Depth Profiling of an Organic FET with XPS and Argon Cluster Ions

APPLICATION NOTE AN52476 Confirming the layer structure of an organic FET device Authors Paul Mack Thermo Fisher Scientific East Grinstead, West Sussex, UK Key Words MAGCIS, XPS, Argon Clusters, CuPc, Depth Profiling, Organic Electronics, Polymer Electronics FET, Nexsa The Thermo…

Exploring the surface in depth with XPS analysis Depth profiling of surfaces and interfaces with the Hypulse Surface Analysis System The need for surface and interface analysis In today’s rapidly evolving technological landscape, precise material analysis is crucial for the…

Instrumentation for surface analysis Surface chemistry and thin film characterization X-ray photoelectron spectroscopy Quantitative, chemical identification of the surface X-ray Photoelectron Spectroscopy (XPS, also known as Electron Spectroscopy for Chemical Analysis – ESCA) is a highly surface-sensitive, quantitative, chemical analysis…

White paper The evolution of XPS depth profiling Introduction To compensate for these issues, it is common to include a X-ray photoelectron spectroscopy (XPS) is a surface-sensitive method to gently clean the sample surface within the XPS technique that quantifies…