DAD - Impurity/Profiling workflowsRECORD | Already taken place We, 18.8.2021Introduction into the LC6000; profiling workflows and calculating peak impurity using LC - Diode Array Detection (DAD).Go to the webinarSCION Instruments: DAD-Impurity/Profiling workflows Overview of the LC6000 HPLC series Benefits of using Diode Array Detection vs Ultra-Violet Detector CompassCDS sample processing and reporting of Diode Array Data; UV Spectra and Peak Purity Profiling Presenter: Ashleigh Mellor (LC Product Manager at SCION Instruments) SCION Instruments