Applications from the field of Materials Testing focused on Software - page 1

Open paper 16th Multidimensional Chromatography Workshop Abstract book

16th Multidimensional Chromatography Workshop Abstract book

Others
| 2025 | MDCW
GCxGC, GC/MSD, GC/HRMS, SPME, GC/TOF, GC/SQ, Software, LC/HRMS, LC/MS, SFC, 2D-LC, GPC/SEC
Instrumentation
GCxGC, GC/MSD, GC/HRMS, SPME, GC/TOF, GC/SQ, Software, LC/HRMS, LC/MS, SFC, 2D-LC, GPC/SEC
Manufacturer
JEOL, LECO
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing
Open paper 15th Multidimensional Chromatography Workshop Abstract book

15th Multidimensional Chromatography Workshop Abstract book

Others
| 2024 | MDCW
GCxGC, GC/MSD, GC/HRMS, SPME, GC/TOF, GC/SQ, Software, LC/HRMS, LC/MS, SFC, 2D-LC, GPC/SEC
Instrumentation
GCxGC, GC/MSD, GC/HRMS, SPME, GC/TOF, GC/SQ, Software, LC/HRMS, LC/MS, SFC, 2D-LC, GPC/SEC
Manufacturer
JEOL, LECO, Plasmion
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis