Combining elemental analysis and molecular techniques to characterize Ancient Egyptian mummification balms

<p><strong>Microplastics have emerged as one of the most widely discussed environmental contaminants of our time. Regardless of where we live, daily exposure to microplastics has become virtually unavoidable—these tiny plastic particles are present in the air we breathe, the water we drink, and the environments we inhabit. As researchers work to better understand the sources, transport pathways, and impacts of microplastics, the demand for reliable microplastic analysis methods continues to grow.</strong></p><p>While techniques such as FTIR and Raman spectroscopy have become standard tools for identifying microplastics, their utility is limited for smaller particles (i.e. nanoplastics) and in complex matrices. More advanced microplastic analysis methods can provide a deeper understanding of what these particles contain and how they may change over time in the environment.</p><div><h3><strong>The Limits of Spectroscopic Microplastic Analysis Methods</strong></h3><p><strong>Fourier-Transform Infrared</strong> (<strong>FTIR</strong>) and <strong>Raman spectroscopy </strong>are widely used microplastic analysis methods because they can<strong> identify polymer types</strong> by measuring how electromagnetic radiation interacts with a material. These techniques are valuable for determining whether a particle is polyethylene, polypropylene, polystyrene, or another common plastic. For many studies, this information is sufficient to confirm the presence of microplastics, especially in clean samples with sufficient microplastic density.</p><p>However, <a target="_blank" rel="noopener noreferrer" href="https://www.leco.com/application/environmental/"><strong>environmental samples</strong></a> are rarely clean and compositionally simple. Microplastic particles can become weathered and obscured by other materials in the environment, making their accurate identification with spectroscopy difficult. Additionally, if researchers want to understand what additives, degradation products, or pollutants are associated with the plastic, particle identification alone is not enough. Thus, FTIR and Raman spectroscopy methods alone struggle to thoroughly characterize these complex chemical components, particularly in challenging environmental matrices. As questions surrounding microplastic exposure become increasingly important, researchers require analytical techniques capable of examining the chemistry of a sample in greater detail, not simply confirming the presence of the physical particle itself.</p></div><div><h3><strong>Thermal Desorption and Pyrolysis GCxGC-TOFMS For Deeper Microplastic Analysis</strong></h3><p><strong>Thermal Desorption</strong> (<strong>TD</strong>) and <strong>Pyrolysis </strong>(<strong>Py</strong>) coupled with comprehensive two-dimensional gas chromatography and time-of-flight mass spectrometry (<a target="_blank" rel="noopener noreferrer" href="https://www.leco.com/core-analysis/gc-and-gc-ms/"><strong>GCxGC-TOFMS</strong></a>) offer a powerful alternative for investigating nano- and microplastics in complex samples. These techniques provide complementary information about sample composition.&nbsp;</p><p><strong>Thermal desorption</strong> releases volatile and adsorbed compounds, including environmental contaminants, degradation products, and VOCs associated with microplastic particles. This can reveal important information about chemicals present within or on the plastic.</p><p><strong>Pyrolysis </strong>thermally deconstructs the polymeric material, breaking it into GC-amenable characteristic degradation compounds. These compounds act as chemical markers that can be used to identify the various polymers present. When analyzing complex or heavily weathered microplastics that may be difficult to characterize using traditional spectroscopic techniques, pyrolysis is particularly advantageous.</p><p>The most significant benefit comes from pairing these techniques with comprehensive <strong>two-dimensional gas chromatography</strong>. Environmental samples often contain hundreds or even thousands of compounds that coelute in 1D GC-MS, making it difficult or impossible to identify each compound. GCxGC provides significantly greater separation capability, helping analysts distinguish important polymer markers from background matrix components. This enhanced separation improves the mass spectrometer’s ability to identify characteristic polymer pyrolysis products, even in highly complex environmental samples. As a result, researchers can detect and identify challenging microplastics without the extensive purification steps often required by other analytical workflows.</p><p>Another unique advantage of this approach is that thermal desorption and pyrolysis can be used in series on the same sample. Together, they create a more complete chemical profile of the sample.</p></div><div><h3><strong>A Powerful Microplastics Analysis Workflow for Deeper Insight into the Effects on Our Environment</strong></h3><p>FTIR and Raman spectroscopy remain valuable tools for rapid screening and flagging samples containing microplastic particles. However, by<strong> combining thermal desorption, pyrolysis, and GCxGC-TOFMS</strong>, analysts can obtain a <strong>much more comprehensive view of plastic</strong>s in their samples and their environmental implications. As environmental research continues to advance and concerns surrounding microplastic contamination grow, researchers will increasingly require information that extends beyond answering the question,&nbsp;<i>“What plastic is present?”&nbsp;</i>&nbsp;</p><p>Ultimately, this deeper level of characterization can provide new insights into the environmental fate of microplastics and help scientists better understand their potential impacts on ecosystems and human exposure.</p></div>

Surpassing the Limits of Traditional Microplastic Analysis Methods with Thermal Desorption and Pyrolysis GCxGC-TOFMS

News from LabRulezGCMS Library - Week 39, 2026

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Application

Environment

Scientific article

Science and research

Poster

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

In 1936, the Laboratory Equipment Company introduced the first rapid carbon determinator for the American iron and steel industry.  Today, almost 80 years later, LECO is recognized globally as a leader in the development of high-quality analytical instrumentation, mass spectrometers, comprehensive two-dimensional chromatography, metallography & optical equipment as well as consumables.

LECO

Agilent Technologies

Bruker

Thermo Fisher Scientific

<p><strong>Struggling with those pesky software roadblocks that break your workflow? Join our technical show-and-tell software series where we tackle the most frequently asked (and frustrating) software questions. From retention time locking, PCDLs, AMDIS libraries, retention indices, and deconvolution, our experts will decode the chaos with insights and examples. Whether you’re feeling like a pro or just trying to keep your system running, questions always arise. This event is your chance to get real answers.</strong></p><p><strong>What you will learn:</strong></p><ul><li>When to use retention time locking</li><li>How to set up retention time locking&nbsp;</li></ul><blockquote><p><strong>Presenter:&nbsp;</strong>Erinn O'Neill (GC/MS Applications Scientist, Agilent)</p><p>Erinn O’Neill is a GC/MS presales application scientist for Agilent in Wilmington, Delaware. She graduated from the University of North Carolina at Chapel Hill with a PhD in chemistry in 2019, where she focused on identifying novel chemical structures synthesized by plant-pathogenic bacteria. Before that, she obtained a Bachelor’s degree in chemistry from Drew University in New Jersey, where she studied reactions between atmospheric aerosol surrogates and trace pollutants.</p></blockquote>

Agilent Technologies: Ctrl+Alt+Del Your Software Struggles - Technical Show-and-Tell Sessions

Understand Retention Time Locking

Join this webinar and learn when to use retention time locking and how to set up retention time locking.

<p><strong>Struggling with those pesky software roadblocks that break your workflow? Join our technical show-and-tell software series where we tackle the most frequently asked (and frustrating) software questions. From retention time locking, PCDLs, AMDIS libraries, retention indices, and deconvolution, our experts will decode the chaos with insights and examples. Whether you’re feeling like a pro or just trying to keep your system running, questions always arise. This event is your chance to get real answers.</strong></p><p><strong>What you will learn:</strong></p><ul><li>The process of stepping through Optimizer software to build MRM's</li><li>How to optimize collision energies for your system when you have an existing MRM method &nbsp;&nbsp;</li></ul><blockquote><p><strong>Presenter:&nbsp;</strong>Erinn O'Neill (GC/MS Applications Scientist, Agilent)</p><p>Erinn O’Neill is a GC/MS presales application scientist for Agilent in Wilmington, Delaware. She graduated from the University of North Carolina at Chapel Hill with a PhD in chemistry in 2019, where she focused on identifying novel chemical structures synthesized by plant-pathogenic bacteria. Before that, she obtained a Bachelor’s degree in chemistry from Drew University in New Jersey, where she studied reactions between atmospheric aerosol surrogates and trace pollutants.</p></blockquote>

Use Optimizer to Build MRM Transitions and Fine Tune Your QQQ Method

Join this webinar and learn the process of stepping through Optimizer software to build MRM's.

Use Optimizer to Build MRM Transitions and Tune QQQ Method

<p><strong>The interest in complete microplastics solutions is tremendous, but many analytical labs shun the initial investment in time, money and labor to establish a well-running standard procedure.</strong></p><p><strong>In this webinar, our microplastic application specialist Dr. Marten Seeba will show you:</strong></p><ul><li>Demands and requirements to establish a microplastic lab based on FT-IR technology</li><li>Necessary steps in sample preparation from various sources</li><li>Theoretical basics to understand the idea behind FT-IR analysis of microparticles</li><li>That there are wholesome, complete solutions to microplastic analysis, right out of the box</li></ul><div><div><div><div><div><p><strong>You will learn about:</strong></p><ul><li>Instrumental setup and experimentals</li><li>Particle analysis and evaluation</li><li>Microplastic software solutions</li></ul><p><strong>We will cover the basics of:</strong></p><ul><li>Sample types</li><li>Sample preparation steps</li><li>FT-IR experimental procedures</li><li>FT-IR instrumentation</li></ul></div></div></div></div></div><div><div><div><div><div><p><strong>Who should attend:</strong></p><ul><li>Analytical service laboratories</li><li>Environmental researchers</li><li>Food &amp; Feed producers</li><li>Drinks &amp; Beverages producers</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Marten Seeba</p><p>Dr. Marten Seeba graduated in chemistry from the University of Göttingen before joining Bruker as an application expert for FT-IR and IR laser microscopy. He is a point of contact for our customers and as such has gained a great deal of expertise in many applications such as microplastics, pharmaceuticals, tissue analysis and materials science.</p></blockquote></div></div></div></div></div>

Bruker: Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Learn how to set up an FT-IR microplastic lab, including key requirements, sample preparation steps, analysis principles, and ready-to-use solution options.

Preparing Your Lab for Microplastic Analysis via FT-IR

<p><strong>LUMOS II ushers in a new era in FT-IR Microscopy.</strong></p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)</p><div><p>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</p></div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<p><strong>In an emission experimental setup, the sample itself acts as light source of the spectrometer and may emit light in various scenarios, e.g.: thermal emission, photoluminescence or the characterization of self-made lasers and other emission devices. Therefore, emission spectroscopy is established in versatile application fields in academia as well as in industrial applied research &amp; development or failure analysis.</strong></p><p>Bruker provides innovative instrumental solutions for emission spectroscopy with a broad palette of research spectrometers, dedicated measurement modules and accessories. In a series of customer webinars, we will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.</p><div><div><div><div><blockquote><h5><strong>Part 1: General Setup of Emission Experiments and Determination of Emissivity.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6908255056900555277"><strong>Watch Recording of Part 1&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 2: Photoluminescence (PL) Experiments: Challenges and the Suitable Instrumental Solutions.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/216857088501568015"><strong>Watch Recording of Part 2&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 3: Step Scan as a Powerful Tool for Emission Experiments and Source Characterization.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6306834291730245889">W<strong>atch Recording of Part 3&nbsp;</strong></a></a></p></blockquote></div></div></div></div></div></div>

FTIR Emission Spectroscopy

We will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.

<div><p><strong>This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides&nbsp;information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.</strong></p><p>Capabilities for s-SNOM are available on Bruker’s <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s.html">nanoIR3-s</a> and <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s-broadband.html">nanoIR3-s Broadband</a> platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.</p><p>After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.</p><p>Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.&nbsp;</p></div>

Bruker: Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Learn how s-SNOM advances understanding of the functional properties of materials

Advances in Infrared Nano-imaging with Nano-FTIR

<div><div><div><p><strong>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;</strong></p><p>Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html"><strong>watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><p><span style="letter-spacing:0.0px;"><strong>This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II.&nbsp;</strong></span></p><p>Our application specialist Eric Klein skips lengthy PowerPoint presentations and welcomes you directly to our demo lab for a hands-on instrument session. After 20 minutes of analyzing typical samples, Eric will answer your questions about using µ-FT-IR in your daily QC and failure analysis for at least 30 minutes.</p><p><strong>About the samples:</strong></p><ul><li>The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface.</li><li>The second sample is is a product contamination found during quality control. It is analyzed to understand the contamination route and prevent recurrence.</li></ul><p><strong>Content of webinar:</strong></p><ul><li>Measurement two typical µ-FT-IR samples</li><li>Detection and identification of unknown contaminants</li><li>Q&amp;A session on failure analysis by FT-IR</li></ul><p><strong>What you'll learn:</strong></p><ul><li>How to FT-IR microscopy is used to analyze contaminations.</li><li>How to apply the LUMOS II FT-IR microscope</li><li>How to evaluate using OPUS software</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein&nbsp;</p><p>Eric Klein has been with Bruker for 10 years and started out as an application scientist. During this time, he has acquired a great deal of expertise in infrared microscopy and, as a product manager, played a leading role in the development of LUMOS II. The session will be moderated.</p></blockquote></div>

Bruker: About Failure Analysis, Customer Complaints and Troubleshooting

About Failure Analysis, Customer Complaints and Troubleshooting

This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. 

Failure Analysis, Complaints & Troubleshooting Insights

<div><p><strong>Photothermal AFM-IR can provide nanoscale chemical information with highly resolved IR spectra, that directly correlate to FTIR transmission spectroscopy. This webinar covers numerous AFM-IR applications in the field of life sciences, illustrating broad applicability for samples from tissue to single protein fibrils. The speaker also discusses issues, challenges, and potentials of correlative measurements.</strong></p><p><strong>Some of the samples and applications presented include:</strong></p><ul><li>Lipids bodies stored in microorganisms</li><li>Abnormal accumulations in kidney biopsy</li><li>Penetration of nanocarriers in tissue or model cell lines</li><li>Protein nano-assemblies structures</li></ul><p><strong>The speaker discusses the new experimental approaches developed to solve problems encountered during these studies, and the efforts to overcome technical constraints imposed by the system itself, such as:</strong></p><ul><li>Configuration of illumination</li><li>Sensitivity</li><li>Soft-sample damage</li></ul></div>

Bruker: Photothermal AFM-IR Spectroscopy and Imaging for Life Science

Photothermal AFM-IR Spectroscopy and Imaging for Life Science

This webinar explores AFM-IR applications in life sciences, showing its wide use from tissue samples to single protein fibrils.

Photothermal AFM-IR for Life Science Spectroscopy & Imaging

<div><div container-id="cq-colctrl-lt0" comp-id="A1"><div><p><span><strong>Join us for an in-depth webinar where we explore the exciting new functionalities of reporting in Chromeleon Chromatography Data System (CDS). This session will provide you with advanced reporting tips and tricks to enhance your data analysis and reporting capabilities. Whether you are a seasoned user or new to Chromeleon CDS, this webinar will equip you with the knowledge to maximize the potential of reporting, streamline your workflows, and generate insightful reports with ease.</strong></span></p><h5><span><strong>Key takeaways:</strong></span></h5><ul><li><span>Discover the latest features and enhancements</span></li><li><span>&nbsp;Learn advanced tips and tricks for creating comprehensive reports</span></li><li><span>Understand how to customize and automate your reporting processes</span></li><li><span>Get answers to your specific questions during the live Q&amp;A session</span></li></ul><h5><span><strong>Who should attend:</strong></span></h5><ul><li><span>Chromeleon CDS users looking to upgrade their reporting skills</span></li><li><span>Laboratory managers and analysts seeking to improve data reporting efficiency</span></li><li><span>Anyone interested in learning more about the capabilities of Chromeleon CDS</span></li></ul><p><span>Don't miss this opportunity to elevate your reporting skills and make the most out of Chromeleon CDS. Register now to secure your spot!</span></p><blockquote><p><strong>Presenter: </strong>Kimy Young (Senior Manager, Software Product Specialists, Thermo Fisher Scientific)</p><p>Kimy Young is the Senior Manager of software product specialists at Thermo Fisher Scientific. She has been with Thermo Fisher since November 2015. Her background includes administration of Chromeleon CDS, laboratory information management systems (LIMS), Quality Assurance (QA), and IT projects.</p><p><strong>Presenter: </strong>Juan Carmona (Chromeleon CDS Specialist, Thermo Fisher Scientific)</p><p>Juan Carmona is a Chromeleon Specialist at Thermo Fisher Scientific based out of Pflugerville, TX. He has been with Thermo Fisher Scientific for over 15 years. At Thermo Fisher Scientific, he is currently focusing on expanding the customer base using Chromeleon CDS for small networks and enterprise deployments. Prior to joining this group, he was part of the GC/GCMS Center of Excellence team providing support for the product line.</p><p><strong>Presenter: </strong>Monica Driscoll (Regional Marketing Specialist, Thermo Fisher Scientific)</p></blockquote></div></div></div>

Thermo Fisher Scientific: Chromeleon CDS webinar series

Harness the power of Chromeleon CDS reporting

Join this webinar to explore new Chromeleon CDS reporting features, advanced tips, and automation tools to boost efficiency and data insights.