WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

Application Note Semiconductor Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS Analysis of dissolved and particulate inorganic impurities in two grades of NMP using the Agilent 8900 ICP-QQQ Author Introduction Yoshinori Shimamura Ideally, analytical quality control (QC) testing procedures…

Agilent ICP-MS Journal November 2022, Issue 90 Page 1 Novel Sample Types, New Applications, and the Latest Revision of ICP-MS Software Novel Sample Types, New Applications, and the Latest Revision of ICP-MS Software Issue 90 of the Agilent ICP-MS Journal…

Application Note Energy and fuels Single Nanoparticle Analysis of Asphaltene Solutions using ICP-QQQ Agilent 8900 and ICP-MS MassHunter software module simplify spICP-MS analysis Authors Jenny Nelson Agilent Technologies, USA Michiko Yamanaka Agilent Technologies, Japan Francisco Lopez-Linares, Laura Poirier, and Estrella…

Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…