The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications |  | ZOEX/JSBInstrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Industries
Materials Testing, Semiconductor Analysis
Manufacturer
JEOL, ZOEX/JSB
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