Trace Metal Determination by Inductively Coupled Plasma Mass Spectrometry in Extractable and Leachable analysis

We, 30.9.2026 19:00 CEST
Concerned about elemental impurities leaching from packaging? Discover ICP-MS workflows for ultra-trace E&L detection under ICH/USP.
Agilent Technologies: Trace Metal Determination by Inductively Coupled Plasma Mass Spectrometry in Extractable and Leachable analysis
Agilent Technologies: Trace Metal Determination by Inductively Coupled Plasma Mass Spectrometry in Extractable and Leachable analysis

In this presentation, detailed operation of ICP-MS will be discussed, particularly the role of elemental analysis by ICP-MS in the Extractable and Leachable analysis. ICP-MS, with its high sensitivity, wide dynamic range, and ultra-trace multi-elemental detection, is the ideal analytical technique for trace elemental quantification in ICH/USP applications.

Presenter: Yan Cheung, PhD (Application Chemist, Agilent Technologies, Inc.)

Yan Cheung joined Agilent Technologies as an Application Chemist after receiving her Ph.D. in Analytical Chemistry from Indiana University Bloomington. Yan hasextensive experience in operating and method development for ICP-MS and ICP-OES. Yan also has years of experience working in the oil and gas industry.

Agilent Technologies
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