Open paper Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications
Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Instrumentation
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Manufacturer
JEOL
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Materials Testing, Clinical Research
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
