WCPS: Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ

Application Note Material testing and research Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ Low-ppt determination of alkali metals in high matrix samples using the optional "m-lens" Authors Naoki Sugiyama Agilent Technologies, Japan Introduction Metals…

Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…

Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS Application note Semiconductor Authors Junichi Takahashi Agilent Technologies, Tokyo, Japan Introduction In the past three decades monitoring and controlling metallic…

5th Edition Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900 Primer > Return to table of contents > Search entire document Foreword Agilent Technologies launched its 8800 Triple Quadrupole ICP-MS (ICP-QQQ) at the 2012 Winter Conference on Plasma…