Nutrient imbalances caused by industrial pollution were not affected by extreme climate events 

<p><strong>In the week from November 2, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>6 000 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><div><div><div><div><h5><span><strong>1. Technology Networks: When Good Analytical Methods Become a Problem</strong></span></h5><ul><li><div><div><span>Tu, 3.11.2026 18:00 CET</span></div></div></li><li><div><div><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6678"><span>Registration</span></a></div></div></li></ul><p>Join our webinar on analytical method lifecycle management in biopharmaceuticals. Learn when and why to reassess established methods for QC and transfer.</p></div><div><h5><span><strong>2. C&amp;EN: From Reaction to Release: Raman and NIR Analysis for Fertilizer Production</strong></span></h5><ul><li><div><div><span>We, 4.11.2026 19:00 CET</span></div></div></li><li><div><div><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6698"><span>Registration</span></a></div></div></li></ul><p>Learn how Raman and NIR spectroscopy can accelerate fertilizer production analysis, reduce reagent use, and support reliable quantitative measurements for phosphate, urea, and ammonium nitrate.</p></div><div><h5><span><strong>3. Metrohm: Bring Your Work to Kids: Test, Don't Guess</strong></span></h5><ul><li><div><div><span>Th, 5.11.2026 10:00 CET</span></div></div></li><li><div><div><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6699"><span>Registration</span></a></div></div></li></ul><p>Join Metrohm and RI Analytical for a fun 30-minute science experience where kids become science detectives and discover how analytical testing helps keep water, toys, and everyday products safe.</p></div><div><h5><span><strong>4. AZoM: Gas Analysis Across Semiconductor Manufacturing: From Bulk Gas Quality to Process Emissions</strong></span></h5><ul><li><div><div><span>Th, 5.11.2026 17:00 CET</span></div></div></li><li><div><div><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/6682"><span>Registration</span></a></div></div></li></ul><p>Join the Thermo Fisher Scientific webinar on semiconductor gas analysis. Discover APIX UHP and MAX-iR FTIR for high-purity gas and emissions control.</p></div></div></div></div>

Webinars LabRulezICPMS Week 45/2026

<p><strong>Sample dilution is a routine part of elemental analysis—but it can also become a significant source of manual work, variability, and laboratory bottlenecks. When samples fall outside the calibration range, contain high particulate loads, or require different dilution factors, analysts may need to stop a sequence, prepare new dilutions, and repeat measurements.</strong></p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_Reducing_Errors_and_Increasing_Throughput_in_ICP_MS_and_ICP_OES_with_Automated_Dilution_61d41669d9.webp" alt="Thermo Fisher Scientific: Reducing Errors and Increasing Throughput in ICP-MS and ICP-OES with Automated Dilution" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_Reducing_Errors_and_Increasing_Throughput_in_ICP_MS_and_ICP_OES_with_Automated_Dilution_61d41669d9.webp 245w," sizes="100vw" width="1024" height="512"></p><p>The <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/2637"><strong>prepFAST 3 autodilution system</strong></a> is designed to bring dilution directly into the analytical workflow, combining high-throughput sample introduction with automated dilution for<strong> </strong><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/products?category=232&amp;manufacturerItems=3&amp;search=icap"><strong>ICP-MS</strong></a> and <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/products?category=227&amp;manufacturerItems=3"><strong>ICP-OES</strong></a> analysis. The system supports both undiluted FAST analysis and diluted sample analysis, allowing laboratories to handle different sample requirements within a single automated workflow.</p><h3><strong>From manual dilution to an automated workflow</strong></h3><p>With prepFAST 3, samples can either be introduced undiluted or diluted automatically before analysis. For undiluted samples, the system loads the sample and injects it for analysis using the FAST workflow. When a dilution factor greater than one is required, the sample is loaded into the dilution line, diluted by syringe into the sample line, and then injected for analysis.</p><p>Integration with <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/1489"><strong>Thermo Scientific Qtegra Intelligent Scientific Data Solution Software</strong></a> extends this automation into the analytical method itself. Users can prescribe dilution factors for standards and samples directly in the sample list.</p><p>More importantly, dilution can respond to analytical results. If an analyte exceeds method-defined quality-control levels, the sample can be automatically returned to the sample list and reanalyzed at a higher dilution factor until its concentration falls within the specified range.</p><p>This turns dilution from a separate sample-preparation step into part of the analytical decision-making process.</p><h3><strong>Intelligent QC-driven dilution</strong></h3><p>Automation becomes particularly valuable when unexpected samples enter a sequence. Instead of requiring an analyst to identify an over-range result, prepare another dilution, and restart the analysis, Qtegra and prepFAST 3 can trigger reanalysis based on user-defined criteria.</p><p>The workflow can also respond to internal-standard recovery. If internal-standard recovery fails, prepFAST can rerun the sample using a prescribed dilution and continue doing so up to a user-defined maximum. Likewise, when an elemental concentration exceeds the calibration range, the system can trigger reanalysis through the Intelligent Dilution functionality, with the reanalysis limits and target range defined by the user.</p><p>The result is an analytical workflow designed to reduce manual intervention while keeping dilution decisions tied to predefined method and QC criteria.</p><h3><strong>Keeping challenging samples moving</strong></h3><p>Automation is only useful if the sample introduction system can keep running. High-particulate, unfiltered, and fiber-containing samples can present a particular challenge because particles may clog valves or nebulizers.</p><p>The prepFAST 3 <strong>FilterProbe</strong> addresses this at the autosampler probe. An inline CTFE filter traps larger particles and fibers before they reach downstream components. While the sample is being analyzed, the filter is rapidly backflushed at the waste station using a syringe-driven process, preparing the system for the next sample. As illustrated by the brine pipeline sludge example on page 12, the concept is intended to extend automation even to highly challenging, particulate-rich samples. The presentation notes that this approach can help minimize valve and nebulizer maintenance while maintaining high throughput.</p><h3><strong>Knowing whether the sample actually loaded</strong></h3><p>Another potential source of analytical problems is incomplete sample loading. <strong>SampleSense3</strong> adds sensor-based monitoring to the workflow. It detects samples, accounts for viscosity by adjusting loading timing, and can detect and log incomplete loading caused by conditions such as a clogged filter, capped vial, or empty vial.</p><p>That capability helps shift the workflow from simply automating physical sample movement toward monitoring whether the automated process is functioning as intended.</p><h3><strong>Designed around uptime and usability</strong></h3><p>prepFAST 3 also introduces hardware features intended to simplify routine operation and maintenance. Multiposition Magnetic SnapValves can be removed without tools and use a two-valve sampling architecture for FAST and prepFAST operations.</p><p>High-purity quartz syringes are used for dilution and sample carrier delivery, with 6 mL and 3 mL syringe configurations respectively. The system also incorporates a hinged, single-screw mounting design intended to simplify syringe maintenance and replacement.</p><p>Together with features such as FilterProbe, SampleSense3 and a shortened probe configuration, these elements are designed around a practical laboratory objective: keeping automated analytical sequences running with less intervention.</p><h3><strong>More analysis, less sample handling</strong></h3><p>For laboratories processing large numbers of samples by ICP-MS or ICP-OES, improving productivity does not necessarily mean making the measurement itself faster. Significant gains can come from reducing the manual steps surrounding each measurement.</p><p>By combining <strong>high-throughput sample introduction, prescribed and QC-driven autodilution, automated reanalysis, particulate management, and sample-loading monitoring</strong>, prepFAST 3 moves several traditionally manual activities into the analytical sequence itself. The objective is straightforward: rapidly analyze both diluted and undiluted samples while improving the user experience and maintaining a compact laboratory footprint.</p><p>For elemental-analysis laboratories looking to reduce repetitive sample preparation and increase unattended operation, automated dilution offers a way to make the workflow—not just the instrument—more efficient.</p><h5><strong>Acknowledgement</strong></h5><p>I would like to thank <strong>Torben Stichel, Joerg Axthelm and Sebastian Voelker </strong>Field Applications Scientist, Germany, Trace Elemental Analysis and for the support on this blog and the webinars</p><h3><strong>References:</strong></h3><ul><li>Watch this webinar on demand in German language: <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179292/AE4C576B6A54D1AC182F7F77573D380F"><strong>Fehler reduzieren, Durchsatz steigern: Autoverdünnung mit PrepFast am ICP-MS</strong></a></li><li>Product Spotlight:<strong> </strong><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/sl_004425_intelligent_autodilution_esi_prepfast3_sl004425_en_0d3490e91e.pdf"><strong>Qtegra Intelligent Scientific Data Solution Software</strong></a></li><li>Sign up for our webinars live and on demand</li></ul><h5><strong>English</strong></h5><ul><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/5795"><strong>Lunch and Learn Tips and Tricks Series: Qtegra Part 1</strong></a></li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/5976"><strong>Lunch and Learn Tips and Tricks Series: Qtegra Part 2</strong></a></li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/5977"><strong>Lunch and Learn Tips and Tricks Series: Trace Elemental Analysis (ICP-OES &amp; ICP-MS)</strong></a></li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/webinar/5978"><strong>Trace Elemental Analysis: Ask the Expert</strong></a></li></ul><h5><strong>Deutsch</strong></h5><ul><li><strong>19. März 2026</strong><br><a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179134/393E071E3B501943730958BA6203F477"><strong>Interne Standards in der ICP-OES: Ein Praxisguide für zuverlässige Qualitätssicherung im Labor</strong></a></li><li><strong>18. Juni 2026</strong><br><a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179292/AE4C576B6A54D1AC182F7F77573D380F"><strong>Fehler reduzieren, Durchsatz steigern: Autoverdünnung mit PrepFast am ICP-MS</strong></a></li><li><strong>17. September 2026</strong><br><a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179423/B5019C560431BADCA2A76E54E4EFE56F"><strong>ICP-OES smarter nutzen: Probendurchsatz erhöhen, Ressourcen sparen</strong></a></li><li><strong>17. Dezember 2026</strong><br><a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179530/94EEDD1F56138F5EEE2AF24E29E6C12A"><strong>Qtegra ISDS Software Unlocked – Live im Expertengespräch</strong></a></li></ul><blockquote><p><strong>Visit us on&nbsp;</strong><a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/chromatography-&amp;-mass-spectrometry/posts/?feedView=all"><strong><u>LinkedIn:</u></strong></a><strong>&nbsp;</strong>#ICPMS #ICPOES #AutomatedDilution #LabAutomation</p></blockquote>

Reducing Errors and Increasing Throughput in ICP-MS and ICP-OES with Automated Dilution

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Thermo Scientific Element GD Plus GD-MS

For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.

<p><strong>Redefine the analysis of advanced high purity materials directly in solid state with the Thermo Scientific™ Element GD Plus™ GD-MS. For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.</strong></p><p>The Element GD Plus GD-MS enables analysis of<strong> nearly all elements in the periodic table</strong> from both <strong>conductive and non-conductive materials</strong> with the same level of sensitivity and data quality. Analysis of low melting point metals such as gallium are made easy with a dedicated workflow for sample preparation and analysis. This makes <strong>GD-MS</strong> the <strong>reliable standard</strong> <strong>for any metal analysis.</strong></p><p>Almost all elements present in a solid sample can be <strong>detected and quantified routinely</strong>: many down to the parts per billion (ppb) level.</p><h3><strong>High productivity and low cost of analysis</strong></h3><p>The<strong> Element GD Plus GD-MS</strong> is designed to deliver outstanding sensitivity and accuracy at a high sample throughput, dramatically lowering the cost of your analysis.</p><ul><li>Fast-flow ion source</li><li><strong>User-friendly source design: </strong>&lt; 1 min sample exchange</li><li><strong>Short pumping times: </strong>&lt; 10 min sample turnaround</li><li><strong>High sample throughput: </strong>up to 5 samples/hr</li><li><strong>Less sample preparation:</strong> no requirement for acid cleaning of high-purity samples</li><li><strong>Faster sample analysis: </strong>no requirement to measure calibration standards</li></ul><h3><strong>Routine operation</strong></h3><p>The <strong>Element GD Plus GD-MS </strong>is designed with routine operation and high throughput at its core.</p><ul><li><strong>Linear dynamic range </strong>spanning more than<strong> 12 orders</strong> of magnitude allows the <strong>simultaneous analysis</strong> of <strong>matrix elements</strong> (%), <strong>traces</strong> (ppm), and <strong>ultra-traces</strong> (ppb)</li><li><strong>Automatic cross-calibration</strong> between different detection modes ensures robust results</li><li><strong>Sample vacuum chamber:</strong> eliminates risk of leakage between the sample and the GD cell</li><li><strong>Determine</strong> elemental concentrations rapidly within a <strong>single scan without calibration standards</strong> (using standard RSF approach)</li><li><strong>Best precision within a short analysis time</strong></li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_2_f0a37ee3f3.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Ion Beam Ratio RSD for 10 min measurements of elements at 1000 ppm, 100 ppm and 1 ppm. Data shown for 18 different instruments." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_2_f0a37ee3f3.jpg 152w," sizes="100vw" width="906" height="931"></p><h3><strong>Outstanding limits of detection</strong></h3><p>The<strong> Element GD Plus GD-MS</strong> delivers high throughput without compromise. With the <strong>highest signal-to-noise ratio</strong> and <strong>lowest limits of detection</strong>, the Element GD Plus GD-MS is the workhorse for <strong>ultra-high purity elemental</strong> analysis.</p><ul><li><strong>Unique ion source </strong>designed for high ion transmission, maximizing the signal analyzed.</li><li>Guaranteed signal-to-noise ratio produces the<strong> sub-ppb limits of detection</strong></li><li>Optional <strong>CNO</strong> option achieves <strong>sub-ppm level limits of detection </strong>for CNO with no compromise to the through-put of your analysis</li><li>Factor 10 reduction of polyatomic interferences compared to static GD sources</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_3_a73bdae066.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Typical mass spectrum of 42Ca and 45Sc during the analysis of high purity Ti. (Left) ASTM F1710-08 method using static source. (Right) Fast-flow method using the Element GD Plus GD-MS. Overlapping isobaric interference from 48Ti36Ar2+ and 50Ti40Ar2+ is suppressed by the fast flow source." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_3_a73bdae066.jpg 166w," sizes="100vw" width="921" height="867"></p><h3><strong>Trust in results by high mass resolution</strong></h3><p>The simplicity of high-resolution <strong>ICP-MS</strong> allows the most advanced performance, without compromising on straightforward and reliable method development.</p><ul><li><strong>Interference-free</strong> measurements for indisputable analytical results</li><li>Any combination of resolution settings can be performed within a single analysis</li><li><strong>Fixed-slit</strong> design guarantees maximum stability and reproducibility</li><li>Minimum contribution of high matrix signals on neighboring analyte peaks due to filter lens</li></ul><h3><strong>Depth profiling with nanometer resolution</strong></h3><p>Depth profiling is an important tool for elemental analysis of coatings and the assessment of element diffusion across layers.</p><ul><li><strong>Depth resolution</strong> from nanometers to hundreds of micrometers</li><li>Determining concentrations of <strong>all elements from sub-ppm to 100%</strong> without the need for calibration</li><li><strong>Flexible anode diameter</strong> for advanced depth profiling a</li><li>Sputter rates can be adjusted for<strong> bulk analysis or depth profiling</strong></li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Element_GD_Plus_GD_MS_289a3c7919.jpg" alt="Thermo Scientific™ Element GD Plus™ GD-MS: Typical crater shape of a depth profile on a copper sample." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Element_GD_Plus_GD_MS_289a3c7919.jpg 245w," sizes="100vw" width="1191" height="388"></p><h3><strong>Recommended for</strong></h3><ul><li><strong>Aerospace:</strong> nickel superalloys, composite materials, depth profiling of coatings and diffusion layers</li><li><strong>Microelectronics:</strong> copper, alumina powder, sputter targets</li><li><strong>Renewable energy:</strong> silicon blocks, wafers, solar cells</li><li><strong>Medical/pharmaceutical/food:</strong> stainless steel, alloys</li></ul><h3><span><strong>Specifications</strong></span></h3><ul><li><strong data-start="0" data-end="9" data-is-only-node="">Type:</strong> GS Mass Spectrometer</li><li><strong data-start="33" data-end="51">Dynamic Range:</strong> &gt;10¹² Linear with Automatic Cross Calibration</li><li><strong data-start="100" data-end="120">Mass Resolution:</strong> 3 Fixed Resolutions: ≥300, ≥ 4,000, ≥ 10,000</li><li><strong data-start="168" data-end="187">Mass Stability:</strong> 25 ppm/8 hour</li><li><strong data-start="204" data-end="214">Power:</strong> 3-Phase, 230/400 V ± 10%, 50/60 Hz Fused 32 A / Phase</li><li><strong data-start="271" data-end="287">Sensitivity:</strong> &gt;1 x 10¹⁰ Cps (1.6 x 10⁻⁹ A) for Copper Peak (Peak Height, Total Ion Current) in Medium Resolution</li><li><strong data-start="389" data-end="403">Unit Size:</strong> Each</li></ul>

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Reducing Errors and Increasing Throughput in ICP-MS and ICP-OES with Automated Dilution

Webinars LabRulezICPMS Week 45/2026

Nutrient imbalances caused by industrial pollution were not affected by extreme climate events