Environmental Analysis via ICP-OES Part 2: A dive into EPA Method 200.7 and 6010
A two-day webinar covering 200.7 and 6010 methods from method building to report generation.
Direct In-Line Fuel & Lubricant Quality Monitoring with Process Raman
Discover how Process Raman enables direct in-line fuel quality measurement, improving process control, reducing costs, and ensuring compliance in refinery operations.
What’s New in KnowItAll 2026
Join us for a tour of KnowItAll 2026—featuring a newly added application for principal component analysis (PCA), enhanced workflows, & improvements across techniques.
Beyond Single Tests: How Data Fusion is Redefining Food Fraud Detection
Learn how data fusion combines spectroscopy and MS to boost food fraud detection accuracy. Case studies include salmon, soy, teas, and challenges in olive oil and honey.
In-Situ Nanomechanical Testing with the Hysitron PI Envision and PI 89
Explore Bruker’s new Hysitron PI Envision SEM PicoIndenter with sub-nm displacement and sub-µN force resolution for in-situ micromechanical testing.
Advancing Therapeutic Protein Production With Real-Time Analysis
Join our speaker as she discusses how precise, non-destructive, real-time insights into protein production empowers teams to make faster, data-driven decisions.
Digital Launch Show: Speed Meets Precision in Thermal Analysis
Join our expert presenters as they unveil the new thermal analyzer and explore how it maximizes measurement quality and laboratory efficiency.
From Calibration to Confidence: Building Trust in Process NIR
Build trust in Process NIR by aligning lab and production teams. Learn how to validate results, overcome doubt, and integrate NIR for real-time quality control in food production.
Environmental Analysis via ICP-OES Part 1: A dive into EPA Method 200.7 and 6010
A two-day webinar covering 200.7 and 6010 methods from method building to report generation.
Interference Correction using the Agilent 5X00 ICP Systems – FACT Modeling and Comparison with Inter-Element Correction IEC
Learn how to correct spectral interferences in ICP-OES. Discover the advantages of FACT modeling compared to classical IEC correction with Agilent 5X00 ICP systems.
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