Long term multi-element signal stability in wet plasma

Application note | 000873 Elemental analysis Element XR HR-ICP-MS with Jet Interface in dry plasma: exceptional detection sensitivity and improved abundance sensitivity Authors Introduction L. Bracciali, T. Lindemann, H. Vollstaedt The Thermo Scientific™ Jet Interface™ option for the Thermo Scientific…

Application note | 001007 Elemental analysis Sub-ppt level automated analysis of impurities in nitric acid–hydrogen peroxide solution via HR-ICP-MS Element 2/Element XR High Resolution ICP-MS Authors Introduction B. McKelvey¹, L. Choma¹, J. Roberts², High purity chemicals form the basis for…

APPLICATION NOTE Julian D. Wills, Torsten Lindemann, Thermo Fisher Scientific, Bremen, Germany Key Words Mineral Acids, High Purity Samples, Semiconductor, Sulfuric Acid Goal To demonstrate the ideal suitability of the Thermo Scientific™ ELEMENT 2™ High Resolution (HR) ICP-MS for trace…

APPLICATION NOTE 30685 The Jet Interface: improving sensitivity of trace element analysis Introduction The latest Jet Interface for the Thermo Scientific™ Element™ Series HR-ICP-MS sets a new standard for sensitivity in elemental analysis. With the Jet Interface, sensitivities of up…