Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals

Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals

We will discuss recent advancements in process spectroscopy and their integration with Process Analytical Technology (PAT).
Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals
Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions

Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions

Experts in Advanced X-ray and Magnetic Resonance Solutions will discuss how these cutting-edge technologies can significantly enhance LIB production.
Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions
Analyzing archaeological objects and handcraft using micro-XRF analysis

Analyzing archaeological objects and handcraft using micro-XRF analysis

If you're curious to discover what spatially resolved micro-XRF can achieve, we invite you to join us for our webinar.
Analyzing archaeological objects and handcraft using micro-XRF analysis
How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field

How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field

Preclinical imaging requires quality control to maintain the reliability, reproducibility, and repeatability and to ensure the accuracy and precision of SPECT and PET quantification.
How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field
How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES

How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES

How you can deal with complex spectral interferences on ICP-OES by using Inter Element Correction (IEC) in an easy and simple way.
How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES
Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS

Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS

Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS.
Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS
Advanced Indentation - Cyclic Modes

Advanced Indentation - Cyclic Modes

The session will cover fundamental concepts such as cyclic mode principles, examining how they contribute to understanding material behavior under repeated loading conditions.
Advanced Indentation - Cyclic Modes
Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman

Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman

If you regularly receive a large number of raw materials from a variety of suppliers at a high frequency and want to optimize their release, this webinar is for you!
Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman
Semicon e-Symposium 2024

Semicon e-Symposium 2024

Expert discussions on crucial topics in the semiconductor industry, including yield improvement, sustainability, PFAS analysis, and advanced analytical techniques.
Semicon e-Symposium 2024
Characterization of Textiles & Fibers using Surpass

Characterization of Textiles & Fibers using Surpass

Webinar on the Characterization of Textiles & Fibers using Anton Paar’s advanced Surpass technology.
Characterization of Textiles & Fibers using Surpass