Applications from the field of Materials Testing from Agilent Technologies - page 3

Open paper Measuring the Optical Properties of Photovoltaic Cells

Measuring the Optical Properties of Photovoltaic Cells

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measurement of Diffuse Reflection from Catalyst Powders

Measurement of Diffuse Reflection from Catalyst Powders

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Agilent AI Peak Integration for MassHunter

Agilent AI Peak Integration for MassHunter

GC/MSD, Software
Instrumentation
GC/MSD, Software
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Advancing Research of Lithium-Ion Batteries Using the Agilent Cary 630 FTIR Spectrometer

Advancing Research of Lithium-Ion Batteries Using the Agilent Cary 630 FTIR Spectrometer

FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface

Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface

FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Material Identification of Plastics Throughout Their Life Cycle by FTIR Spectroscopy

Material Identification of Plastics Throughout Their Life Cycle by FTIR Spectroscopy

FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research