Applications from the field of Semiconductor Analysis - page 2

Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper The power of exact mass measurement: an example of unknown compound identification

The power of exact mass measurement: an example of unknown compound identification

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis