Verifying accuracy of ARL X’TRA Companion Benchtop XRD using NIST Clinker SRM 2686, 2687 and 2688

Application note Analysis of Cement Clinker using ARL X’TRA Companion Benchtop XRD Authors Introduction Dr. Simon Welzmiller, X-ray diffraction (XRD) is a powerful analytical tool for the identification and Application Specialist XRD, quantification of crystalline phases in clinker analysis. Clinker…

Application note | 41519 Analysis of VDZ 100 (CEM I), 200 (CEM II) and 300 (CEM III) SRMs using ARL X’TRA Companion X-ray Diffractometer Authors Introduction Dr. Simon Welzmiller, Ju Weicai X-ray diffraction (XRD) Standard Reference Materials (SRMs) are essential…

Application note Quantitative analysis of C3S M1/M3 in CEM Ι using ARL X’TRA Companion benchtop XRD Authors Introduction Dr. Simon Welzmiller, X-ray diffraction (XRD) is a widely used analytical technique in the industrial analysis Application Specialist XRD, of cement-based materials.…

Thermo Scientific ARL X’TRA Companion Next-level routine control benchtop X-ray diffractometer Introduction The microstructure of a material reveals connections between its formation process and its final properties. However, the complex and heterogenous qualities of mineral compounds presents constant challenges when…