Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications of UV-Vis-NIR Optical Characterization of Materials Using Spectroscopy Application Compendium > Return to table of contents Table of contents Introduction  4 Optics  5 Characterizing Sub-Nanometer Narrow Bandpass Filters  Evaluation of the Cary Specular Reflectance Accessory for…

Application Note Materials testing and research Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements Using an Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) with Solids Autosampler Author Travis Burt Farinaz Haq Agilent Technologies, Inc. Introduction Spectral reflection (R)…

Application Note Materials testing and research High Volume Optical Component Testing Using an Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) with Solids Autosampler Author Introduction Travis Burt Manufacturers of high quality multilayer optical coatings require reliable methods to accurately measure…

Application Note Materials Investigating the Angular Dependence of Absolute Specular Reflection Using the Agilent Cary 7000 universal measurement spectrophotometer (UMS) Authors Travis Burt and Chris Colley Agilent Technologies, Inc. Mulgrave, Victoria Australia Introduction When characterizing an optical sample it is…