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Materials Testing
Semiconductor Analysis
(1)
Materials Testing
Instrumentation
HPLC
(1)
Ion chromatography
(2)
UV–VIS spectrophotometry
(6)
Manufacturer
Shimadzu
(7)
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Agilent Technologies
(25)
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(1)
Shimadzu
Shimadzu
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Applications
(4)
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Applications from the field of Materials Testing from Shimadzu - page 1
Open paper Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF
Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper CASE and Weight Reduction Development of Automobile
CASE and Weight Reduction Development of Automobile
Thermal Analysis, X-ray, UV–VIS spectrophotometry, NIR Spectroscopy, Microscopy, FTIR Spectroscopy, GC/SQ, Thermal desorption, GC, HPLC, GC/MSD, Mechanical testing
Instrumentation
Thermal Analysis, X-ray, UV–VIS spectrophotometry, NIR Spectroscopy, Microscopy, FTIR Spectroscopy, GC/SQ, Thermal desorption, GC, HPLC, GC/MSD, Mechanical testing
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Guide to Lithium-ion Battery Solutions
Guide to Lithium-ion Battery Solutions
Mechanical testing, Ion chromatography, NIR Spectroscopy, GC, GC/MSD, GC/SQ
Instrumentation
Mechanical testing, Ion chromatography, NIR Spectroscopy, GC, GC/MSD, GC/SQ
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Instruments for Analyzing / Evaluating Electronic Device
Instruments for Analyzing / Evaluating Electronic Device
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis
Open paper LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials
LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
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