Applications from the field of Semiconductor Analysis focused on GC/MSD - page 2
Open paper Eastern Analytical Symposium & Exposition 2022 Final Program
Eastern Analytical Symposium & Exposition 2022 Final Program
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF
Instrumentation
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing
Open paper Instruments for Analyzing / Evaluating Electronic Device
Instruments for Analyzing / Evaluating Electronic Device
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis
Open paper Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry
Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Eastern Analytical Symposium & Exposition 2021 Preliminary Program
Eastern Analytical Symposium & Exposition 2021 Preliminary Program
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis
Instrumentation
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing
Open paper UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Materials Testing, Semiconductor Analysis
Open paper Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Semiconductor Analysis
Open paper The power of exact mass measurement: an example of unknown compound identification
The power of exact mass measurement: an example of unknown compound identification
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper Detection of molecular ions from OLED material using AccuTOF GC
Detection of molecular ions from OLED material using AccuTOF GC
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Open paper Phthalate Analysis in Accordance with an IEC Standard Method
Phthalate Analysis in Accordance with an IEC Standard Method
GC/MSD, Pyrolysis
Instrumentation
GC/MSD, Pyrolysis
Manufacturer
CDS Analytical
Industries
Semiconductor Analysis
