Applications from the field of Semiconductor Analysis - page 5
Open paper Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy
Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
Open paper The power of exact mass measurement: an example of unknown compound identification
The power of exact mass measurement: an example of unknown compound identification
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper Detection of molecular ions from OLED material using AccuTOF GC
Detection of molecular ions from OLED material using AccuTOF GC
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Open paper On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods
On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods
GC, Thermal desorption
Instrumentation
GC, Thermal desorption
Manufacturer
Buck Scientific, CDS Analytical
Industries
Semiconductor Analysis
Open paper Phthalate Analysis in Accordance with an IEC Standard Method
Phthalate Analysis in Accordance with an IEC Standard Method
GC/MSD, Pyrolysis
Instrumentation
GC/MSD, Pyrolysis
Manufacturer
CDS Analytical
Industries
Semiconductor Analysis
Open paper Thermal Desorption Analysis of Si Wafer Contaminants
Thermal Desorption Analysis of Si Wafer Contaminants
GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Shimadzu, CTC Analytics, GL Sciences
Industries
Semiconductor Analysis
