Analysis of Cement Clinker using ARL X’TRA Companion Benchtop XRD

Importance of the Topic

Cement clinker X-ray diffraction analysis is crucial as the mineral composition and crystalline phases dictate cement performance and manufacturing efficiency.

Study Objectives and Overview

This work evaluates the Thermo Scientific ARL X’TRA Companion benchtop XRD system for clinker phase identification and quantification, with reproducibility assessed against ASTM C1365 standards.

Methodology and Instrumentation

Ball-milled clinker powder was analyzed in reflection mode using Cu Kα radiation with Ni filter on the ARL X’TRA Companion. Twenty-one acquisitions of 10 minutes each were performed to determine precision. Phase quantification employed one-click Rietveld refinement via Profex (BGMN algorithm) following a fundamental parameters approach, with reference structures from Aranda et al.

Main Results and Discussion

High-quality diffraction patterns yielded clear identification of major clinker phases (C3S M1/M3, C2S β, C3A, C4AF, lime, periclase, quartz) and no detectable amorphous content. Measured weight fractions complied with ASTM C1365 tolerances, and standard deviations for C3S polymorphs were approximately 1% (1σ), demonstrating excellent reproducibility.

Benefits and Practical Applications

The ARL X’TRA Companion offers rapid, automated Rietveld quantification with direct LIMS integration, enabling routine quality control and process optimization in cement production.

Future Trends and Potential Applications

Advances in detector technology, real-time monitoring, and AI-driven data interpretation are expected to enhance in situ clinker analysis and accelerate decision-making in industrial settings.

Conclusion

The Thermo Scientific ARL X’TRA Companion benchtop XRD delivers robust, ASTM-compliant clinker phase analysis with high precision and automation, making it well-suited for process control in the cement industry.

Instrumentation Used

• Thermo Scientific ARL X’TRA Companion benchtop XRD with θ/θ goniometer (Bragg–Brentano geometry)
• 600 W Cu Kα X-ray source with Ni filter
• Divergence and Soller slits; variable beam knife; optional water chiller
• Solid-state pixel detector (55 × 55 µm pitch)
• Profex software (BGMN algorithm, fundamental parameters) for Rietveld refinement

References

1. N. Döbelin, R. Kleeberg, J. Appl. Crystallogr. 2015, 48, 1573–1580
2. M.A.G. Aranda, A.G. De la Torre, L. León-Reina, Rev. Mineral. Geochem. 2012, 74, 169–209