The 5975C Series MSDs: Method Optimization and Trace Ion Detection

Replacing Multiple 50-Minute GC and GC-MS/SIM Analyses with One 15-Minute Full-Scan GC-MS Analysis for Nontargeted Pesticides Screening and >10x Productivity Gain Application Food Safety Author Introduction Chin-Kai Meng and Mike Szelewski Agilent Technologies 2850 Centerville Road Wilmington, DE 19808 To…

Femtogram GC/MSD Detection Limits for Environmental Semivolatiles Using a Triple-Axis Detector Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract The analysis of semivolatiles at very low levels presents challenges due to analyte…

Enhancements to Gain Normalized Instrument Tuning: Understanding the Benefits and Features Technical Overview Harry Prest, James D. Foote, Jeffrey T. Kernan, and Dave Peterson Introduction The automated optimization of ion detection in a mass spectrometer (MS), commonly referred to as…

5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selected-Ion Monitoring Modes Application Technique/Technology Authors Harry F. Prest, Randy Roushall, Tom Doherty Jim Foote, and James Yano Agilent Technologies, Inc. 5301 Stevens Creek Blvd Santa Clara, CA 95051…