APWC: Application of single particle ICP-MS for silver nanoparticles characterization

Evaluating the dispersion of TiO2 nanoparticles via sp-ICP-MS for sunscreen powder analysis Chia-Chin (Donna) Hsu1*, Chun-Hua Chen2, Meng-Tzu Lai2, Yen-Ying (Brian) Laio1, Ching-Heng (Jones) Hsu3, ChiuHun Su2* 2017 APWC 1. Agilent Technologies Co. Ltd C-04 2. Industrial Technology Research Institute…

Application Note Semiconductor Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS Accurate detection of insoluble SiO2 NPs in high purity acids and solvents by Agilent 8900 ICP-QQQ Authors Introduction Donna Hsu, Brian Liao, Katsuo Mizobuchi, Michiko…

Application Note Semiconductor Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode Determination of 25 and 30 nm Fe3O4 NPs in low-particle concentration solutions Author Donna Hsu, Yoshinori Shimamura, Brian Liao, and Michiko Yamanaka1 Chun-Hua Chen…

Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…