Applications from the field of Semiconductor Analysis - page 1

Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD

Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD

GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Optical Characterization of Materials Using Spectroscopy

Optical Characterization of Materials Using Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Open paper Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research
Open paper Measuring Inorganic Impurities in Semiconductor Manufacturing

Measuring Inorganic Impurities in Semiconductor Manufacturing

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper AccuTOF GC series Applications Notebook

AccuTOF GC series Applications Notebook

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Instrumentation
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis