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Applications from the field of Materials Testing - page 1
Open paper Improving Spectral Quality Using Beam Collimation Control
Improving Spectral Quality Using Beam Collimation Control
UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Utilizing UV-Visible Spectroscopy for Color Analysis of Fabrics
Utilizing UV-Visible Spectroscopy for Color Analysis of Fabrics
UV–VIS spectrophotometry, FTIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Recycled Plastic Analysis Solutions
Recycled Plastic Analysis Solutions
FTIR Spectroscopy, Thermal Analysis, GPC/SEC, MALDI, LC/MS, LC/TOF, UV–VIS spectrophotometry, X-ray, Mechanical testing, Rheometry, Optical Emission Spectroscopy (OES), HeadSpace, GC/MSD, GC/SQ, TOC
Instrumentation
FTIR Spectroscopy, Thermal Analysis, GPC/SEC, MALDI, LC/MS, LC/TOF, UV–VIS spectrophotometry, X-ray, Mechanical testing, Rheometry, Optical Emission Spectroscopy (OES), HeadSpace, GC/MSD, GC/SQ, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Energy & Chemicals
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the Optical Properties of Photovoltaic Cells
Measuring the Optical Properties of Photovoltaic Cells
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measurement of Diffuse Reflection from Catalyst Powders
Measurement of Diffuse Reflection from Catalyst Powders
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Multifaceted Evaluation of Plastics: Differences due to PC/ABS Resin Compounding Ratio
Multifaceted Evaluation of Plastics: Differences due to PC/ABS Resin Compounding Ratio
Thermal Analysis, UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, Mechanical testing
Instrumentation
Thermal Analysis, UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, Mechanical testing
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF
Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
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