Image, analyze, and fabricate at the nanoscale: Advances in SEM and FIB SEM for quantum materials research

Scanning electron microscopy (SEM) and focused ion beam SEM (FIB-SEM) are essential tools for the visualization, analysis, and fabrication of nano- and quantum materials. The techniques provide precise 3D characterization of nanostructures and allow for prototyping of nanodevices.

This webinar will share insights into recent advances in the design of novel nanomaterials, particularly graphene, carbon nanotubes, and semiconductor nanowires. Other topics that will be discussed include metrology, new device architectures and in-situ electron microscopy techniques, which allow the study of structural features and of growth processes that determine their functional properties using state-of-the-art field emission SEMs

Learn how to study advanced materials applied in electronics, battery research, and quantum technology and how to use atomic-scale analysis when preparing ultra-thin TEM lamellae or APT samples for atomic-scale analysis using an advanced FIB-SEM.

Key Learning Outcomes:

• Understand how SEM and FIB-SEM enable high-precision 2D/3D characterization and nanofabrication for advanced nano- and quantum materials research.
• Discover recent advances in research on nanomaterials, such as graphene, CNTs, semiconductor nanowires, using in-situ electron microscopy.
• Learn practical workflows for preparing ultra-thin TEM lamellae and APT samples with ZEISS Crossbeam 750 for atomic-scale analysis.
• Determine how these EM workflows can accelerate your own R&D if you are working in semiconductor research, materials science, battery/energy storage, or quantum device engineering.

Who should attend: 

• R&D scientists and engineers in semiconductor research, materials science, battery/energy storage, and quantum device engineering seeking insight into high precision 2D/3D characterization and nanofabrication.
• Researchers and lab managers interested in scalable workflows to boost throughput and reproducibility in nanomaterials investigations.
• Postdocs, PhD students, and researchers aiming to accelerate their projects by leveraging ZEISS Crossbeam 750 for ultra-thin lamellae and atomic-scale sample preparation.

Speaker: Dr. Stephan Hofmann (Professor of Nanotechnology at the Department of Engineering at Cambridge University)

Professor of Nanotechnology at the Department of Engineering at Cambridge University, and Director of a Doctoral Training Centre in Nanotechnology, UK.
Stephan Hofmann is Professor of Nanotechnology at the Department of Engineering at Cambridge University, and Director of a Doctoral Training Centre in Nanotechnology (www.nanodtc.cam.ac.uk). His research group (hofmann-group.eng.cam.ac.uk) works on the application driven exploration of new device materials, bridging from fundamental discovery and characterisation of properties to functional device integration and manufacturing pathways. He graduated in Physics at the Technische Universität München and obtained his Ph.D. at the University of Cambridge. Prior to his faculty position, he held a Dorothy Hodgkin Fellowship by the Royal Society and a Research Fellowship at Peterhouse, Cambridge, where he is currently a Fellow.

Speaker: Dr. Heiko Stegmann (Carl Zeiss Microscopy GmbH, DE)

Physics studies and PhD in analytical TEM for biophysics applications. U Heidelberg, Germany. Semiconductor failure analysis, process development support, and TEM method development at AMD Saxony LLC & Co. KG, Dresden, Germany. Application expert and advisor at Carl Zeiss Microscopy GmbH with emphasis on characterization of nanostructures for failure analysis and manufacturing process development, using techniques such as SEM, FIB, STEM, EDX, FIB-SIMS, and working on their continuous improvement.

Speaker: Alex Lopatka (Editor, Physics Today)

Alex Lopatka is the features editor at Physics Today.