Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ Naoki Sugiyama and Michiko Yamanaka Agilent Technologies International Japan ,Ltd. 9-1 Takakura-machi, Hachioji-shi, Tokyo 192-0033 Japan EWCPS 2017 ID 60 and 362 This paper describes ppt level impurity analysis…

Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…

5th Edition Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900 Primer > Return to table of contents > Search entire document Foreword Agilent Technologies launched its 8800 Triple Quadrupole ICP-MS (ICP-QQQ) at the 2012 Winter Conference on Plasma…

Application Note Semiconductor Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions Meeting single- and sub-ppt guideline levels for ASTM/SEMI elements in ultrapure water using an Agilent 8900 ICP-QQQ Authors Kazuhiro Sakai and Yoshinori Shimamura Agilent Technologies, Inc. Introduction…