Applications from the field of Semiconductor Analysis - page 4
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Materials Testing, Semiconductor Analysis
Open paper Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Open paper SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES
SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Open paper AccuTOF GC series Applications Notebook
AccuTOF GC series Applications Notebook
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Instrumentation
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Open paper Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
