Tip and Tricks – How to Best Use the Handheld Raman Vaya

Tip and Tricks – How to Best Use the Handheld Raman Vaya

Join us for the second session on Vaya Method Development Tips and Tricks!
Tip and Tricks – How to Best Use the Handheld Raman Vaya
WAX Column Technology for Today’s Lab: Updates That Matter

WAX Column Technology for Today’s Lab: Updates That Matter

Explore the latest breakthroughs in GC WAX column technology. Learn how Agilent’s DB-WAX UI, DB-FATWAX UI, and DB-HeavyWAX deliver improved inertness, robustness, and low bleed for modern GC/MS needs.
WAX Column Technology for Today’s Lab: Updates That Matter
Specialty GC Detectors - PDHID and SCD

Specialty GC Detectors - PDHID and SCD

Discover the advantages of specialty GC detectors PDHID and SCD in this webinar, covering sensitivity, selectivity, and applications in trace gas analysis.
Specialty GC Detectors - PDHID and SCD
Achieving Net-Zero: Precision Monitoring in CCUS and Downstream Chemicals

Achieving Net-Zero: Precision Monitoring in CCUS and Downstream Chemicals

Explore how FTIR and mass spectrometry provide real-time monitoring of CO₂ purity and impurities in CCUS pipelines, supporting safety, compliance, and efficient e-fuel production from captured carbon.
Achieving Net-Zero: Precision Monitoring in CCUS and Downstream Chemicals
Polymer Upcycling via Reactive Extrusion: FTIR Microscopy Insights into Blend Compatibilization

Polymer Upcycling via Reactive Extrusion: FTIR Microscopy Insights into Blend Compatibilization

Discover how reactive extrusion and FTIR microscopy enable sustainable upcycling of reprocessed polypropylene. Learn to optimize extrusion parameters and enhance polymer blend performance.
Polymer Upcycling via Reactive Extrusion: FTIR Microscopy Insights into Blend Compatibilization
Every Wafer Counts: How ppt-Level Gas Analysis Safeguards Semiconductor Production

Every Wafer Counts: How ppt-Level Gas Analysis Safeguards Semiconductor Production

Safeguarding semiconductor production demands ppt-level gas purity. Learn how APIX δQ and Quattro mass spectrometers deliver ultra-fast, ultra-sensitive UHP gas analysis to protect every wafer.
Every Wafer Counts: How ppt-Level Gas Analysis Safeguards Semiconductor Production
(Young Scholars Workshop) Metric Tools for the Evaluation of Chromatographic Methods

(Young Scholars Workshop) Metric Tools for the Evaluation of Chromatographic Methods

Explore modern metric tools for evaluating chromatographic methods—greenness, applicability, performance, and innovation—at the 5th Separations Webinar Young Scholars Workshop.
(Young Scholars Workshop) Metric Tools for the Evaluation of Chromatographic Methods
Inline Raman: Avoid the Million-Dollar Product Mix-Up

Inline Raman: Avoid the Million-Dollar Product Mix-Up

Learn how inline Raman spectroscopy eliminates costly product mix-ups by enabling rapid, on-stream material identification. Experts from HF Sinclair and Metrohm USA share real-world strategies and ROI insights.
Inline Raman: Avoid the Million-Dollar Product Mix-Up
Plastic Circularity: Pyrolysis and Workflow Solutions

Plastic Circularity: Pyrolysis and Workflow Solutions

Learn how Agilent GC solutions support plastic waste pyrolysis by characterizing oils, quantifying hydrocarbons, and detecting contaminants for reuse.
Plastic Circularity: Pyrolysis and Workflow Solutions
Sample Capture, Transport and Introduction

Sample Capture, Transport and Introduction

Explore best practices for sample capture, transport, and introduction to ensure accuracy, integrity, and reliability in analytical workflows and laboratory applications.
Sample Capture, Transport and Introduction