TechTalk: Benefits of high-resolution ICP-OES for challenging applications

Complex sample matrices can make trace element analysis challenging, particularly when spectral interferences limit confidence in results. In applications such as mining analysis, conventional ICP-OES approaches may not always provide the resolution needed to clearly separate overlapping signals or achieve the detection limits required for demanding workflows.

In this 20-minute TechTalk, discover how high-resolution ICP-OES can help overcome spectral interferences, improve confidence in elemental analysis, and deliver reliable results for complex samples. The session will show how enhanced spectral resolution, combined with strong sensitivity, can support more robust trace element detection where conventional approaches may reach their limits.

Designed for ICP-OES users, elemental analysis specialists, analytical chemists, method developers, laboratory managers, QC/QA professionals, and researchers working with complex sample matrices, this session will provide practical insight into how high-resolution ICP-OES can strengthen analytical performance and support confident decision-making in challenging applications.

Certificate of attendance

If you attend the live TechTalk, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes. If you view the on-demand TechTalk, you can request a certificate of attendance by emailing [email protected].

TechTalk details

   Cost: Free to attend
   Location: Online
   Duration: 20 minutes

Registration is required to secure your place. If you register but can’t attend live, you will receive a link to the on-demand recording once it becomes available.

Who should attend?

This event is perfect for:

• ICP-OES users
• Elemental analysis specialists
• Analytical chemists and method developers
• Laboratory managers and quality managers
• QC/QA professionals
• Researchers working with complex sample matrices
• Scientists evaluating elemental analysis technologies

What will this webinar cover?

Key learning objectives:

• Understand how high-resolution ICP-OES helps resolve spectral interferences in complex samples.
• Explore application examples where conventional ICP-OES approaches may reach their limits.
• Discover how high resolution combined with best sensitivity enables extraordinary detection limits

Presenter: Dr. Kilian Schneider (Product Specialist ICP-OES, Analytik Jena GmbH+Co.KG)

Dr. Kilian Schneider is a Product Specialist for ICP-OES at Analytik Jena, based in Jena, Germany. He specializes in elemental analysis and supports customers worldwide in the development and optimization of analytical methods for challenging applications. His expertise covers a broad range of industries, including mining, environmental analysis, chemicals, advanced materials, energy, and recycling. Dr. Schneider is actively involved in application development, customer support, technical training, and the introduction of innovative ICP-OES solutions for complex analytical challenges.