Applications from the field of Semiconductor Analysis focused on GC/TOF - page 1

Open paper AccuTOF GC series Applications Notebook

AccuTOF GC series Applications Notebook

Applications
| 2016 | JEOL
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Instrumentation
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Open paper The power of exact mass measurement: an example of unknown compound identification

The power of exact mass measurement: an example of unknown compound identification

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper Detection of molecular ions from OLED material using AccuTOF GC

Detection of molecular ions from OLED material using AccuTOF GC

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis