromatogram results into the standard NIST Library Search window</a> can expand the available search options and provide a more detailed view of potential compound matches.The workflow is particularly relevant when an analyst wants to go beyond the single best chromatogram result and investigate alternative library candidates, compare spectra using different scoring approaches, or perform MS/MS searches with greater control over precursor information.<h3>Why move from the chromatogram to Library Search?</h3>The chromatogram view is useful for rapid inspection, but according to the presentation, its library-search functionality is more limited.One of the main differences is that the chromatogram result list displays only the best library result, while the standard Library Search window provides access to alternative candidates. This can be important when several structures produce similar spectra or when the highest-ranked match needs additional scrutiny.The standard Library Search window also provides more control over MS/MS searching. While searches initiated directly from the chromatogram use the precursor information automatically supplied by the chromatogram, the Library Search window allows the user to work with different search modes and modify precursor settings where required.To transfer a component from the chromatogram into Library Search, the workflow shown in the presentation is straightforward: right-click the component of interest and select “Library Search.”<h3>Identity and similarity searches</h3>Once the spectrum has been transferred, the search settings determine how the library comparison is performed.With Identity selected, an MS/MS search can reproduce the type of search performed from the chromatogram. If the “In spectrum” option is enabled, the precursor sent from the chromatogram is used automatically. The option can also be disabled, allowing the analyst to enter a different precursor manually.An additional option is HiRes No Precursor. In this mode, the spectra are compared without restricting the search according to the precursor ion. The presentation highlights this approach as useful for obtaining substructural information, since the comparison is not constrained to entries matching a specified precursor.The Similarity mode provides access to Hybrid Search. Here again, the precursor imported from the chromatogram can be used automatically or replaced by another value. Hybrid Similarity itself is treated separately in the source presentation series, but its availability is one of the reasons for working in the full Library Search environment.<h3>Choosing the right spectral matching method</h3>The Library Search window also provides several ways to score spectral similarity:<ul><li>Full Spectrum Search</li><li>Impurity Tolerant Search (Reverse-Dot)</li><li>Partial Spectrum Search (PSS-Dot)</li></ul>Each is designed for a different analytical situation.<ul><li>Full spectrum matching compares the complete experimental and library spectra and is most appropriate when the acquired spectrum is clean and complete.</li><li>Reverse-Dot matching focuses primarily on whether important peaks from the library spectrum are present in the experimental spectrum. Extra peaks in the measured spectrum that are absent from the library spectrum are not penalized in the same way. This can make the approach more tolerant of chemical background or spectral contamination.</li><li>Partial Spectrum Search addresses the opposite situation. It does not strongly penalize library peaks that are missing from the experimental spectrum and is therefore suited to incomplete spectra, including cases where only a subset of fragment ions is observed, such as some MS/MS or filtered datasets.</li></ul>Although the results table can display multiple similarity metrics, the search method selected before the search begins is important because of the way Presearch operates.<h3>Why Presearch matters</h3>NIST uses a Presearch step to reduce the number of library spectra that require more detailed comparison.This significantly increases search speed, but it also means that spectra removed during Presearch will not appear later in the final results—even if another scoring metric might have ranked them favorably.This is why the presentation emphasizes choosing the appropriate search method before Presearch when Reverse-Dot or Partial Spectrum behavior is important.For example, running a standard Full Spectrum search and then sorting the final result table by Reverse-Dot does not necessarily reproduce the same candidate set that would have been obtained if an impurity-tolerant search had been selected from the beginning. Potentially relevant candidates may already have been excluded during the initial Presearch stage.For routine reviewing, the presentation recommends using the overall NIST Score as the primary sorting criterion, while remembering that specialized searches may require a different search strategy from the outset.<h3>Selecting libraries and mass tolerances</h3>Before running the search, analysts can specify which libraries should be included.The presentation illustrates the Library Search settings where individual spectral libraries can be added or removed from the search. This allows the search space to be tailored to the application rather than automatically searching every available library.For high-resolution MS/MS data, users can also configure mass tolerances for both precursor and product ions.These settings are particularly important because overly broad tolerances may increase the number of irrelevant candidates, while unnecessarily narrow tolerances could exclude valid matches. The appropriate values therefore need to reflect the quality and mass accuracy of the acquired data.The software also provides additional options associated with precursor handling and polarity matching.<h3>Understanding the result scores</h3>Once the search is complete, the result table can be customized to support efficient review.Properties can be added, reordered, resized, and used for sorting. The presentation notes that the results are normally best reviewed initially by Score.Two related measures discussed are the dot product and the NIST Score.The dot product reflects the direct similarity between two spectra based on shared peaks and their intensities. The NIST Score builds on this comparison by applying additional weighting and scaling. According to the presentation, this helps preserve useful matching performance when spectra are incomplete, as may occur with MS/MS or filtered spectral data.Analysts can also sort by Rev-Dot or Partial Spectrum Search (PSS) values. However, the limitations imposed by the initial Presearch still apply: sorting cannot recover candidates that were already removed before the detailed comparison stage.The result interface can also be navigated efficiently using the keyboard arrow keys, and the available display properties can be rearranged according to the analyst’s preferred review workflow.<h3>Additional filters for faster review</h3>The presentation also highlights two useful post-search filters:<ul><li>Best Matching Only</li><li>MS/MS Hit Filter List options</li></ul>Unlike Presearch, these filters are applied after the candidate search has already been completed. They can therefore be switched on and off without permanently removing candidates from the search process.The Best Matching Only option removes many duplicate results and can make the candidate list easier to review.The MS/MS Hit Filter provides additional filtering options for tandem MS results, including parameters related to instrument type and allowed precursor forms.James Little notes that he generally keeps these filters disabled initially and applies them only when needed. This approach preserves the complete search result set during the first review and allows filtering to be introduced later as a tool for improving efficiency.<h3>More flexibility for library-based identification</h3>The main advantage of moving chromatogram results into the full NIST Library Search window is not that the original chromatogram search is incorrect, but that the dedicated search environment gives the analyst more control over how the spectrum is interrogated.It allows alternative candidates to be reviewed, precursor restrictions to be modified, different identity and similarity strategies to be selected, and specialized full-spectrum, impurity-tolerant, or partial-spectrum comparisons to be performed.Just as importantly, the workflow highlights a subtle but important principle in spectral searching: the scoring method used to review results and the method used to generate the candidate set are not necessarily interchangeable. Because Presearch determines which library spectra proceed to detailed evaluation, analysts should choose the search strategy that best reflects the characteristics of their experimental spectrum before beginning the search.Used in this way, the NIST Library Search window can provide a more flexible and transparent workflow for investigating chromatographic components and evaluating MS/MS library matches.

 Searching Normal NIST Search with Chromatogram Results

Is your lab ready for the new academic year? As students and teachers return to the laboratory, now is a great time to prepare your chromatography systems for the semester ahead.Now with 20% total discount on a new <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/999">Clarity Chromatography Software</a> for customers from educational institutions. In addition, customers purchasing a new license for Clarity Chromatography Software will receive a free copy of <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/1000">Clarity Offline Chromatography Software</a>.<blockquote>👉Promotion code: MKT2114The offer is valid through the end of October 2026.</blockquote>The latest version of Clarity Chromatography Software - 10.2 was released in June 2026! <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/article/7512">Read the article HERE.</a>

Back to School: 20% Off Clarity Chromatography Software

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Since 1991 DataApex develops and manufactures chromatography data stations. DataApex is constantly striving to provide users with efficient and up-to-date tools for chromatography data processing.

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James Little/Mass Spec Interpretation Services

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category XPS from Thermo Fisher Scientific - page 1

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