Applications focused on NIR Spectroscopy from Agilent Technologies - page 1

Open paper The Basics of UV-Vis-NIR Spectrophotometry

The Basics of UV-Vis-NIR Spectrophotometry

UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Open paper Agilent Molecular Spectroscopy Safety Information

Agilent Molecular Spectroscopy Safety Information

FTIR Spectroscopy, UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
FTIR Spectroscopy, UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Other
Open paper Improving Spectral Quality Using Beam Collimation Control

Improving Spectral Quality Using Beam Collimation Control

UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Optical Characterization of Materials Using Spectroscopy

Optical Characterization of Materials Using Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Open paper Measuring the Optical Properties of Photovoltaic Cells

Measuring the Optical Properties of Photovoltaic Cells

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measurement of Diffuse Reflection from Catalyst Powders

Measurement of Diffuse Reflection from Catalyst Powders

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Agilent Cary 7000 universal measurement spectrophotometer

Agilent Cary 7000 universal measurement spectrophotometer

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries