Applications from the field of Semiconductor Analysis - page 4
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper CHIRAL PURIFICATION OF IRIDIUM (III) COMPLEXES BY SFC
CHIRAL PURIFICATION OF IRIDIUM (III) COMPLEXES BY SFC
HPLC, SFC
Instrumentation
HPLC, SFC
Manufacturer
Waters
Industries
Materials Testing, Semiconductor Analysis
Open paper Workflow for Migrating OLED Impurity Profiling from R&D to QC Setting with Solvent Compatible Mass Detector System
Workflow for Migrating OLED Impurity Profiling from R&D to QC Setting with Solvent Compatible Mass Detector System
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ
Instrumentation
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ
Manufacturer
Waters
Industries
Materials Testing, Semiconductor Analysis
Open paper Determination of silicate in high-purity water using ion chromatography and online sample preparation
Determination of silicate in high-purity water using ion chromatography and online sample preparation
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Determination of halogens in polymers and electronics using a combustion ion chromatography system
Determination of halogens in polymers and electronics using a combustion ion chromatography system
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Determination of trace anions in hydrofluoric acid, ammonium fluoride, and a buffered oxide etchant
Determination of trace anions in hydrofluoric acid, ammonium fluoride, and a buffered oxide etchant
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Determination of trace anions in concentrated glycolic acid
Determination of trace anions in concentrated glycolic acid
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Monitoring for trace anion contamination in the extracts of electronic components
Monitoring for trace anion contamination in the extracts of electronic components
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
Open paper Determination of transition metals at ppt levels in high-purity water and SC2 (D-clean) baths
Determination of transition metals at ppt levels in high-purity water and SC2 (D-clean) baths
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Determination of trace anions in high-nitrate matrices by ion chromatography
Determination of trace anions in high-nitrate matrices by ion chromatography
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
