In the week from September 7, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 6 000 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Thermo Fisher Scientific: Spatial Proteomics for Translational Research</h5><ul><li>Tu, 8.9.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6456">Registration</a></li></ul>Learn how Thermo Fisher's EVOS S1000 system and Aluora kits reduce sample costs for tumor imaging and support spatial proteomics workflows in translational research.<h5>2. SelectScience: Managing 4D-STEM data with smarter acquisition</h5><ul><li>Tu, 8.9.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6427">Registration</a></li></ul>Tackle the 4D-STEM data burden and explore smarter acquisition strategies designed to improve efficiency and manage increasingly complex microscopy datasets.<h5>3. Milestone: Mastering Geological Sample Preparation: Strategies for Complete Digestion and Low Blanks</h5><ul><li>We, 9.9.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6483">Registration</a></li></ul>Learn how SRC microwave digestion supports complete dissolution of rocks, sediments, and mineral ores while reducing blanks and improving reliability in elemental and isotopic analysis.<h5>4. New Food magazine: Measuring what matters: water quality analysis with UV-Visible spectrophotometry</h5><ul><li>We, 9.9.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6392">Registration</a></li></ul>Explore how UV-Visible spectrophotometry supports reliable water quality analysis across a range of laboratory and environmental applications.<h5>5. C&amp;EN: Expanding NMR Possibilities with HFX Cryogenic Probes</h5><ul><li>We, 9.9.2026 17:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6463">Registration</a></li></ul>Discover how JEOL SuperCOOL MARVEL HFX Duo cryogenic probe technology combines high sensitivity with HFX triple resonance to expand fluorine NMR analysis.<h5>6. Anton Paar: Correlating Mechanical and Chemical Properties: Introduction to Rheo-Raman for Polymers</h5><ul><li>We, 9.9.2026 18:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6378">Registration</a></li></ul>Discover how combining rheology with Raman spectroscopy enables real-time insights into polymerization, crystallization, thermal stability, and polymer structure–property relationships.<h5>7. Agilent Technologies: Overcoming Key Challenges in Microplastics Analysis</h5><ul><li>Th, 10.9.2026 07:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6469">Registration</a></li></ul>Learn how LDIR chemical imaging simplifies microplastics analysis through automated polymer identification, sizing, and characterization.<h5>8. SciY/Mestrelab Research: Advancing Lean Chemometrics: Iterative Optimization Technology as a Process Analytical Technology Tool for Reducing Calibration Burden</h5><ul><li>Th, 10.9.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6428">Registration</a></li></ul>Discover how Iterative Optimization Technology and lean chemometrics can accelerate PAT deployment while reducing calibration burden in analytical workflows.<h5>9. Agilent Technologies: IR Microscopy to Streamline Your Microplastics Analysis</h5><ul><li>Th, 10.9.2026 20:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6440">Registration</a></li></ul>Learn how the Agilent 8700 LDIR simplifies microplastics analysis with automated laser-based IR imaging that reduces analysis time for environmental laboratories.<h5>10. SelectScience: TechTalk: Benefits of high-resolution ICP-OES for challenging applications</h5><ul><li>Fr, 11.9.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6470">Registration</a></li></ul>Learn how high-resolution ICP-OES from Analytik Jena can improve spectral resolution and trace-element detection for demanding analytical applications.

Webinars LabRulezICPMS Week 37/2026

Size distribution and elemental analysis of fine particles from Li-ion battery cell fire

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 7th September 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies, Metrohm and Shimadzu and brochure by Thermo Fisher Scientific!<h3>1. Agilent Technologies: <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP‑QQQ</a> with m‑Lens for Ultratrace Analysis of High‑Purity Reagents</h3>Achieving low backgrounds under hot plasma conditions using ICP-QQQ preset methods&nbsp;<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_m_lens_high_purity_reagents_9500_icp_qqq_5994_9062en_agilent_f0e65c4d9b.pdf">Full PDF for download</a>&nbsp;</li></ul>Controlling trace-metal contaminants is essential in both semiconductor reagent analysis and metal‑based materials characterization. High‑purity chemicals such as nitric acid (HNO3) and sulfuric acid (H2SO4), as well as high‑purity metals, require analytical workflows capable of achieving sub‑ppt detection limits (DLs) while maintaining excellent robustness and reproducibility. To meet these needs, the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 Triple Quadrupole ICP‑MS (ICP‑QQQ)</a> equipped with a Dual‑Cell System (DCS)1 and the optional m‑lens ion optics provides a highly stable platform, enabling low backgrounds and reliable performance under hot plasma conditions.&nbsp;The m‑lens is engineered to suppress background signals for elements including easily ionized elements such as Na and K that typically show elevated background equivalent concentrations (BECs) under hot plasma conditions. The 9500 ICP-QQQ with m‑lens is suitable for the analysis of metal digests and other sample types that demand robust performance and low backgrounds.2However, its benefits also extend to low‑matrix, high‑purity reagents, supporting sub‑ppt impurity measurements of simpler matrices.3&nbsp;Agilent’s ICP‑QQQ portfolio allows users to select instruments based on desired DLs and operational objectives. For laboratories seeking the lowest possible DLs, the Agilent 8900 Semiconductor configuration ICP-QQQ equipped with an s‑lens provides exceptional sensitivity, making it suitable for laboratories operating at the extreme limits of ultratrace quantification. The 9500 ICP-QQQ with m‑lens provides robust, high sensitivity measurements, ideal for routine trace level applications. This model is appropriate for labs that may not require the lowest DLs for every element but still demand high‑quality, reproducible data.&nbsp;In this study, we evaluated the performance of the 9500 ICP‑QQQ using a method designed specifically for low‑matrix, high‑purity reagents. Using preset methods implemented in the instrument software for ultrapure water (UPW) and for H2SO4 —the UPW method is also applicable to diluted HNO3 and H2O2 — we analyzed 1% HNO3 and high purity H2SO4 separately. Sub-ppt DLs and low backgrounds were achieved for target analytes in both matrices. These results confirm that the 9500 ICP‑QQQ with m-lens can be used for ultratrace impurity analysis of semiconductor‑grade reagents, as well as demanding metal‑matrix applications.&nbsp;<h4>Experimental</h4><h5>Instrumentation&nbsp;</h5>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP-QQQ</a> fitted with the optional m-lens and the Agilent I-AS autosampler were fully controlled using Agilent OpenLab ICP-MS software version 1.1. Designed for ultratrace metal analysis, the sample introduction system comprised a MicroFlow PFA nebulizer with I-AS probe (operated in self-aspiration mode), a temperature-controlled quartz spray chamber, and a quartz torch with a 2.5 mm inner diameter (id) injector. A platinum-tipped sampler cone with copper base and a platinum-tipped skimmer cone with nickel base for m-lens were used.&nbsp;The 9500 ICP‑QQQ was operated using five tune modes: no gas, Advanced Helium Mode (AHM), O2 , NH3 , and H2 . For the H2 SO4 samples, additional specialized tunes were prepared for the determination of platinum (Pt) and zinc (Zn) to ensure optimal performance (Table 1). The use of reaction and collision gases enabled effective removal of spectral interferences originating from argon plasma species as well as matrix‑related polyatomic ions. The makeup gas flow rate and the Omega lens voltage parameters were automatically optimized by the preset methods for m-lens, resulting in a stable CeO/Ce ratio that was maintained between approximately 1 and 3%.<h4>Conclusion&nbsp;</h4>This study evaluated the Agilent 9500 ICP‑QQQ with m‑lens for ultratrace analysis of high‑purity reagents using preset methods for 1% HNO3 and 9.8% H2 SO4 . Sub‑ or singlefigure ppt detection limits and low background equivalent concentrations were achieved for all elements, demonstrating that ultratrace measurements can be easily performed under hot‑plasma conditions. The Dual‑Cell System enabled effective removal of matrix‑related interferences, with Advanced Helium Mode providing an effective approach for the measurement of challenging elements such as Zn in H2 SO4 . The results show that the 9500 ICP‑QQQ with intuitive preset methods can deliver sensitive, low-background data, offering an accessible entry point for laboratories that are new to ultratrace analysis.<h3>2. Metrohm: Rapid quality control of fruits and vegetables using NIR spectroscopy</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_nir_141_download_e1bab41aee.pdf">Full PDF for download</a></li></ul>Near-infrared (NIR) spectroscopy has emerged as a powerful, nondestructive analytical technique for quality control in the fruit and vegetable processing industry. This Application Note presents the use of NIR spectroscopy for the rapid monitoring of firmness in apples and °Brix in peaches and crushed tomatoes. These are critical parameters to verify the quality and freshness of various fruits and vegetables. Traditionally measured using destructive methods like penetrometry and refractometry, these fresh produce quality control attributes are critical indicators of ripeness, sweetness, and overall consumer acceptability.<h4>EXPERIMENTAL EQUIPMENT</h4>All samples were tested with a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=220&amp;search=NIR">Metrohm near-infrared (NIR) spectrometer.</a> The measurements were done in reflection mode using either a large sample cup or direct measurement (i.e., no holder). Metrohm software was used for all data acquisition and quantification model development.<h4>CONCLUSION</h4>This Application Note shows that NIR spectroscopy can easily measure firmness in apples, as well as °Brix in peaches and crushed tomatoes. When compared to traditional lab methods (Table 1), NIRS provides a faster, simpler, and nondestructive alternative with excellent accuracy and consistency. All measurements proved to be consistent and fast, helping producers to monitor their fresh fruits and vegetables and deliver high-quality products to consumers.<h3>3. Shimadzu: Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_01122_en_b3b0f25211.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>The TOC solid sample measurement system enables quantitative evaluation of carbon coatings on cathode active material surfaces.</li><li>The AIRsight infrared/Raman microscope enables evaluation of the carbon layer structure.</li><li>Carbon content and structure can be evaluated using a small amount of sample.</li></ul>The cathode active materials used in lithium-ion batteries (LiBs) for electric vehicles (EVs) are broadly classified into two categories depending on their application: nickel-based materials (NCM/NCA/NCMA) and phosphate-based materials (LFP: LiFePO4, LMFP: LiFexMn1-xPO4). Nickel-based materials are characterized by high energy density as well as excellent low-temperature and high-power performance, making them indispensable for longrange driving and high-performance vehicle segments. In contrast, phosphate-based materials offer superior safety, long cycle life, and cost advantages, and their use is expanding primarily in standard-range and mass-market segments.Because LFP and LMFP compounds are intrinsically low in electronic conductivity, a carbon coating on the surface of the active material is essential to compensate for that limitation and improve performance. Accordingly, quantitative control of carbon content is of great importance. For that type of carbon analysis, the TOC solid sample measurement system (Fig. 1), which combines a TOC-L total organic carbon analyzer with an SSM-5000A solid sample combustion unit, is effective.&nbsp;Furthermore, the conductivity of the surface carbon layer is closely related to the degree of graphitization and defect structure of the carbon, making structural evaluation of the carbon layer equally important. The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=AIRsight">AIRsight infrared/Raman microscope</a> (Fig. 2) enablessuch structural evaluation.&nbsp;This Application News presents examples of evaluating carbon on the surface of LMFP cathode active materials, with carbon quantitation using a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=TOC-L">TOC-L </a>+ <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=SSM-5000A">SSM-5000A system</a> and carbon layer structure evaluation using the AIRsight infrared/Raman microscope.<h4>Conclusion&nbsp;</h4>Quantitative analysis of the carbon coating on the LMFP surface was performed using the TOC solid sample measurement system (TOC-L + SSM-5000A), and structural evaluation of the carbon layer was conducted using the AIRsight microscope. In addition, Raman analysis of the LMFP residue after TC analysis was carried out to verify the validity of the carbon quantitation results. The TOC solid sample measurement system (TOC-L + SSM-5000A) is capable of not only TC analysis in solid samples, but also of IC and TOC analysis. Furthermore, by simply changing the software settings, carbon analysis of liquid samples (TOC, TC, and IC) can also be performed using the TOC-L main unit. This system can also be applied to carbon analysis of water-extractable TOC in black mass, lithium extraction solutions, and lithium carbonate, all of which are relevant materialsin lithium-ion battery recycling. The AIRsight is capable of both Raman and infrared measurements. Therefore, in addition to the Raman measurements introduced here, it can be used, with a single microscope system, to evaluate degradation caused by charge and discharge cycles in various battery components, such as negative electrode materials and separators.<h3>4. Thermo Fisher Scientific: <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002">Thermo Scientific GS Omni</a> Light Element Analysis in Slurry Process Streams</h3><ul><li>Brochures and specifications</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/CAD_GS_Omni_Light_Element_Analyzer_bf50abdb7e.pdf">Full PDF for download</a></li></ul>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002">Thermo Scientific™ GS Omni analyzer</a> provides accurate, real-time elemental analysis of multiple slurry streams for both light and heavy elements. Using the Prompt Gamma Neutron Activation Analysis (PGNAA) technology, the GS Omni analyzer has a distinct advantage over analyzers using X-ray fluorescence (XRF) and Laser induced breakdown spectroscopy (LIBS) by being able to directly measure elements lower than calcium on the periodic table and particle sizes up to 5mm.<h4>Benefits&nbsp;</h4>The Thermo Scientific GS (Gamma Slurry) Omni analyzer is the latest development of a proven, robust, analyzer that provides direct simultaneous analysis of multiple elements in slurry beneficiation plants.&nbsp;The analyzer is available in configurations of 2 to 8 streams. The optimum number of streams is usually dependent on the stream concentrations, elements of interest, required cycle analysis time, plant layout and process control considerations. This elemental analyzer will enable improvements in product quality, recovery and lower production costs.&nbsp;<h4>Applications&nbsp;</h4>The Thermo Scientific GS Omni analyzer is a powerful measurement tool in the following applications:&nbsp;<ul><li>Slurry beneficiation / Light element analysis&nbsp;</li><li>Product quality / Penalty costs&nbsp;</li><li>Tailings management&nbsp;</li></ul>Slurries include:&nbsp;<ul><li>Iron ore&nbsp;</li><li>Sulphur&nbsp;</li><li>Phosphates&nbsp;</li><li>Copper&nbsp;</li><li>Calcium carbonate&nbsp;</li><li>Magnesium&nbsp;</li><li>Industrial Minerals</li></ul>

News from LabRulezICPMS Library - Week 37, 2026

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Thermo Scientific IonicX Portable XRF Analyzer

Thermo Scientific™ IonicX enables fast and accurate salt analysis in raw materials using portable XRF without complex preparation or destructive testing.

<div><div>Identify ionic salts in seconds with minimal sample preparation. The Thermo Scientific™ IonicX™ Portable XRF Analyzer provides:<ul><li>Fast and accurate verification of ionic salt raw materials</li><li>High sample throughput for pharmaceutical and biopharmaceutical manufacturers</li></ul>Cut testing time and costs by replacing:<ul><li>time-consuming</li><li>resource-intensive</li><li>wet chemistry and benchtop methods</li></ul>with a ✅ non-destructive, ✅ non-contact, ✅ portable XRF analyzer for ionic salts.<h3>⚙️ Key Features</h3><ul><li>Portable verification of a wide range of ionic salts in seconds</li><li>Compliant with 21 CFR Part 11:<ul><li>electronic signatures</li><li>user access control</li><li>audit trails</li></ul></li><li>Non-destructive testing of raw materials</li><li>Minimal sample preparation</li><li>Simple operation, no extensive operator training required</li><li>Lightweight and compact design for easy portability</li><li>Wi-Fi enabled</li><li>Hot Swap Battery</li><li>IP54 Certified – splash and dust proof</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg" alt="Thermo Scientific™ IonicX Portable XRF Analyzer " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg 156w," sizes="100vw" width="650" height="650"><h3>📏&nbsp;Specifications</h3><ul><li>Bluetooth: Supports print functionality and barcode reader</li><li>Camera:<ul><li>Macro Camera: Integrated CCD macro camera for capturing overview images of parts and tagging measurement locations</li><li>Micro Camera: Integrated CCD micro camera for locating and recording measurement positions</li></ul></li><li>Certifications/Compliance:&nbsp;<ul><li>EN 55011:2010</li><li>EN 61326:2013</li><li>FCC 47 CFR Part 15</li><li>Safety EN 61010; 2010 (3rd Ed) with national deviations for US and Canada</li><li>RoHS EN 50581; 2012</li></ul></li><li>Data Entry:&nbsp;<ul><li>Touchscreen keyboard</li><li>User customizable data entry</li><li>Optional wireless remote barcode reader</li></ul></li><li>Data Storage:&nbsp;<ul><li>512 MB internal system memory/16 GB industrial grade storage</li><li>Stores approximately 130,000 readings with spectra (fewer if macro and micro images are saved)</li></ul></li><li>Data Transfer: Wi-Fi, USB</li><li>Dimensions: 12 × 12 × 8 in. (30.48 × 30.48 × 20.32 cm)</li><li>Display Type: Tilting, color, resistive touchscreen display</li><li>IP Rating: IP54 (splash and dust proof)</li><li>Languages: English</li><li>Licensing: Varies by region; Contact your local distributor</li><li>Operating Environment:&nbsp;<ul><li>Temperature: 0°C to 50°C (external fan recommended when ambient temperature is greater than 33°C)</li><li>Humidity: 10% to 90% relative humidity non-condensing</li></ul></li><li>Operating System: Linux</li><li>Optional Accessories:&nbsp;<ul><li>Thermo Scientific portable test stand</li><li>Thermo Scientific mini test stand</li></ul></li><li>Power Consumption: 12V lithium-ion battery, or 12V DC, 3A, 3.6W power supply</li><li>Security Features: Password-protected user security</li><li>Software: IonicX PC software</li><li>Spot Size: Standard: 8 mm collimation</li><li>Standard Accessories:&nbsp;<ul><li>Locking shielded carrying case</li><li>Two (2) lithium-ion battery packs</li><li>One (1) 110/220 VAC battery charger/AC adaptor</li><li>Check samples</li><li>Safety lanyard</li><li>PC connection cable (USB)</li></ul></li><li>System Details: Built-in standardization via automatic system check</li><li>Weight (English): 5.8 lbs. with battery and test stand</li><li>Weight (Metric): 2.6 kg with battery and test stand</li><li>X-Ray Source Type:&nbsp;<ul><li>X-Ray Tube: Ag anode (6–50 kV, 0–500 μA, 5W max)</li><li>Dynamically adjustable current for optimal sensitivity on every analysis</li></ul></li><li>Applications: Raw Material Testing</li><li>Detector Type: Proprietary Large Area Drift Detector</li><li>Tube Voltage: 6 to 50 kV</li><li>Unit Size: Each</li></ul></div></div>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Heavy Metals Screening (As, Cd, Pb, Hg)

Screening of arsenic, cadmium, lead, and mercury in samples using Shimadzu EDX fluorescence spectrometry.

The Heavy Metals Screening is a standalone laboratory test designed to detect the presence of selected heavy metals in a sample.The standard screening covers arsenic (As), cadmium (Cd), lead (Pb), and mercury (Hg). Other metals may be tested upon request.<h4>About the Analyzed Metals</h4>Arsenic, cadmium, lead, and mercury are toxic elements that may occur as contaminants in raw materials, finished products, supplements, pharmaceuticals, and other sample types.Their presence can be relevant for quality control and safety assessment, especially when contamination may arise from raw materials, manufacturing, handling, or storage.<h4>Key Features</h4><ul><li>Standalone screening for selected heavy metals</li><li>Target metals: arsenic (As), cadmium (Cd), lead (Pb), and mercury (Hg)</li><li>Analysis using Shimadzu EDX fluorescence spectrometry</li><li>Suitable for tablets, capsules, liquid solutions, raw materials, and vials</li><li>Other metals can be tested upon request</li><li>Minimum sample amount of 1 tablet/capsule, 1 ml solution, 200 mg raw material, or 1 vial</li><li>Average turnaround time of 7 business days</li></ul><h4>Analysis Parameters</h4><ul><li>Target metals: As, Cd, Pb, Hg</li><li>Testing method: Shimadzu EDX fluorescence spectrometer</li><li>Amount of sample required: 1 tablet/capsule, 1 ml solution, 200 mg raw material, or 1 vial</li><li>Average turnaround time: 7 business days</li></ul><blockquote>Important Notice<ul><li>The standard screening covers arsenic, cadmium, lead, and mercury only.</li><li>If screening for other metals is required, this should be requested separately before analysis.</li></ul></blockquote><h4>Optional Additional Analyses</h4>The following optional laboratory services are available:<ul><li>Additional Laboratory Report</li></ul>

Products focused on X-ray - page 1

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