Analysis of alumina powders

Technical note | 001935 Mass spectrometry Reaching sub-ppm limits of detection for carbon, nitrogen and oxygen with the Element GD Plus GD-MS Author Introduction T. Lindemann, H. Vollstaedt, J. Hinrichs, Manufacturers of semiconductor materials and high purity metals use a…

Application note | 003578 GD-MS Routine analysis of 7N high purity gallium phosphide by Glow Discharge Mass Spectrometry Authors Introduction Torsten Lindemann and Hauke Vollstaedt Gallium phosphide (GaP) is a semiconductor material used in electronic and Thermo Fisher Scientific, optoelectronic…

APPLICATION BRIEF 30489 Routine analysis of 6N high purity copper Authors Analytical Challenge Joachim Hinrichs, Thermo Fisher Scientific, Bremen, Germany Trace elemental analysis of high purity 5N or 6N metals is challenging due to both the complete elemental coverage required…

APPLICATION NOTE No. 30164 Analysis of solar cell silicon Keywords Element GD, glow discharge MS, solar cell, silicon Authors Joachim Hinrichs, Lothar Rottmann, Thermo Fisher Scientific, Bremen, Germany Introduction The increasing demand for alternative energy sources has fuelled significant research…