Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 2nd November 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote><h3>1. Agilent Technologies: ICP-MS Elemental Impurity Analysis of Pharmaceuticals Following USP and ICH Protocols</h3>Routine oral drug analysis using the <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 Triple Quadrupole ICP-MS</a> in Advanced Helium Mode<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_elemental_pharma_AHM_9500_icp_ms_5995_0021en_agilent_32a608446d.pdf">Full PDF for download</a>&nbsp;</li></ul>All pharmaceutical products must be evaluated to demonstrate that they are safe for patients and effective for their intended therapeutic use. As part of this evaluation, potentially toxic elemental impurities must be monitored. The relevant requirements and procedures are specified by organizations such as the United States Pharmacopeia (USP) and the International Council for Harmonisation of Technical Requirements (ICH). ICH Q3D(R2) establishes Permitted Daily Exposure (PDE) values for 24 elements and includes the elements specified in USP General Chapter &lt;232&gt;.1,2 USP General Chapter &lt;233&gt; describes the analytical procedures and validation requirements for determining elemental impurities.3 In this study, the 24 elements listed in ICH Q3D(R2) were analyzed using an ICP-MS method based on USP &lt;233&gt; to meet the requirements of both ICH and USP.Agilent ICP-MS systems, including single quadrupole (SQ) and triple quadrupole (QQQ) instruments, have been extensively tested and used in pharmaceutical laboratories for many years.4 The instruments deliver reliable, high-quality data, supported by trusted service teams, qualification services, and compliance solutions. To extend the benefits of ICP‑QQQ technology to a wider range of laboratories, Agilent has developed the 9500 ICP-QQQ, an entry-level triple quadrupole ICP-MS.5 Unlike traditional ICP-QQQ systems, which are often used for advanced applications, the 9500 is designed for routine sample analysis. It combines excellent interference removal, dependable performance, and straightforward operation, enabling laboratories to benefit from ICP‑MS/MS capability in high‑volume daily workflows while still supporting more complex research projects.&nbsp;<h4><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=10&amp;search=9500">Agilent 9500 Triple Quadrupole ICP-MS&nbsp;</a></h4>The 9500 ICP-QQQ is equipped with the Dual-Cell System (DCS), a new collision/reaction cell (CRC) that incorporates two independently controlled ion guides. The DCS enables effective removal of many spectral interferences through a new standard cell-gas mode, Advanced Helium Mode (AHM), which uses Kinetic Energy Discrimination (KED) and Collision-Induced Dissociation (CID) mechanisms.6 This enhanced helium (He) mode provides efficient removal of polyatomic interferences while maintaining sufficient high sensitivity in the low-mass range, making it suitable for the analysis of most analytes in the majority of sample types.&nbsp;AHM replaces the need for conventional multitune operation using no gas, He, and high energy (HE)He modes. By eliminating gas switching between these modes, AHM simplifies operation and improves sample throughput.&nbsp;In pharmaceutical samples, AHM is particularly advantageous for the analysis of elements such as lithium (Li), which typically has low sensitivity in conventional He mode, as well as vanadium (V), chromium (Cr), arsenic (As), and selenium (Se), which are susceptible to polyatomic interferences.&nbsp;While AHM effectively resolves many polyatomic ion interferences, such as oxide ions (MO+ ) and argon-based ions (ArM+ ), it is less effective at suppressing doubly charged ion interferences (M++). However, a reactive cell gas mode known as Air cell mode has been developed for the 9500 that reduces M++ interferences through ion–molecule reactions with oxygen (O2 ).7 In Air cell mode, ambient air is purified through an air filter before being introduced into the cell. Using MS/MS settings to control which analyte ions enter the DCS and interact with O2, the 9500 ICP-QQQ ensures effective interference removal of M++, as well as challenging polyatomic species that AHM cannot fully suppress.This note describes the analysis of 24 elements in an over-the-counter (OTC) oral drug product using the 9500 ICP-QQQ in AHM. The method was evaluated for both limit and quantitative procedures against the performance criteria specified in the ICH guidance and USP Chapters.<h4>Conclusion&nbsp;</h4>A rapid method for the simultaneous determination of the 24 elemental impurities specified in ICH Q3D (R2) was successfully developed using the Agilent 9500 Triple Quadrupole ICP-MS. Operating the 9500’s Dual-Cell System (DCS) in Advanced Helium Mode (AHM) effectively suppressed polyatomic interferences while maintaining sufficient sensitivity across the entire mass range. This performance enabled quantification of all target elements in an oral drug product using a single gas mode. Eliminating conventional multitune operation and gas switching also enabled a faster and more streamlined ICP‑MS workflow.&nbsp;The method was evaluated in accordance with the requirements of USP &lt;233&gt;, including detectability, precision, intermediate precision, specificity, and accuracy. All 24 elements met the applicable acceptance criteria. The RSDs for the primary isotopes were less than 3% in the precision study, and results obtained on different days met the intermediate precision criterion. Acceptable recoveries were obtained at all evaluated spike levels from 0.3 to 1.5&nbsp;J.&nbsp;AHM provided low detection limits and background equivalent concentrations for all 24 elements, including V, Cr, As, and Se, which are susceptible to polyatomic interferences arising from the sample matrix. These results demonstrate effective interference removal capability and quantitative performance of the method. The use of a preset USP/ICH method in the Agilent OpenLab ICP-MS software further simplified method setup and routine operation.&nbsp;In addition, Air cell mode provides a complementary massshift approach for specific sample matrices affected by spectral interferences that cannot be sufficiently resolved using AHM alone. Examples include doubly charged rare earth element ion interferences on As and Se.&nbsp;Overall, the 9500 ICP-QQQ method using AHM met the requirements of both ICH and USP for the determination of elemental impurities in the OTC drug sample. The ability to accurately determine the target elements at 0.3&nbsp;J confirms that the method is suitable for monitoring elemental impurities at concentrations as low as 30% of the J value.&nbsp;The single-mode analytical approach simplifies operation, reduces analysis time, and improves sample throughput, making it suitable for routine pharmaceutical analysis.<h3>2. LECO: Metallography of Lithium-Ion Battery Coated Foils</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/METALLOGRAPHY_LITHIUM_ION_BATTERY_COATED_FOILS_203_821_726_ec2c1207dc.pdf">Full PDF for download</a></li></ul>As the demand for renewable energy and green technologies accelerates, companies are prioritizing powerful, efficient, and reliable energy storage solutions. Lithium-ion batteries have rapidly become the leading clean energy choice across automotive, defense, and stationary storage applications. Most lithium-ion cells use a graphite anode paired with either a Lithium Iron Phosphate (LFP) or Lithium Nickel Manganese Cobalt (NMC) cathode. During manufacturing, the anode and cathode slurries are coated onto thin metal foils, which makes metallographic inspection a critical quality control step. Metallography enables precise evaluation of key battery performance factors, including adhesion, coating and foil thickness, and porosity. These characteristics directly influence charge-discharge efficiency, energy density, and overall safety, helping manufacturers prevent defects that could otherwise lead to performance loss or hazardous failures.<h4>Understanding Battery Foil Coating&nbsp;</h4>Thickness measurements of anode and cathode coatings are essential for preventing downstream issues such as reduced battery efficiency, shortened battery life, and the risk of thermal runaway. Irregular coatings can generate localized hotspots that worsen with every charge– discharge cycle. To minimize manufacturing waste and maintain quality, it is recommended to check coating thickness at multiple stages of the production process.&nbsp;These measurements reveal uniformity and flatness across the foil. The material should be evenly distributed with homogeneous particle dispersion and be free of defects such as holes, cracks, delamination, or scratches. By monitoring thickness in real time, manufacturers can adjust parameters, such as coating speed or calendering gaps, to optimize performance and improve overall process efficiency.<h4>Image Analysis for Coating Thickness Measurements&nbsp;</h4>LECO's image analysis software, <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/all/products/1860">PAX-it</a>, provides users with an enhanced user interface to automate and generate reports based on common metallographic inspections for coated foils, including coating and layer thicknesses. Samples in the as-polished condition are suitable for observation and these measurements (Figure 7).&nbsp;With the “Measurement Sequence” capability, users can repeatedly measure thicknesses from a captured image (Figure 8). The Measurement Sequence is set up to prompt an operator to make measurements based on predefined parameters and locations. It is often recommended to use multiple measurements and areas of a sample for an accurate average of the entire layer of interest (Figure 9). Pass/Fail criteria can be established to alert a user if any of the measurements don't meet quality standards. This can also be used to observe any coating inconsistencies, like porosity or inclusions, that could lead to failure. Users also have the option to customize and print out Excel reports for traceability purposes.<h4>Conclusion&nbsp;</h4>Metallographic inspection is a critical quality control tool in lithium-ion battery manufacturing, directly impacting performance, safety, and reliability. Accurate evaluation of coating thickness, adhesion, and uniformity on anode and cathode foils helps prevent efficiency losses, premature failure, and safety risks such as thermal runaway. Because these foils are highly sensitive to deformation, careful sectioning, delicate cold mounting, and controlled grinding and polishing are essential to preserve the true microstructure. LECO's recommended preparation methods and consumables enable consistent, deformation-free surfaces suitable for precise analysis. When combined with PAX-it image analysis software, manufacturers can reliably measure coating and foil thickness, detect defects, and generate traceable reports. Overall, a well-controlled metallographic workflow supports optimized process control, reduced manufacturing waste, and the production of safer, higherperforming lithium-ion batteries.<h3>3. Metrohm: Automated quality control of diesel using near-infrared spectroscopy</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_nir_080_download_ee71fd0827.pdf">Full PDF for download</a></li></ul>Key parameters for diesel fuel quality testing include the cetane index (ASTM D613), flash point (ASTM D56), density (ASTM D975), T95 (ISO 3405), and viscosity at 40 °C (ISO 3104). Usually, determining these properties is labor intensive and time consuming, requiring multiple analytical techniques and dedicated instrumentation. The OMNIS NIR Analyzer Liquid provides a fast, reliable, and reagentfree solution to simultaneously determine these diesel fuel properties without sample preparation. The precise temperature control ensures that all samples are measured in compliance with ASTM D8340, ASTM D8321, and ASTM D6122. Combined with the OMNIS Sample Robot M – NIR, the system offers fully automated operation for maximum lab efficiency.<h4>EXPERIMENTAL EQUIPMENT&nbsp;</h4>Diesel samples were measured with an <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=220&amp;search=OMNIS+NIR">OMNIS NIR Analyzer Liquid</a> (Figure 1) in transmission mode over a wavelength range of 1000–2250 nm. Reproducible spectrum acquisition was achieved using the built-in temperature control at 30 °C. An OMNIS Sample Robot M – NIR was used for fully automated sample measurement with disposable vials (8 mm pathlength). The vials are closed, which reduces the flammability risk for fuel samples to an absolute minimum. <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=220&amp;search=OMNIS+software">OMNIS Software</a> was used for all data acquisition and prediction model development.<h4>CONCLUSION</h4>This Application Note shows the feasibility of using NIR spectroscopy for the quality control of diesel. Determination of cetane index, cetane number, T95, density, flash point, and viscosity in diesel can be done simultaneously in a few seconds by using the OMNIS NIR Analyzer Liquid. The possibility of fully automated analysis in combination with the OMNIS Sample Robot M – NIR increases throughput, maximizing efficiency. With the OMNIS pre-calibration of diesel (6.06008.009), users can measure all the mentioned parameters from day one.<h3>4. Shimadzu: Analysis of Fluorine by EDXRF —A Simple Check for PFAS in Electrical and Electronic Components</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/pdf/an_01_00977_en_27a7e26bb5.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>EDXRF analyzes halogens (F, Cl, Br, and I) more easily than absorption/emission methods.</li><li>Fluorine (F) on the material surface is detected directly, without sample preparation.</li><li>Simultaneous halogen analysis enables simple screening for the possible use of halogenated flame retardants.</li></ul>Asregulations on PFAS and halogenated organic flame retardants tighten in the EU1), 2) and some U.S. states3), 4), there is a growing need to identify at an early stage whether halogens such as fluorine are present in electrical and electronic materials. Rapid supply-chain screening is also increasingly required. The energy dispersive X-ray fluorescence spectrometer <a target="_blank" rel="noopener noreferrer" href="https://labrulez.com/en-us/icpms/library?mainauthorItems=1&amp;search=8100">EDX-8100</a> requireslittle to no sample preparation and can quickly and easily detect halogenssuch asfluorine (F), chlorine (Cl), and bromine (Br). EDX-8100 quickly shows whether these halogens are present, helping narrow down regulated products and prioritize samples for detailed analysis. This article demonstrates the usefulness of halogen detection by EDXRF using an ETFE-coated wire and a relay as examples.<h4>Conclusion&nbsp;</h4>As shown above, fluorine can be detected and quantified rapidly and easily when its content is about 0.1 wt% or higher. In addition to intentional use, the presence of fluorine compounds can also be confirmed in cases of unintentional inclusion,such as transfer or contamination. In the electrical and electronics field, demand for analysis related to PFAS and halogenated flame retardants is expected to increase in the future, and EDXRF is useful as a simple initial screening method

News from LabRulezICPMS Library - Week 45, 2026

Light and urea. These are two "basic ingredients" that can be enough for effective and gentle water purification. This has been proven by new research conducted by scientists from CEITEC Brno University of Technology (BUT). Although this is only basic research and scientists will continue to build on it, its results can already be used in practice.Urea is an organic substance that is commonly found in nature. Thanks to this, it is widely available.The key is its modification, in which scientists obtain a special compound of carbon and nitrogen from it. This can then be used for photocatalysis. "Our compound therefore serves as a catalyst that is activated by incident light. Thanks to this, substances that eliminate impurities present in water begin to be released," says Daina Arenas Buelvas from the Quantum Molecular Magnetism team at CEITEC BUT, who led the research.This represents a significant shift compared to current methods. Filters that capture impurities are now used to purify water. These filters then need to be removed and the captured substances disposed of. The carbon and nitrogen compound formed from urea, when hit by the light, both captures and decomposes pollutants. In laboratory tests this is done with an efficiency of up to 97%.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Cisteni_vody_pomoci_svetla_Laboratorni_testy_prokazaly_ucinnost_az_97_2_719253ff50.jpeg" alt="CEITEC BUT/Jakub Rozboud: Purifying Water Using Light? Laboratory Tests Have Shown 97% Efficiency: Daina Dayana Arenas Buelvas preparing samples." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Cisteni_vody_pomoci_svetla_Laboratorni_testy_prokazaly_ucinnost_az_97_2_719253ff50.jpeg 235w," sizes="100vw" width="1600" height="1067"><h3>A unique method that freezes particles</h3>The research is also unique thanks to the technology used. The scientists used EPR spectroscopy, which can capture free radicals whose lifetime is only a few nanoseconds and “freezes” them, giving scientists the space to examine them.“This allowed us to describe the entire reaction that took place in the material. We thus obtained information that we and other scientists can use in follow-up research,” points out Daina Arenas Buelvas.<blockquote>Researchers use a technique called spin trapping to confirm that the material produces reactive oxygen species that break down impurities. Since these molecules are too short-lived to be detected directly, a special 'trap' molecule is added to convert them into a stable, measurable compound, definitively proving that the material generates the active cleaning agents.</blockquote>The results of the research were <a target="_blank" rel="noopener noreferrer" href="https://www.sciencedirect.com/science/article/pii/S2214993726002150?via%3Dihub">published</a> in the prestigious scientific magazine Sustainable Materials and Technologies. In addition to the Quantum Molecular Magnetism team of Vinicius Tadeu Santana from CEITEC BUT, the Brazilian scientific teams of Felipe La Porta from the University of Paraná and Débora Quadreli from the University of Londrina, and the team of Christian M. M. Rocha from the University of Barranquilla, Colombia, also participated in it.<h3>They will test the use against microplastics</h3>The scientists verified the effectiveness of graphitic carbon nitride, which is the name of the used carbon and nitrogen compound, in water contaminated with methylene blue. Thanks to the photocatalytic reaction, the compound removed 97.2% of the impurities.The wide availability of urea and the easy treatment required to obtain the key compound allow for rapid implementation in practice. At the same time, other scientific works can follow up on this research.Daina Arenas Buelvas also plans to do the same. "I want to find out whether it is possible to use photocatalysis in graphitic carbon nitride to remove microplastics. But we are only at the beginning," adds the scientist, who came to the Czech Republic from Colombia.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Cisteni_vody_pomoci_svetla_Laboratorni_testy_prokazaly_ucinnost_az_97_3_0b9e23b800.jpeg" alt="CEITEC BUT/Jakub Rozboud: Purifying Water Using Light? Laboratory Tests Have Shown 97% Efficiency: EPR laboratory at CEITEC BUT." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Cisteni_vody_pomoci_svetla_Laboratorni_testy_prokazaly_ucinnost_az_97_3_0b9e23b800.jpeg 235w," sizes="100vw" width="1600" height="1067"><blockquote><h4>Article&nbsp;</h4><h4><a target="_blank" rel="noopener noreferrer" href="https://www.sciencedirect.com/science/article/abs/pii/S2214993726002150?via%3Dihub">Unraveling precursor effects on the cytotoxicity, adsorption and photocatalytic Performance of g-C3N4 materials: Insights from experimental and computational approaches</a></h4>Daina D.A. Buelvas, João P.A. de Jesus, Lucie Kotásková, Christian M.M. Rocha, Débora H. Quadreli, Juliana M. Serpeloni, Glaura S.A. Fernandes, Bruno L.S. Vicentin, Vinicius T. Santana, Felipe A. La Porta&nbsp;Sustain. Mater. Technol., 2026, 48, e02064<a target="_blank" rel="noopener noreferrer" href="https://doi.org/10.1016/j.susmat.2026.e02064">10.1016/j.susmat.2026.e02064</a></blockquote>

 Purifying Water Using Light? Laboratory Tests Have Shown 97% Efficiency 

Olomouc – The new REEactor technology platform addresses the growing demand for rare earth elements and the challenges associated with their extraction. Alexander Dömling from CATRIN at Palacký University has received a prestigious European Research Council grant in the Proof of Concept category to develop this platform. Together with his team, the renowned chemist aims to use automated chemistry, artificial intelligence and molecular research to speed up and streamline the separation of these raw materials, while reducing both chemical consumption and the volume of toxic waste generated during their extraction. The project was officially launched yesterday in the presence of academics and representatives from the public sector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_2_648397508e.jpg" alt="CATRIN: The REEactor project has been launched. It will simplify the separation of rare earth elements" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_2_648397508e.jpg 208w," sizes="100vw" width="1920" height="1440">“Securing an ERC Proof of Concept grant is an important validation of our vision that autonomous chemistry, automation and artificial intelligence can help address one of Europe’s most pressing challenges in the field of critical raw materials. For decades, China has been building up expertise in the separation of rare-earth elements, specialised academic capacity and industrial know-how.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_3_049bc5af73.jpg" alt="CATRIN: The REEactor project has been launched. It will simplify the separation of rare earth elements" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_3_049bc5af73.jpg 208w," sizes="100vw" width="1920" height="1440">Rare earth elements comprise 17 chemical elements that are essential, for example, in the manufacture of batteries, electric vehicles, aeroplanes, drones, wind turbines, mobile phones, medical diagnostic equipment, semiconductors and high-performance magnets. The industrial separation of rare-earth elements is currently largely concentrated in China and is associated with a number of problems. REEactor will focus on finding the molecular key to one of the most difficult problems in the processing of critical raw materials: how to separate rare-earth elements that are nearly identical. Instead of slowly testing individual compounds, it will use automation to prepare and test tens of thousands of molecular variants, with artificial intelligence helping to identify the most successful ones.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_4_8418d66c05.jpg" alt="CATRIN: The REEactor project has been launched. It will simplify the separation of rare earth elements" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_4_8418d66c05.jpg 208w," sizes="100vw" width="1703" height="1277">“The main aim of the project is to demonstrate that rare-earth elements can be separated more easily, using fewer chemicals and less energy, and producing less waste. In the longer term, REEactor could help replace large, resource-intensive industrial separation plants with smaller, modular facilities that are more efficient, flexible and environmentally friendly. The transfer of the technology into industrial practice shall be carried out by the newly established spin-off company REEactor, the development of which is another objective of the project,”&nbsp;said&nbsp;Imma&nbsp;Capriello, CEO and Co-Founder&nbsp;of&nbsp;REEactor Tech and a member&nbsp;of&nbsp;the&nbsp;research team at CATRIN.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_5_db1bfe4fea.jpg" alt="CATRIN: The REEactor project has been launched. It will simplify the separation of rare earth elements" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Projekt_RE_Eactor_odstartoval_Zjednodusi_separaci_prvku_vzacnych_zemin_5_db1bfe4fea.jpg 208w," sizes="100vw" width="1920" height="1440"><blockquote>In the first round of the 2026 call for proposals, the European Research Council (ERC) awarded a total of 27.3 million euros to 182 researchers; only one project in the Czech Republic received funding. Each grant is worth €150,000 and is intended for current and recent ERC grant holders to enable them to validate the commercial or societal potential of their research results. This grant programme forms part of the European Union’s Horizon Europe framework programme for research and innovation.</blockquote>

The REEactor project has been launched. It will simplify the separation of rare earth elements

Article

Application

Water

Science and research

Since its establishment in 2011, CEITEC has quickly developed into a cutting-edge infrastructure for research which performs highly alongside the best institutes in Europe. Among the main priorities of CEITEC are the promotion of a motivating and dynamic international scientific environment, the provision of state-of-the-art research infrastructure, and the policy of open communication and equal opportunities.

CEITEC

The Czech Advanced Technology and Research Institute (CATRIN) at Palacký University is a cutting-edge scientific hub dedicated to advancing research in the fields of nanotechnology, biotechnology, and biomedicine. At its core, CATRIN boasts outstanding scientific teams, featuring international researchers. We emphasize interdisciplinarity, foster global collaborations, and work to translate our research findings into practical applications.

CATRIN

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Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category XPS - page 1

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