Applications focused on Software from ZOEX/JSB - page 1
Open paper NEW AND IMPROVED GC IMAGE FEATURE: ION PEAK DETECTION FOR COMPREHENSIVE CHROMATOGRAPHIC DECONVOLUTION
NEW AND IMPROVED GC IMAGE FEATURE: ION PEAK DETECTION FOR COMPREHENSIVE CHROMATOGRAPHIC DECONVOLUTION
GCxGC, Software, 2D-LC
Instrumentation
GCxGC, Software, 2D-LC
Manufacturer
ZOEX/JSB
Industries
Open paper NEW GC IMAGE FEATURE: SIDE-BY-SIDE COMPARISON
NEW GC IMAGE FEATURE: SIDE-BY-SIDE COMPARISON
GCxGC, Software, 2D-LC
Instrumentation
GCxGC, Software, 2D-LC
Manufacturer
ZOEX/JSB
Industries
Open paper BRIEF INTRODUCTION TO THE NEW GC IMAGE SOFTWARE VERSION 2.8
BRIEF INTRODUCTION TO THE NEW GC IMAGE SOFTWARE VERSION 2.8
GCxGC, Software, 2D-LC
Instrumentation
GCxGC, Software, 2D-LC
Manufacturer
ZOEX/JSB
Industries
Open paper What’s New in GC Image R2.5
What’s New in GC Image R2.5
GCxGC, Software, 2D-LC
Instrumentation
GCxGC, Software, 2D-LC
Manufacturer
ZOEX/JSB
Industries
Open paper GC Image software
GC Image software
GCxGC, Software, 2D-LC
Instrumentation
GCxGC, Software, 2D-LC
Manufacturer
ZOEX/JSB
Industries
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
