RECORD | Already taken place Tu, 16.6.2026
Advanced methodology for enhancing sample throughput through recent advances in Helium KED mode and complementary interference removal techniques.Go to the webinar

Advanced methodology for enhancing sample throughput through recent advances in Helium KED mode and complementary interference removal techniques.
Presenter: Bert Woods (Application Scientist, Agilent Technologies, Inc.)
Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.