Analysis of Contaminations on a Plastic Part using the FT-IR Microscope LUMOS II

Application Note AN M106 Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II Introduction The analysis of electronic devices is a complex task since modern systems are highly miniaturized and composed of all kinds of…

Application Note AN M112 Failure analysis of packaging materials Introduction Packaging materials are often composed of various layers that fulfill different functions. The actual packaging foil has a barrier function and is, depending on its intended purpose, already made from…

Analysis of Polymers and Plastics Quality Control & Failure Analysis Innovation with Integrity F T-IR Reliable quality control is essential to achieve a cost-saving production of high quality plastic products. Bruker’s ALPHA II provides a FT-IR spectroscopy-based solution for powerful…

Application Note AN M105 FT-IR Microscopic Analysis of Micro-particles Introduction There are numerous fields of application where the analysis of micro-particles is of considerable interest. Microparticles can appear for instance as a contamination of products like pharmaceuticals and electronics or…