DAD - Impurity/Profiling workflows

RECORD | Already taken place We, 18.8.2021
Introduction into the LC6000; profiling workflows and calculating peak impurity using LC - Diode Array Detection (DAD).
SCION Instruments: DAD-Impurity/Profiling workflows
SCION Instruments: DAD-Impurity/Profiling workflows
  • Overview of the LC6000 HPLC series
  • Benefits of using Diode Array Detection vs Ultra-Violet Detector
  • CompassCDS sample processing and reporting of Diode Array Data; UV Spectra and Peak Purity Profiling

Presenter: Ashleigh Mellor (LC Product Manager at SCION Instruments)

SCION Instruments
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