Applications from the field of Semiconductor Analysis from Agilent Technologies - page 1
Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Optical Characterization of Materials Using Spectroscopy
Optical Characterization of Materials Using Spectroscopy
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Open paper Measuring Inorganic Impurities in Semiconductor Manufacturing
Measuring Inorganic Impurities in Semiconductor Manufacturing
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
