Applications from the field of Materials Testing - page 1

Open paper Improving Spectral Quality Using Beam Collimation Control

Improving Spectral Quality Using Beam Collimation Control

UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Utilizing UV-Visible Spectroscopy for Color Analysis of Fabrics

Utilizing UV-Visible Spectroscopy for Color Analysis of Fabrics

UV–VIS spectrophotometry, FTIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Recycled Plastic Analysis Solutions

Recycled Plastic Analysis Solutions

FTIR Spectroscopy, Thermal Analysis, GPC/SEC, MALDI, LC/MS, LC/TOF, UV–VIS spectrophotometry, X-ray, Mechanical testing, Rheometry, Optical Emission Spectroscopy (OES), HeadSpace, GC/MSD, GC/SQ, TOC
Instrumentation
FTIR Spectroscopy, Thermal Analysis, GPC/SEC, MALDI, LC/MS, LC/TOF, UV–VIS spectrophotometry, X-ray, Mechanical testing, Rheometry, Optical Emission Spectroscopy (OES), HeadSpace, GC/MSD, GC/SQ, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Energy & Chemicals
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the Optical Properties of Photovoltaic Cells

Measuring the Optical Properties of Photovoltaic Cells

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measurement of Diffuse Reflection from Catalyst Powders

Measurement of Diffuse Reflection from Catalyst Powders

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Multifaceted Evaluation of Plastics: Differences due to PC/ABS Resin Compounding Ratio

Multifaceted Evaluation of Plastics: Differences due to PC/ABS Resin Compounding Ratio

Thermal Analysis, UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, Mechanical testing
Instrumentation
Thermal Analysis, UV–VIS spectrophotometry, FTIR Spectroscopy, Microscopy, Mechanical testing
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF

Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF

NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing