Our Library never stops expanding. What are the most recent contributions to LabRulezGCMS Library in the week of 7th September 2026? Check out new documents from the field of the gas phase, especially GC and GC/MS techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT GCMS AND RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">LabRulezICPMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies and Shimadzu, presentation by MDCW / Los Alamos National Laboratory and other document by Thermo Fisher Scientific!<h3>1. Agilent Technologies: Quantification of Microplastics in Soil and Sediment Using Dry-Ice-Assisted Fractionation</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_8700_ldir_chemical_imaging_system_5994_9256en_agilent_94102868f0.pdf">Full PDF for download</a></li></ul><section><div><div><div><div><div><div>Microplastics are now widely reported in terrestrial environments, including soil and sediments, raising concerns about soil health and potential human exposure pathways (for example, in agricultural regions).1,2 Microplastics can be classified by polymer type and particle characteristics (size, color, and morphology such as fragments and fibers) and may be primary (manufactured small) or secondary (formed from the breakdown of larger plastic items). In this workflow, microplastics were defined as particles ranging from 1 µm to &lt;&nbsp;1,000 µm.&nbsp;Reliable and reproducible quantification remains challenging, limiting comparability between studies and complicating risk assessment and the development of defensible monitoring approaches. Challenges occur across the workflow, from sampling and extraction through to instrumental analysis and reporting, and are exacerbated by environmental heterogeneity, inconsistent reporting, and the limited availability of standard reference materials and routine quality control&nbsp;procedures.&nbsp;Conventional soil microplastics workflows typically include drying, density separation and/or flotation, chemical digestion to remove organic matter, and filtration prior to spectroscopic identification.3–5 In this application note, we combined a fast, practical extraction workflow with consistent, automated instrumental analysis by adapting foam fractionation to soil and sediment. Several bubbling strategies (soda water, compressed air, and nitrogen) were evaluated; dry ice was selected because it produced vigorous mixing and stable foam in the presence of a surfactant, enhancing exposure of particles to the foam layer and improving isolation from the matrix.&nbsp;All method validation and environmental sample analyses were performed using an Agilent 8700 LDIR chemical imaging system, providing automated particle location, polymer identification, sizing, and counting. A particle-based internal standard was integrated into the workflow as a simple, sample‑specific check on extraction and transfer&nbsp;performance.<h4>Results and discussion</h4><h5>Environmental sample overview&nbsp;</h5>The workflow was applied to environmental samples from Victoria, Australia, including three soil types (chromosol, dermosol, and hydrosol) and freshwater sediment from three locations. In all samples, the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/gcms/library?mainauthorItems=10&amp;search=8700%C2%A0LDIR">8700&nbsp;LDIR</a> provided automated particle identification, sizing, and counting of microplastics following dry-ice-assisted fractionation and density separation. Soil concentrations ranged from 4,360 to 102,000 microplastics kg–1, with acrylonitrile butadiene styrene and polyamide the most frequently detected polymers. Sediment concentrations ranged from 41,400 to 127,000 microplastics kg–1 and were dominated by fragments in the 10 to 50 µm size&nbsp;range.<h4>Conclusion&nbsp;</h4>This study demonstrates the suitability of the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/gcms/library?mainauthorItems=10&amp;search=8700%C2%A0LDIR">Agilent 8700 LDIR chemical imaging system</a> for automated, particle‑based quantification of microplastics in complex soil and sediment matrices. When combined with dry-ice-assisted foam fractionation, the 8700 LDIR provided reliable identification, sizing, and counting of microplastics across a broad size and density range with high&nbsp;repeatability.&nbsp;The integration of a particle-based ISTD within the LDIR workflow enabled sample-specific performance assessment, addressing a key limitation in current microplastic methodologies. Application to environmental samples confirmed the robustness of the approach and highlighted the capability of the 8700 LDIR to support high‑confidence, reproducible microplastics analysis for research and routine monitoring applications.<h3>2. MDCW / Los Alamos National Laboratory: Discovery-based analysis for chromatographic trends using alteration analysis (ALA) and two-dimensional correlation analysis (2DCOR)</h3><ul><li>Presentation</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/O_1_Freye_10783a9cf3.pdf">Full PDF for download</a></li></ul><section><div><div><div><div><div><div>The presentation focuses on discovery-based analysis of complex chromatographic datasets using Alteration Analysis (ALA) and Two-Dimensional Correlation Analysis (2DCOR). The motivation is to avoid manual chromatogram comparison and labor-intensive peak-table processing, especially for GC-TOFMS and GC×GC datasets that can contain billions of data points. Instead, the authors analyze raw data directly and use statistical methods to identify only those features that show meaningful chemical changes across a series of samples.ALA provides a quantitative way to detect how individual data points vary across a sample series. It generates three outputs: the Basic Alteration Map (BAM) for overall change, the Synchronous Alteration Map (SAM) for mainly linear changes, and the Asynchronous Alteration Map (AAM) for nonlinear behavior. Validation with simulated datasets showed that ALA can detect relatively small changes and remains effective even for severely overlapping chromatographic peaks. The presentation reports that its performance remains similar to that for isolated peaks down to a resolution of about Rs 0.3, and under suitable signal-to-noise and change conditions it can still succeed at resolutions as low as Rs 0.01.While ALA identifies which signals are changing and the type or magnitude of that change, 2DCOR adds information about how those changes are related to one another. Synchronous correlation maps describe whether signals change together in the same or opposite direction, while asynchronous maps help establish sequential relationships between changes. Using Noda’s rule, the order in which chemical features respond to an external perturbation can be inferred. The combined ALA–2DCOR workflow therefore provides three key pieces of information: the significance of a change, the relationship between changing components, and the order in which those changes occur.Extending these methods to GC×GC required additional processing because of chromatographic misalignment and the enormous size of two-dimensional datasets, with GC×GC-HRMS data reaching roughly 80 billion data points. The solution presented is to divide the chromatographic space into tiles, apply ALA to locate important features, then re-center tiles and use 2DCOR on the relevant regions. In a recent application to high-explosive aging, ALA detected more than 250 chemical changes, providing insight into decomposition behavior where simpler feature-selection approaches such as the F-ratio were insufficient. The authors conclude that combining ALA and 2DCOR offers a practical route for discovering and interpreting chemical trends in highly complex GC-MS and GC×GC datasets.<h3>3. Shimadzu: Residual Solvent Analysis in Pharmaceuticals with N2 Carrier Gas Using <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/gcms/library?mainauthorItems=1&amp;search=GC-2060">Nexis GC-2060</a> and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/gcms/library?mainauthorItems=1&amp;search=HS-20+NX">HS-20 NX</a></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_01172_en_59d0e341a0.pdf">Full PDF for download</a></li></ul><h4>User benefits</h4><ul><li>The newly designed FID delivers outstanding sensitivity, ensuring highly accurate and reliable analysis.</li><li>Achieve full compliance with JP and USP guidelines using N2 carrier gas, which is highly affordable and readily available.</li><li>Easily analyzes tert-butyl alcohol and Cyclopentyl methyl ether, the Class 2 solvents added in the ICH Q3C (R8) guideline.</li></ul>For the analysis of residual solvents in pharmaceuticals, headspace gas chromatography (HS-GC) is widely used to target Class 1 and Class 2 solvents, in accordance with USP General Chapter &lt;467&gt; and JP18 (Japanese Pharmacopoeia, 18th Edition). These regulatory tests demand high sensitivity and reproducibility. The newly developed FID for the Nexis GC-2060 offers superior detection sensitivity compared to conventional models, enabling highly sensitive analysis. Additionally, due to recent helium supply shortages and rising costs, there is a growing demand for alternative analysis using nitrogen (N2) as a carrier gas.&nbsp;This application note presents the analysis of Class 1 and Class 2 water-insoluble samples using the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/gcms/library?mainauthorItems=1&amp;search=GC-2060">Nexis GC-2060</a> with N2 carrier gas, compliant with Supplement II to the Japanese Pharmacopoeia. DMSO was used as the sample solvent.<h4>Conclusion&nbsp;</h4>Using the Nexis GC-2060 with nitrogen (N2) carrier gas, we successfully achieved the analytical precision required by the Japanese Pharmacopoeia (JP18) and USP General Chapter &lt;467&gt;. The HS-GC method delivered excellent S/N ratios and high repeatability for the analysis of residual solvents in waterinsoluble pharmaceutical samples.<h3>4. Thermo Fisher Scientific: Measuring and monitoring emissions at data centers: A practical guide to compliance and performance</h3><ul><li>Other document (white paper)</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/datacenter_emissions_wp1802_en_45a9da8df3.pdf">Full PDF for download</a></li></ul>The rapid expansion of data centers, driven by artificial intelligence (AI), cloud computing, and digital infrastructure, is creating unprecedented demand for electrical power. In many regions, utility interconnection delays, transmission constraints, and the need to bring new computing capacity online quickly are driving data center developers to incorporate onsite power generation as part of their energy strategy. Natural gas-fired turbines, reciprocating engines, and other distributed generation assets are increasingly being deployed to supplement or, in some cases, serve as the primary source of power for new facilities.&nbsp;As data centers evolve from purely electrical loads into powergenerating facilities, they become subject to a range of air permitting, emissions reporting, and regulatory compliance requirements. Consequently, emissions monitoring has emerged as a critical component of both regulatory compliance and responsible facility operation. Facility owners and operators must balance the need for reliable power generation with increasingly stringent environmental requirements while maintaining operational performance and uptime.&nbsp;This white paper provides a practical, technically grounded overview of emissions monitoring strategies for data centers with onsite power generation. It outlines the regulatory landscape, reviews common monitoring approaches, and discusses key system design considerations to help facility owners, operators, engineers, and environmental professionals develop effective compliance strategies while supporting the continued growth of digital infrastructure.<h4>Analyzer technology considerations for modern CEMS&nbsp;</h4>Gas analyzers form the core of any continuous emissions monitoring system. These instruments rely on well-established measurement principles that are recognized by regulatory agencies worldwide. Chemiluminescence detection (CLD), as described in EPA Method 7E², is widely used for NOx measurement due to its sensitivity, selectivity, and long-term stability. Similarly, non-dispersive infrared (NDIR) technology, as described in EPA Method 10³, is commonly used for carbon monoxide (CO) monitoring. These proven measurement techniques are broadly accepted across federal, state, and local regulatory programs and provide the accuracy and reliability required for emissions compliance applications. Selecting analyzer platforms that are widely deployed and familiar to regulators, testing organizations, and CEMS integrators can further simplify implementation, helping facilities achieve a smoother commissioning process and faster path to compliance.&nbsp;Within this context, modern analyzer platforms like the Thermo Scientific™ 42iQ NO-NO2-NOx Gas Analyzer and the Thermo Scientific™ 48iQ CO Gas Analyzer have been specifically designed to support continuous emissions monitoring applications. These systems deliver high sensitivity, low detection limits, and stable performance across a wide range of operating conditions. Both analyzers can also be configured with optional oxygen (O₂) measurement capability, providing a convenient and cost-effective solution for monitoring NOx , CO, and O₂. This capability is particularly valuable in direct extractive CEMS configurations, where oxygen measurements are often required for emissions correction and reporting.&nbsp;Seamless integration with data acquisition and handling systems (DAHS) is another key requirement for a modern CEMS. Analyzer platforms must support reliable data communication and interoperability, enabling consistent reporting and alignment with regulatory requirements.&nbsp;Selecting the appropriate analyzer technology is a critical step in CEMS design. A well-designed analyzer solution not only supports compliance, it also contributes to long-term operational efficiency, reduced lifecycle costs, and confidence in emissions data.</div></div></div></div></div></div></section></div></div></div></div></div></div></section>

News from LabRulezGCMS Library - Week 37, 2026

News from LabRulezLCMS Library - Week 37, 2026

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 7th September 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies, Metrohm and Shimadzu and brochure by Thermo Fisher Scientific!<h3>1. Agilent Technologies: <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP‑QQQ</a> with m‑Lens for Ultratrace Analysis of High‑Purity Reagents</h3>Achieving low backgrounds under hot plasma conditions using ICP-QQQ preset methods&nbsp;<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_m_lens_high_purity_reagents_9500_icp_qqq_5994_9062en_agilent_f0e65c4d9b.pdf">Full PDF for download</a>&nbsp;</li></ul>Controlling trace-metal contaminants is essential in both semiconductor reagent analysis and metal‑based materials characterization. High‑purity chemicals such as nitric acid (HNO3) and sulfuric acid (H2SO4), as well as high‑purity metals, require analytical workflows capable of achieving sub‑ppt detection limits (DLs) while maintaining excellent robustness and reproducibility. To meet these needs, the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 Triple Quadrupole ICP‑MS (ICP‑QQQ)</a> equipped with a Dual‑Cell System (DCS)1 and the optional m‑lens ion optics provides a highly stable platform, enabling low backgrounds and reliable performance under hot plasma conditions.&nbsp;The m‑lens is engineered to suppress background signals for elements including easily ionized elements such as Na and K that typically show elevated background equivalent concentrations (BECs) under hot plasma conditions. The 9500 ICP-QQQ with m‑lens is suitable for the analysis of metal digests and other sample types that demand robust performance and low backgrounds.2However, its benefits also extend to low‑matrix, high‑purity reagents, supporting sub‑ppt impurity measurements of simpler matrices.3&nbsp;Agilent’s ICP‑QQQ portfolio allows users to select instruments based on desired DLs and operational objectives. For laboratories seeking the lowest possible DLs, the Agilent 8900 Semiconductor configuration ICP-QQQ equipped with an s‑lens provides exceptional sensitivity, making it suitable for laboratories operating at the extreme limits of ultratrace quantification. The 9500 ICP-QQQ with m‑lens provides robust, high sensitivity measurements, ideal for routine trace level applications. This model is appropriate for labs that may not require the lowest DLs for every element but still demand high‑quality, reproducible data.&nbsp;In this study, we evaluated the performance of the 9500 ICP‑QQQ using a method designed specifically for low‑matrix, high‑purity reagents. Using preset methods implemented in the instrument software for ultrapure water (UPW) and for H2SO4 —the UPW method is also applicable to diluted HNO3 and H2O2 — we analyzed 1% HNO3 and high purity H2SO4 separately. Sub-ppt DLs and low backgrounds were achieved for target analytes in both matrices. These results confirm that the 9500 ICP‑QQQ with m-lens can be used for ultratrace impurity analysis of semiconductor‑grade reagents, as well as demanding metal‑matrix applications.&nbsp;<h4>Experimental</h4><h5>Instrumentation&nbsp;</h5>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP-QQQ</a> fitted with the optional m-lens and the Agilent I-AS autosampler were fully controlled using Agilent OpenLab ICP-MS software version 1.1. Designed for ultratrace metal analysis, the sample introduction system comprised a MicroFlow PFA nebulizer with I-AS probe (operated in self-aspiration mode), a temperature-controlled quartz spray chamber, and a quartz torch with a 2.5 mm inner diameter (id) injector. A platinum-tipped sampler cone with copper base and a platinum-tipped skimmer cone with nickel base for m-lens were used.&nbsp;The 9500 ICP‑QQQ was operated using five tune modes: no gas, Advanced Helium Mode (AHM), O2 , NH3 , and H2 . For the H2 SO4 samples, additional specialized tunes were prepared for the determination of platinum (Pt) and zinc (Zn) to ensure optimal performance (Table 1). The use of reaction and collision gases enabled effective removal of spectral interferences originating from argon plasma species as well as matrix‑related polyatomic ions. The makeup gas flow rate and the Omega lens voltage parameters were automatically optimized by the preset methods for m-lens, resulting in a stable CeO/Ce ratio that was maintained between approximately 1 and 3%.<h4>Conclusion&nbsp;</h4>This study evaluated the Agilent 9500 ICP‑QQQ with m‑lens for ultratrace analysis of high‑purity reagents using preset methods for 1% HNO3 and 9.8% H2 SO4 . Sub‑ or singlefigure ppt detection limits and low background equivalent concentrations were achieved for all elements, demonstrating that ultratrace measurements can be easily performed under hot‑plasma conditions. The Dual‑Cell System enabled effective removal of matrix‑related interferences, with Advanced Helium Mode providing an effective approach for the measurement of challenging elements such as Zn in H2 SO4 . The results show that the 9500 ICP‑QQQ with intuitive preset methods can deliver sensitive, low-background data, offering an accessible entry point for laboratories that are new to ultratrace analysis.<h3>2. Metrohm: Rapid quality control of fruits and vegetables using NIR spectroscopy</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_nir_141_download_e1bab41aee.pdf">Full PDF for download</a></li></ul>Near-infrared (NIR) spectroscopy has emerged as a powerful, nondestructive analytical technique for quality control in the fruit and vegetable processing industry. This Application Note presents the use of NIR spectroscopy for the rapid monitoring of firmness in apples and °Brix in peaches and crushed tomatoes. These are critical parameters to verify the quality and freshness of various fruits and vegetables. Traditionally measured using destructive methods like penetrometry and refractometry, these fresh produce quality control attributes are critical indicators of ripeness, sweetness, and overall consumer acceptability.<h4>EXPERIMENTAL EQUIPMENT</h4>All samples were tested with a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=220&amp;search=NIR">Metrohm near-infrared (NIR) spectrometer.</a> The measurements were done in reflection mode using either a large sample cup or direct measurement (i.e., no holder). Metrohm software was used for all data acquisition and quantification model development.<h4>CONCLUSION</h4>This Application Note shows that NIR spectroscopy can easily measure firmness in apples, as well as °Brix in peaches and crushed tomatoes. When compared to traditional lab methods (Table 1), NIRS provides a faster, simpler, and nondestructive alternative with excellent accuracy and consistency. All measurements proved to be consistent and fast, helping producers to monitor their fresh fruits and vegetables and deliver high-quality products to consumers.<h3>3. Shimadzu: Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_01122_en_b3b0f25211.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>The TOC solid sample measurement system enables quantitative evaluation of carbon coatings on cathode active material surfaces.</li><li>The AIRsight infrared/Raman microscope enables evaluation of the carbon layer structure.</li><li>Carbon content and structure can be evaluated using a small amount of sample.</li></ul>The cathode active materials used in lithium-ion batteries (LiBs) for electric vehicles (EVs) are broadly classified into two categories depending on their application: nickel-based materials (NCM/NCA/NCMA) and phosphate-based materials (LFP: LiFePO4, LMFP: LiFexMn1-xPO4). Nickel-based materials are characterized by high energy density as well as excellent low-temperature and high-power performance, making them indispensable for longrange driving and high-performance vehicle segments. In contrast, phosphate-based materials offer superior safety, long cycle life, and cost advantages, and their use is expanding primarily in standard-range and mass-market segments.Because LFP and LMFP compounds are intrinsically low in electronic conductivity, a carbon coating on the surface of the active material is essential to compensate for that limitation and improve performance. Accordingly, quantitative control of carbon content is of great importance. For that type of carbon analysis, the TOC solid sample measurement system (Fig. 1), which combines a TOC-L total organic carbon analyzer with an SSM-5000A solid sample combustion unit, is effective.&nbsp;Furthermore, the conductivity of the surface carbon layer is closely related to the degree of graphitization and defect structure of the carbon, making structural evaluation of the carbon layer equally important. The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=AIRsight">AIRsight infrared/Raman microscope</a> (Fig. 2) enablessuch structural evaluation.&nbsp;This Application News presents examples of evaluating carbon on the surface of LMFP cathode active materials, with carbon quantitation using a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=TOC-L">TOC-L </a>+ <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=SSM-5000A">SSM-5000A system</a> and carbon layer structure evaluation using the AIRsight infrared/Raman microscope.<h4>Conclusion&nbsp;</h4>Quantitative analysis of the carbon coating on the LMFP surface was performed using the TOC solid sample measurement system (TOC-L + SSM-5000A), and structural evaluation of the carbon layer was conducted using the AIRsight microscope. In addition, Raman analysis of the LMFP residue after TC analysis was carried out to verify the validity of the carbon quantitation results. The TOC solid sample measurement system (TOC-L + SSM-5000A) is capable of not only TC analysis in solid samples, but also of IC and TOC analysis. Furthermore, by simply changing the software settings, carbon analysis of liquid samples (TOC, TC, and IC) can also be performed using the TOC-L main unit. This system can also be applied to carbon analysis of water-extractable TOC in black mass, lithium extraction solutions, and lithium carbonate, all of which are relevant materialsin lithium-ion battery recycling. The AIRsight is capable of both Raman and infrared measurements. Therefore, in addition to the Raman measurements introduced here, it can be used, with a single microscope system, to evaluate degradation caused by charge and discharge cycles in various battery components, such as negative electrode materials and separators.<h3>4. Thermo Fisher Scientific: <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002">Thermo Scientific GS Omni</a> Light Element Analysis in Slurry Process Streams</h3><ul><li>Brochures and specifications</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/CAD_GS_Omni_Light_Element_Analyzer_bf50abdb7e.pdf">Full PDF for download</a></li></ul>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002">Thermo Scientific™ GS Omni analyzer</a> provides accurate, real-time elemental analysis of multiple slurry streams for both light and heavy elements. Using the Prompt Gamma Neutron Activation Analysis (PGNAA) technology, the GS Omni analyzer has a distinct advantage over analyzers using X-ray fluorescence (XRF) and Laser induced breakdown spectroscopy (LIBS) by being able to directly measure elements lower than calcium on the periodic table and particle sizes up to 5mm.<h4>Benefits&nbsp;</h4>The Thermo Scientific GS (Gamma Slurry) Omni analyzer is the latest development of a proven, robust, analyzer that provides direct simultaneous analysis of multiple elements in slurry beneficiation plants.&nbsp;The analyzer is available in configurations of 2 to 8 streams. The optimum number of streams is usually dependent on the stream concentrations, elements of interest, required cycle analysis time, plant layout and process control considerations. This elemental analyzer will enable improvements in product quality, recovery and lower production costs.&nbsp;<h4>Applications&nbsp;</h4>The Thermo Scientific GS Omni analyzer is a powerful measurement tool in the following applications:&nbsp;<ul><li>Slurry beneficiation / Light element analysis&nbsp;</li><li>Product quality / Penalty costs&nbsp;</li><li>Tailings management&nbsp;</li></ul>Slurries include:&nbsp;<ul><li>Iron ore&nbsp;</li><li>Sulphur&nbsp;</li><li>Phosphates&nbsp;</li><li>Copper&nbsp;</li><li>Calcium carbonate&nbsp;</li><li>Magnesium&nbsp;</li><li>Industrial Minerals</li></ul>

News from LabRulezICPMS Library - Week 37, 2026

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Thermo Scientific Element GD Plus GD-MS

For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.

Redefine the analysis of advanced high purity materials directly in solid state with the Thermo Scientific™ Element GD Plus™ GD-MS. For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.The Element GD Plus GD-MS enables analysis of nearly all elements in the periodic table from both conductive and non-conductive materials with the same level of sensitivity and data quality. Analysis of low melting point metals such as gallium are made easy with a dedicated workflow for sample preparation and analysis. This makes GD-MS the reliable standard for any metal analysis.Almost all elements present in a solid sample can be detected and quantified routinely: many down to the parts per billion (ppb) level.<h3>High productivity and low cost of analysis</h3>The Element GD Plus GD-MS is designed to deliver outstanding sensitivity and accuracy at a high sample throughput, dramatically lowering the cost of your analysis.<ul><li>Fast-flow ion source</li><li>User-friendly source design: &lt; 1 min sample exchange</li><li>Short pumping times: &lt; 10 min sample turnaround</li><li>High sample throughput: up to 5 samples/hr</li><li>Less sample preparation: no requirement for acid cleaning of high-purity samples</li><li>Faster sample analysis: no requirement to measure calibration standards</li></ul><h3>Routine operation</h3>The Element GD Plus GD-MS is designed with routine operation and high throughput at its core.<ul><li>Linear dynamic range spanning more than 12 orders of magnitude allows the simultaneous analysis of matrix elements (%), traces (ppm), and ultra-traces (ppb)</li><li>Automatic cross-calibration between different detection modes ensures robust results</li><li>Sample vacuum chamber: eliminates risk of leakage between the sample and the GD cell</li><li>Determine elemental concentrations rapidly within a single scan without calibration standards (using standard RSF approach)</li><li>Best precision within a short analysis time</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_2_f0a37ee3f3.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Ion Beam Ratio RSD for 10 min measurements of elements at 1000 ppm, 100 ppm and 1 ppm. Data shown for 18 different instruments." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_2_f0a37ee3f3.jpg 152w," sizes="100vw" width="906" height="931"><h3>Outstanding limits of detection</h3>The Element GD Plus GD-MS delivers high throughput without compromise. With the highest signal-to-noise ratio and lowest limits of detection, the Element GD Plus GD-MS is the workhorse for ultra-high purity elemental analysis.<ul><li>Unique ion source designed for high ion transmission, maximizing the signal analyzed.</li><li>Guaranteed signal-to-noise ratio produces the sub-ppb limits of detection</li><li>Optional CNO option achieves sub-ppm level limits of detection for CNO with no compromise to the through-put of your analysis</li><li>Factor 10 reduction of polyatomic interferences compared to static GD sources</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_3_a73bdae066.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Typical mass spectrum of 42Ca and 45Sc during the analysis of high purity Ti. (Left) ASTM F1710-08 method using static source. (Right) Fast-flow method using the Element GD Plus GD-MS. Overlapping isobaric interference from 48Ti36Ar2+ and 50Ti40Ar2+ is suppressed by the fast flow source." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_3_a73bdae066.jpg 166w," sizes="100vw" width="921" height="867"><h3>Trust in results by high mass resolution</h3>The simplicity of high-resolution ICP-MS allows the most advanced performance, without compromising on straightforward and reliable method development.<ul><li>Interference-free measurements for indisputable analytical results</li><li>Any combination of resolution settings can be performed within a single analysis</li><li>Fixed-slit design guarantees maximum stability and reproducibility</li><li>Minimum contribution of high matrix signals on neighboring analyte peaks due to filter lens</li></ul><h3>Depth profiling with nanometer resolution</h3>Depth profiling is an important tool for elemental analysis of coatings and the assessment of element diffusion across layers.<ul><li>Depth resolution from nanometers to hundreds of micrometers</li><li>Determining concentrations of all elements from sub-ppm to 100% without the need for calibration</li><li>Flexible anode diameter for advanced depth profiling a</li><li>Sputter rates can be adjusted for bulk analysis or depth profiling</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_289a3c7919.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Typical crater shape of a depth profile on a copper sample." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_289a3c7919.jpg 245w," sizes="100vw" width="1191" height="388"><h3>Recommended for</h3><ul><li>Aerospace: nickel superalloys, composite materials, depth profiling of coatings and diffusion layers</li><li>Microelectronics: copper, alumina powder, sputter targets</li><li>Renewable energy: silicon blocks, wafers, solar cells</li><li>Medical/pharmaceutical/food: stainless steel, alloys</li></ul><h3>Specifications</h3><ul><li>Type: GS Mass Spectrometer</li><li>Dynamic Range: &gt;10¹² Linear with Automatic Cross Calibration</li><li>Mass Resolution: 3 Fixed Resolutions: ≥300, ≥ 4,000, ≥ 10,000</li><li>Mass Stability: 25 ppm/8 hour</li><li>Power: 3-Phase, 230/400 V ± 10%, 50/60 Hz Fused 32 A / Phase</li><li>Sensitivity: &gt;1 x 10¹⁰ Cps (1.6 x 10⁻⁹ A) for Copper Peak (Peak Height, Total Ion Current) in Medium Resolution</li><li>Unit Size: Each</li></ul>

Products from category GD-MS focused on Elemental Analysis - page 1

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