Applications from the field of Semiconductor Analysis focused on GC/SQ - page 1

Open paper Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Open paper Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples

Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples

GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Instrumentation
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Open paper Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD

Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD

GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Instruments for Analyzing / Evaluating Electronic Device

Instruments for Analyzing / Evaluating Electronic Device

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis
Open paper Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry

Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry

GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR

UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR

GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Materials Testing, Semiconductor Analysis
Open paper Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Semiconductor Analysis
Open paper Thermal Desorption Analysis of Si Wafer Contaminants

Thermal Desorption Analysis of Si Wafer Contaminants

GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Shimadzu, CTC Analytics, GL Sciences
Industries
Semiconductor Analysis