The Merits of Quantitative Element Mapping at Low Acceleration Voltage and High Magnification

Application Note Analysis of As, P dopant distribution of NMOS transistor by FESTEM & EDS NS12001 Key Words
semiconductor
dopant
FESTEM
EDS
Quant Map
MSA
COMPASS
As, P Introduction Acquisition Conditions The…

X-ray Microanalysis Family EDS | WDS | EBSD Pathfinder X-ray Microanalysis System Built for speed, built for answers Accelerate your electron microscope analysis with advanced microanalysis software that rapidly presents the elements and chemical phases within your sample. The Pathfinder…

Application Note: 51733 Energy Dispersive Spectrometry Analysis of a CIGS Solar Cell Pat Camus, Ph.D., Thermo Fisher Scientific, Madison, WI, USA Abstract Key Words • CIGS • COMPASS The Thermo Scientific NORAN System 7 energy dispersive spectrometry (EDS) system was…

Application Note: 31055 Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability Description Key Words • Parallel ARXPS • Surface Analysis • Ultra-thin Films The Thermo Scientific Theta Probe, Figure 1, is a highperformance XPS instrument. Our patented Theta…