<p><strong>In the week from September 7, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>6 000 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><h5><strong>1. Thermo Fisher Scientific: Spatial Proteomics for Translational Research</strong></h5><ul><li>Tu, 8.9.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6456">Registration</a></li></ul><p>Learn how Thermo Fisher's EVOS S1000 system and Aluora kits reduce sample costs for tumor imaging and support spatial proteomics workflows in translational research.</p><h5><strong>2. SelectScience: Managing 4D-STEM data with smarter acquisition</strong></h5><ul><li>Tu, 8.9.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6427">Registration</a></li></ul><p>Tackle the 4D-STEM data burden and explore smarter acquisition strategies designed to improve efficiency and manage increasingly complex microscopy datasets.</p><h5><strong>3. Milestone: Mastering Geological Sample Preparation: Strategies for Complete Digestion and Low Blanks</strong></h5><ul><li>We, 9.9.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6483">Registration</a></li></ul><p>Learn how SRC microwave digestion supports complete dissolution of rocks, sediments, and mineral ores while reducing blanks and improving reliability in elemental and isotopic analysis.</p><h5><strong>4. New Food magazine: Measuring what matters: water quality analysis with UV-Visible spectrophotometry</strong></h5><ul><li>We, 9.9.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6392">Registration</a></li></ul><p>Explore how UV-Visible spectrophotometry supports reliable water quality analysis across a range of laboratory and environmental applications.</p><h5><strong>5. C&amp;EN: Expanding NMR Possibilities with HFX Cryogenic Probes</strong></h5><ul><li>We, 9.9.2026 17:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6463">Registration</a></li></ul><p>Discover how JEOL SuperCOOL MARVEL HFX Duo cryogenic probe technology combines high sensitivity with HFX triple resonance to expand fluorine NMR analysis.</p><h5><strong>6. Anton Paar: Correlating Mechanical and Chemical Properties: Introduction to Rheo-Raman for Polymers</strong></h5><ul><li>We, 9.9.2026 18:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6378">Registration</a></li></ul><p>Discover how combining rheology with Raman spectroscopy enables real-time insights into polymerization, crystallization, thermal stability, and polymer structure–property relationships.</p><h5><strong>7. Agilent Technologies: Overcoming Key Challenges in Microplastics Analysis</strong></h5><ul><li>Th, 10.9.2026 07:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6469">Registration</a></li></ul><p>Learn how LDIR chemical imaging simplifies microplastics analysis through automated polymer identification, sizing, and characterization.</p><h5><strong>8. SciY/Mestrelab Research: Advancing Lean Chemometrics: Iterative Optimization Technology as a Process Analytical Technology Tool for Reducing Calibration Burden</strong></h5><ul><li>Th, 10.9.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6428">Registration</a></li></ul><p>Discover how Iterative Optimization Technology and lean chemometrics can accelerate PAT deployment while reducing calibration burden in analytical workflows.</p><h5><strong>9. Agilent Technologies: IR Microscopy to Streamline Your Microplastics Analysis</strong></h5><ul><li>Th, 10.9.2026 20:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6440">Registration</a></li></ul><p>Learn how the Agilent 8700 LDIR simplifies microplastics analysis with automated laser-based IR imaging that reduces analysis time for environmental laboratories.</p><h5><strong>10. SelectScience: TechTalk: Benefits of high-resolution ICP-OES for challenging applications</strong></h5><ul><li>Fr, 11.9.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6470">Registration</a></li></ul><p>Learn how high-resolution ICP-OES from Analytik Jena can improve spectral resolution and trace-element detection for demanding analytical applications.</p>

Webinars LabRulezICPMS Week 37/2026

Size distribution and elemental analysis of fine particles from Li-ion battery cell fire

<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 7th September 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you application notes by <strong>Agilent Technologies, Metrohm </strong>and<strong> Shimadzu </strong>and brochure by<strong> Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: </strong><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 ICP‑QQQ</strong></a><strong> with m‑Lens for Ultratrace Analysis of High‑Purity Reagents</strong></h3><p><strong>Achieving low backgrounds under hot plasma conditions using ICP-QQQ preset methods&nbsp;</strong></p><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_m_lens_high_purity_reagents_9500_icp_qqq_5994_9062en_agilent_f0e65c4d9b.pdf"><strong>Full PDF for download</strong></a><strong>&nbsp;</strong></li></ul><p>Controlling trace-metal contaminants is essential in both semiconductor reagent analysis and metal‑based materials characterization. High‑purity chemicals such as nitric acid (HNO<sub>3</sub>) and sulfuric acid (H<sub>2</sub>SO<sub>4</sub>), as well as high‑purity metals, require analytical workflows capable of achieving sub‑ppt detection limits (DLs) while maintaining excellent robustness and reproducibility. To meet these needs, the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 Triple Quadrupole ICP‑MS (ICP‑QQQ)</strong></a><strong> </strong>equipped with a Dual‑Cell System (DCS)<sup>1</sup> and the optional m‑lens ion optics provides a highly stable platform, enabling low backgrounds and reliable performance under hot plasma conditions.&nbsp;</p><p>The m‑lens is engineered to suppress background signals for elements including easily ionized elements such as Na and K that typically show elevated background equivalent concentrations (BECs) under hot plasma conditions. The 9500 ICP-QQQ with m‑lens is suitable for the analysis of metal digests and other sample types that demand robust performance and low backgrounds.<sup>2</sup></p><p>However, its benefits also extend to low‑matrix, high‑purity reagents, supporting sub‑ppt impurity measurements of simpler matrices.<sup>3&nbsp;</sup></p><p>Agilent’s ICP‑QQQ portfolio allows users to select instruments based on desired DLs and operational objectives. For laboratories seeking the lowest possible DLs, the Agilent 8900 Semiconductor configuration ICP-QQQ equipped with an s‑lens provides exceptional sensitivity, making it suitable for laboratories operating at the extreme limits of ultratrace quantification. The 9500 ICP-QQQ with m‑lens provides robust, high sensitivity measurements, ideal for routine trace level applications. This model is appropriate for labs that may not require the lowest DLs for every element but still demand high‑quality, reproducible data.&nbsp;</p><p>In this study, we evaluated the performance of the 9500 ICP‑QQQ using a method designed specifically for low‑matrix, high‑purity reagents. Using preset methods implemented in the instrument software for ultrapure water (UPW) and for H<sub>2</sub>SO<sub>4</sub> —the UPW method is also applicable to diluted HNO<sub>3</sub> and H<sub>2</sub>O<sub>2</sub> — we analyzed 1% HNO<sub>3</sub> and high purity H<sub>2</sub>SO<sub>4</sub> separately. Sub-ppt DLs and low backgrounds were achieved for target analytes in both matrices. These results confirm that the 9500 ICP‑QQQ with m-lens can be used for ultratrace impurity analysis of semiconductor‑grade reagents, as well as demanding metal‑matrix applications.&nbsp;</p><h4><strong>Experimental</strong></h4><h5><strong>Instrumentation&nbsp;</strong></h5><p>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 ICP-QQQ</strong></a> fitted with the optional m-lens and the Agilent I-AS autosampler were fully controlled using Agilent OpenLab ICP-MS software version 1.1. Designed for ultratrace metal analysis, the sample introduction system comprised a MicroFlow PFA nebulizer with I-AS probe (operated in self-aspiration mode), a temperature-controlled quartz spray chamber, and a quartz torch with a 2.5 mm inner diameter (id) injector. A platinum-tipped sampler cone with copper base and a platinum-tipped skimmer cone with nickel base for m-lens were used.&nbsp;</p><p>The 9500 ICP‑QQQ was operated using five tune modes: no gas, Advanced Helium Mode (AHM), O2 , NH3 , and H2 . For the H2 SO4 samples, additional specialized tunes were prepared for the determination of platinum (Pt) and zinc (Zn) to ensure optimal performance (Table 1). The use of reaction and collision gases enabled effective removal of spectral interferences originating from argon plasma species as well as matrix‑related polyatomic ions. The makeup gas flow rate and the Omega lens voltage parameters were automatically optimized by the preset methods for m-lens, resulting in a stable CeO/Ce ratio that was maintained between approximately 1 and 3%.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>This study evaluated the Agilent 9500 ICP‑QQQ with m‑lens for ultratrace analysis of high‑purity reagents using preset methods for 1% HNO3 and 9.8% H2 SO4 . Sub‑ or singlefigure ppt detection limits and low background equivalent concentrations were achieved for all elements, demonstrating that ultratrace measurements can be easily performed under hot‑plasma conditions. The Dual‑Cell System enabled effective removal of matrix‑related interferences, with Advanced Helium Mode providing an effective approach for the measurement of challenging elements such as Zn in H2 SO4 . The results show that the 9500 ICP‑QQQ with intuitive preset methods can deliver sensitive, low-background data, offering an accessible entry point for laboratories that are new to ultratrace analysis.</p><h3><strong>2. Metrohm: Rapid quality control of fruits and vegetables using NIR spectroscopy</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_nir_141_download_e1bab41aee.pdf"><strong>Full PDF for download</strong></a></li></ul><p>Near-infrared (NIR) spectroscopy has emerged as a powerful, nondestructive analytical technique for quality control in the fruit and vegetable processing industry. This Application Note presents the use of NIR spectroscopy for the rapid monitoring of firmness in apples and °Brix in peaches and crushed tomatoes. These are critical parameters to verify the quality and freshness of various fruits and vegetables. Traditionally measured using destructive methods like penetrometry and refractometry, these fresh produce quality control attributes are critical indicators of ripeness, sweetness, and overall consumer acceptability.</p><h4><strong>EXPERIMENTAL EQUIPMENT</strong></h4><p>All samples were tested with a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=220&amp;search=NIR"><strong>Metrohm near-infrared (NIR) spectrometer.</strong></a> The measurements were done in reflection mode using either a large sample cup or direct measurement (i.e., no holder). Metrohm software was used for all data acquisition and quantification model development.</p><h4><strong>CONCLUSION</strong></h4><p>This Application Note shows that NIR spectroscopy can easily measure firmness in apples, as well as °Brix in peaches and crushed tomatoes. When compared to traditional lab methods (Table 1), NIRS provides a faster, simpler, and nondestructive alternative with excellent accuracy and consistency. All measurements proved to be consistent and fast, helping producers to monitor their fresh fruits and vegetables and deliver high-quality products to consumers.</p><h3><strong>3. Shimadzu: Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_01122_en_b3b0f25211.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User benefits</strong></h5><ul><li>The TOC solid sample measurement system enables quantitative evaluation of carbon coatings on cathode active material surfaces.</li><li>The AIRsight infrared/Raman microscope enables evaluation of the carbon layer structure.</li><li>Carbon content and structure can be evaluated using a small amount of sample.</li></ul><p>The cathode active materials used in lithium-ion batteries (LiBs) for electric vehicles (EVs) are broadly classified into two categories depending on their application: nickel-based materials (NCM/NCA/NCMA) and phosphate-based materials (LFP: LiFePO4, LMFP: LiFexMn1-xPO4). Nickel-based materials are characterized by high energy density as well as excellent low-temperature and high-power performance, making them indispensable for longrange driving and high-performance vehicle segments. In contrast, phosphate-based materials offer superior safety, long cycle life, and cost advantages, and their use is expanding primarily in standard-range and mass-market segments.</p><p>Because LFP and LMFP compounds are intrinsically low in electronic conductivity, a carbon coating on the surface of the active material is essential to compensate for that limitation and improve performance. Accordingly, quantitative control of carbon content is of great importance. For that type of carbon analysis, the TOC solid sample measurement system (Fig. 1), which combines a TOC-L total organic carbon analyzer with an SSM-5000A solid sample combustion unit, is effective.&nbsp;</p><p>Furthermore, the conductivity of the surface carbon layer is closely related to the degree of graphitization and defect structure of the carbon, making structural evaluation of the carbon layer equally important. The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=AIRsight"><strong>AIRsight infrared/Raman microscope</strong></a> (Fig. 2) enablessuch structural evaluation.&nbsp;</p><p>This Application News presents examples of evaluating carbon on the surface of LMFP cathode active materials, with carbon quantitation using a <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=TOC-L"><strong>TOC-L </strong></a><strong>+ </strong><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=SSM-5000A"><strong>SSM-5000A system</strong></a> and carbon layer structure evaluation using the AIRsight infrared/Raman microscope.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>Quantitative analysis of the carbon coating on the LMFP surface was performed using the TOC solid sample measurement system (TOC-L + SSM-5000A), and structural evaluation of the carbon layer was conducted using the AIRsight microscope. In addition, Raman analysis of the LMFP residue after TC analysis was carried out to verify the validity of the carbon quantitation results. The TOC solid sample measurement system (TOC-L + SSM-5000A) is capable of not only TC analysis in solid samples, but also of IC and TOC analysis. Furthermore, by simply changing the software settings, carbon analysis of liquid samples (TOC, TC, and IC) can also be performed using the TOC-L main unit. This system can also be applied to carbon analysis of water-extractable TOC in black mass, lithium extraction solutions, and lithium carbonate, all of which are relevant materialsin lithium-ion battery recycling. The AIRsight is capable of both Raman and infrared measurements. Therefore, in addition to the Raman measurements introduced here, it can be used, with a single microscope system, to evaluate degradation caused by charge and discharge cycles in various battery components, such as negative electrode materials and separators.</p><h3><strong>4. Thermo Fisher Scientific: </strong><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002"><strong>Thermo Scientific GS Omni</strong></a><strong> Light Element Analysis in Slurry Process Streams</strong></h3><ul><li>Brochures and specifications</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/CAD_GS_Omni_Light_Element_Analyzer_bf50abdb7e.pdf"><strong>Full PDF for download</strong></a></li></ul><p>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2002"><strong>Thermo Scientific™ GS Omni analyzer</strong></a> provides accurate, real-time elemental analysis of multiple slurry streams for both light and heavy elements. Using the Prompt Gamma Neutron Activation Analysis (PGNAA) technology, the GS Omni analyzer has a distinct advantage over analyzers using X-ray fluorescence (XRF) and Laser induced breakdown spectroscopy (LIBS) by being able to directly measure elements lower than calcium on the periodic table and particle sizes up to 5mm.</p><h4><strong>Benefits&nbsp;</strong></h4><p>The Thermo Scientific GS (Gamma Slurry) Omni analyzer is the latest development of a proven, robust, analyzer that provides direct simultaneous analysis of multiple elements in slurry beneficiation plants.&nbsp;</p><p>The analyzer is available in configurations of 2 to 8 streams. The optimum number of streams is usually dependent on the stream concentrations, elements of interest, required cycle analysis time, plant layout and process control considerations. This elemental analyzer will enable improvements in product quality, recovery and lower production costs.&nbsp;</p><h4><strong>Applications&nbsp;</strong></h4><p>The Thermo Scientific GS Omni analyzer is a powerful measurement tool in the following applications:&nbsp;</p><ul><li>Slurry beneficiation / Light element analysis&nbsp;</li><li>Product quality / Penalty costs&nbsp;</li><li>Tailings management&nbsp;</li></ul><p>Slurries include:&nbsp;</p><ul><li>Iron ore&nbsp;</li><li>Sulphur&nbsp;</li><li>Phosphates&nbsp;</li><li>Copper&nbsp;</li><li>Calcium carbonate&nbsp;</li><li>Magnesium&nbsp;</li><li>Industrial Minerals</li></ul>

News from LabRulezICPMS Library - Week 37, 2026

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News from LabRulezICPMS Library - Week 37, 2026

Size distribution and elemental analysis of fine particles from Li-ion battery cell fire

Webinars LabRulezICPMS Week 37/2026