Applications from the field of Semiconductor Analysis focused on GC/HRMS - page 1
Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper AccuTOF GC series Applications Notebook
AccuTOF GC series Applications Notebook
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Instrumentation
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
